公开(公告)号：US20250104991A1

公开(公告)日：2025-03-27

申请号：US18294198

申请日：2022-06-23

Applicant: Hitachi High-Tech Corporation

Inventor： Kouji ISHIGURO ,  Shinsuke MINATA ,  Hiroyuki YASUDA ,  Tsugunao TOMA ,  Yuka SUGAWARA

IPC: H01J49/42 ,  G01K7/02 ,  G01K7/16

Abstract: To provide a mass spectrometer in which a mass axis deviation can be prevented by having a relatively inexpensive configuration. The mass spectrometer includes: a mass filter including rod electrodes, a holder for holding the rod electrodes, a holder support base on which the holder is placed, and a leaf spring configured to press the holder with an elastic force to fix the holder to the holder support base; a temperature sensor; and a control unit configured to control, based on a measurement signal of the temperature sensor, a voltage value of a high frequency voltage applied to the rod electrodes, in which the temperature sensor is fixed to the leaf spring.

公开(公告)号：US20230170198A1

公开(公告)日：2023-06-01

申请号：US17922755

申请日：2021-03-23

Applicant: Hitachi High-Tech Corporation

Inventor： Masuyuki SUGIYAMA ,  Hideki HASEGAWA ,  Yuki NAGAYA ,  Yuichiro HASHIMOTO ,  Hiroyuki YASUDA

IPC: H01J49/02 ,  H01J49/06 ,  H01J49/42

CPC classification number: H01J49/022 ,  H01J49/062 ,  H01J49/4215

Abstract: A mass spectrometer includes an ion source, an ion guide, a quadrupole mass filter, a detector, DC and RF power sources, and a voltage control device for controlling an acceleration voltage by controlling the power source. The voltage controller controls the acceleration voltage such that it is increased as the mass-to-charge ratio of ions to be measured is increased within a control region. The control region is surrounded, having one coordinate axis representing the mass-to-charge ratio of the ions passing the ion guide and another axis representing the acceleration voltage applied to the ion guide, by a line representing a lower limit of a stable region where the ions pass the ion guide stably, a line representing an ion mobility of the ions, an upper side representing an upper limit of the acceleration voltage, and a lower side representing a value at which the acceleration voltage is zero.

公开(公告)号：US20230136178A1

公开(公告)日：2023-05-04

申请号：US17908147

申请日：2021-02-10

Applicant: Hitachi High-Tech Corporation

Inventor： Yuka SUGAWARA ,  Masuyuki SUGIYAMA ,  Yuichiro HASHIMOTO ,  Hiroyuki YASUDA ,  Riku TAMURA

IPC: H01J49/06

Abstract: To provide a mass spectrometer for higher ion permeation efficiency. In a mass spectrometer to transfer ions generated in an ion source 101 to a detector 106 through a vacuum chamber equipped with electrodes, the vacuum chamber includes a first vacuum chamber 107 and a second vacuum chamber 108 communicated by a pore 104 and an air flow containing ions introduced from the ion source 101 into the first vacuum chamber 107 is separated to an air flow 704 and an ion flow 703 by an ion guide 103 in the first vacuum chamber 107. The first vacuum chamber 107 has a current plate 113 to reduce mixing of the separated air flow 704 and ion flow 703.

公开(公告)号：US20240339312A1

公开(公告)日：2024-10-10

申请号：US18713248

申请日：2022-10-12

Applicant: Hitachi High-Tech Corporation

Inventor： Tsugunao TOMA ,  Riku TAMURA ,  Hiroyuki YASUDA ,  Masuyuki SUGIYAMA ,  Yuichiro HASHIMOTO

IPC: H01J49/00 ,  H01J49/42

CPC classification number: H01J49/0036 ,  H01J49/421 ,  H01J49/4265

Abstract: An object of the present disclosure is to provide a method for controlling a mass analyzer. According to the method, sensitivity reduction in a high ion concentration region can be prevented without changing a dwell time for each data point. In the method for controlling a mass analyzer according to the present disclosure, starting collecting data is executed at the same time interval, and a time length for collecting the data varies depending on a degree of space charge generated in a prefilter or a degree of sensitivity reduction of the mass analyzer caused by the space charge.

公开(公告)号：US20240063010A1

公开(公告)日：2024-02-22

申请号：US18270878

申请日：2022-01-17

Applicant: HITACHI HIGH-TECH CORPORATION

Inventor： Yuka SUGAWARA ,  Yuichiro HASHIMOTO ,  Hiroyuki YASUDA ,  Masuyuki SUGIYAMA ,  Riku TAMURA

IPC: H01J49/02 ,  H01J49/42

CPC classification number: H01J49/022 ,  H01J49/4215

Abstract: A mass spectrometry device can reduce a deviation in a mass axis due to the generation of heat from an AC voltage control circuit; and a method for controlling the mass spectrometry device. The mass spectrometry device has a quadrupole electrode, to which a controlled AC voltage is applied, and uses the quadrupole electrode as a mass filter. Before measurement, the mass spectrometry device applies an AC voltage of a prescribed amplitude V1 to the multipole electrode for a prescribed time T1, and a heating value J1 that is generated when the AC voltage of the prescribed amplitude V1 is applied to the multipole electrode for the prescribed time T1 is equivalent to a heating value that is generated when the AC voltage of the amplitude that is applied during the measurement is applied until a thermally steady state is reached (see FIG. 3A).

公开(公告)号：US20240006174A1

公开(公告)日：2024-01-04

申请号：US18037292

申请日：2021-12-17

Applicant: Hitachi High-Tech Corporation

Inventor： Riku TAMURA ,  Hiroyuki YASUDA ,  Yuka SUGAWARA ,  Yuichiro HASHIMOTO

IPC: H01J49/42

CPC classification number: H01J49/4215

Abstract: A method for controlling a mass spectrometer capable of identifying an abnormal location in a device is provided. A method for controlling a mass spectrometer including an ion source that ionizes a compound in a sample, a mass spectrometry unit that separates ions based on a mass-to-charge ratio, and a plurality of electrodes that form an electric field that transports ions generated by the ion source to the mass spectrometry unit includes ionizing the sample by the ion source, detecting, based on a change in ion permeability over time, ions accumulated in the electrodes and quadrupole mass filters forming the mass spectrometry unit, and detecting a change in ionization efficiency of the ion source based on a change in an amount of ions with respect to a gas flow rate for the ion source or a voltage of the ion source.

公开(公告)号：US20220189755A1

公开(公告)日：2022-06-16

申请号：US17599231

申请日：2020-03-12

Applicant: HITACHI HIGH-TECH CORPORATION

Inventor： Yuka SUMIGAMA ,  Yuichiro HASHIMOTO ,  Hiroyuki YASUDA ,  Masuyuki SUGIYAMA

IPC: H01J49/00 ,  H01J49/10

Abstract: A technique for accurately determining a performance of a single detector detecting ions having passed through ap mass analysis unit. A mass analysis system includes, a first converter configured to calculate a first measured value based on an intensity and an area of a pulse in an electric signal output from the detector configured to detect the ions having passed through the mass analysis unit, a second converter configured to obtain a second measured value by counting the number of pulses of the electric signal, a calculation unit configured to calculate an A/P ratio indicating a ratio of the first measured value to the second measured value, a determination unit configured to determine a performance of the detector based on a value of the A/P ratio, and a control unit configured to control at least an output of a determination result obtained by the determination unit.