公开(公告)号：US20240339312A1

公开(公告)日：2024-10-10

申请号：US18713248

申请日：2022-10-12

Applicant: Hitachi High-Tech Corporation

Inventor： Tsugunao TOMA ,  Riku TAMURA ,  Hiroyuki YASUDA ,  Masuyuki SUGIYAMA ,  Yuichiro HASHIMOTO

IPC: H01J49/00 ,  H01J49/42

CPC classification number: H01J49/0036 ,  H01J49/421 ,  H01J49/4265

Abstract: An object of the present disclosure is to provide a method for controlling a mass analyzer. According to the method, sensitivity reduction in a high ion concentration region can be prevented without changing a dwell time for each data point. In the method for controlling a mass analyzer according to the present disclosure, starting collecting data is executed at the same time interval, and a time length for collecting the data varies depending on a degree of space charge generated in a prefilter or a degree of sensitivity reduction of the mass analyzer caused by the space charge.

公开(公告)号：US20240063010A1

公开(公告)日：2024-02-22

申请号：US18270878

申请日：2022-01-17

Applicant: HITACHI HIGH-TECH CORPORATION

Inventor： Yuka SUGAWARA ,  Yuichiro HASHIMOTO ,  Hiroyuki YASUDA ,  Masuyuki SUGIYAMA ,  Riku TAMURA

IPC: H01J49/02 ,  H01J49/42

CPC classification number: H01J49/022 ,  H01J49/4215

Abstract: A mass spectrometry device can reduce a deviation in a mass axis due to the generation of heat from an AC voltage control circuit; and a method for controlling the mass spectrometry device. The mass spectrometry device has a quadrupole electrode, to which a controlled AC voltage is applied, and uses the quadrupole electrode as a mass filter. Before measurement, the mass spectrometry device applies an AC voltage of a prescribed amplitude V1 to the multipole electrode for a prescribed time T1, and a heating value J1 that is generated when the AC voltage of the prescribed amplitude V1 is applied to the multipole electrode for the prescribed time T1 is equivalent to a heating value that is generated when the AC voltage of the amplitude that is applied during the measurement is applied until a thermally steady state is reached (see FIG. 3A).

公开(公告)号：US20240006174A1

公开(公告)日：2024-01-04

申请号：US18037292

申请日：2021-12-17

Applicant: Hitachi High-Tech Corporation

Inventor： Riku TAMURA ,  Hiroyuki YASUDA ,  Yuka SUGAWARA ,  Yuichiro HASHIMOTO

IPC: H01J49/42

CPC classification number: H01J49/4215

Abstract: A method for controlling a mass spectrometer capable of identifying an abnormal location in a device is provided. A method for controlling a mass spectrometer including an ion source that ionizes a compound in a sample, a mass spectrometry unit that separates ions based on a mass-to-charge ratio, and a plurality of electrodes that form an electric field that transports ions generated by the ion source to the mass spectrometry unit includes ionizing the sample by the ion source, detecting, based on a change in ion permeability over time, ions accumulated in the electrodes and quadrupole mass filters forming the mass spectrometry unit, and detecting a change in ionization efficiency of the ion source based on a change in an amount of ions with respect to a gas flow rate for the ion source or a voltage of the ion source.

公开(公告)号：US20220189755A1

公开(公告)日：2022-06-16

申请号：US17599231

申请日：2020-03-12

Applicant: HITACHI HIGH-TECH CORPORATION

Inventor： Yuka SUMIGAMA ,  Yuichiro HASHIMOTO ,  Hiroyuki YASUDA ,  Masuyuki SUGIYAMA

IPC: H01J49/00 ,  H01J49/10

Abstract: A technique for accurately determining a performance of a single detector detecting ions having passed through ap mass analysis unit. A mass analysis system includes, a first converter configured to calculate a first measured value based on an intensity and an area of a pulse in an electric signal output from the detector configured to detect the ions having passed through the mass analysis unit, a second converter configured to obtain a second measured value by counting the number of pulses of the electric signal, a calculation unit configured to calculate an A/P ratio indicating a ratio of the first measured value to the second measured value, a determination unit configured to determine a performance of the detector based on a value of the A/P ratio, and a control unit configured to control at least an output of a determination result obtained by the determination unit.

公开(公告)号：US20220074901A1

公开(公告)日：2022-03-10

申请号：US17424526

申请日：2020-02-04

Applicant: HITACHI HIGH-TECH CORPORATION

Inventor： Yuka SUMIGAMA ,  Yuichiro HASHIMOTO

IPC: G01N30/72 ,  G01N30/38

Abstract: The invention provides a liquid chromatograph mass spectrometer which prevents contamination of a pump and a column and can perform mass calibration without adding a complicated mechanism. This liquid chromatograph mass spectrometer includes a liquid chromatograph including a liquid feed pump configured to feed a mobile phase solvent, a mass spectrometer configured to analyze a mass of a sample, and a standard sample container configured to be connected in series with the liquid chromatograph and the mass spectrometer in a flow path that connects the liquid chromatograph and the mass spectrometer and configured to house a standard sample for mass calibration.

公开(公告)号：US20230184802A1

公开(公告)日：2023-06-15

申请号：US17922398

申请日：2021-05-19

Applicant: HITACHI HIGH-TECH CORPORATION

Inventor： Makoto NOGAMI ,  Yushi HARADA ,  Yuichiro HASHIMOTO

IPC: G01N35/10

CPC classification number: G01N35/1011 ,  G01N35/1097

Abstract: A control method for an automatic analyzer that can improve robustness, throughput, and measurement accuracy. The automatic analyzer includes a sample loop connected between two sample ports of a plurality of sample ports of a switch valve. The method includes the steps of: adjusting a drive parameter of the syringe corresponding to a viscosity of the sample acquired in advance; switching the switch valve to a first state in which the sipper and the syringe contact with each other without through the sample loop; driving the syringe based on the drive parameter to draw and introduce the sample through the sipper; switching the switch valve to a second state in which the syringe and the sample loop conduct with each other; and driving the syringe based on the drive parameter to introduce the sample into the sample loop.

公开(公告)号：US20220276270A1

公开(公告)日：2022-09-01

申请号：US17601469

申请日：2020-03-09

Applicant: HITACHI HIGH-TECH CORPORATION

Inventor： Makoto NOGAMI ,  Shinya MATSUOKA ,  Daisuke EBIHARA ,  Yuichiro HASHIMOTO

IPC: G01N35/00

Abstract: A pretreatment method of an automatic analyzer, in which pretreatments of a plurality of substances to be measured can be performed by a series of treatments using a plurality of magnetic beads that can bind to the plurality of substances to be measured, is achieved. In the pretreatment method of an automatic analyzer, a magnetic bead is added to a sample containing a substance to be measured, the substance to be measured is bound to the magnetic bead, the magnetic bead is extracted from the sample, and the substance to be measured is separated from the magnetic bead by an eluate. A plurality of magnetic beads that bind to a plurality of types of substances to be measured are added to a sample, and the plurality of types of substances to be measured are extracted from the magnetic bead by an eluate.

公开(公告)号：US20220181138A1

公开(公告)日：2022-06-09

申请号：US17433133

申请日：2020-01-22

Applicant: Hitachi High-Tech Corporation

Inventor： Kiyomi YOSHINARI ,  Masuyuki SUGIYAMA ,  Yuichiro HASHIMOTO ,  Shin IMAMURA

IPC: H01J49/42 ,  G01T1/20 ,  G01T1/28

Abstract: The present invention implements an ion detector with which it is possible to avoid direct collisions of negative ions with a scintillator, prevent degradation of the scintillator, prolong life of the scintillator, reduce the need for maintenance, and perform highly sensitive detection of both positive and negative ions. With respect to a reference line 65 connecting a central point 63 of a positive ion CD 52 and a central point 64 of a counter electrode 54, a central point 66 of a negative ion CD 53 is provided in a region of a side opposite to a region of a side of a central point 67 of a scintillator 56. Positive ions entering from an ion entrance 62 receive a deflection force and collide with the positive ion CD 52 to generate secondary electrons. The generated secondary electrons collide with the scintillator 56 to generate light. The generated light passes through a light guide 59 and is detected by a photomultiplier tube 58. A negative potential barrier is generated along the reference line 65. Negative ions entering form the ion entrance 62 are attracted to and collide with the negative ion CD 53 to generate positive ions. The generated positive ions collide with the positive ion CD 52 to generate secondary electrons. The generated secondary electrons collide with the scintillator 56 and are detected by the photomultiplier tube 58.

公开(公告)号：US20240360826A1

公开(公告)日：2024-10-31

申请号：US18684464

申请日：2022-07-08

Applicant: Hitachi High-Tech Corporation

Inventor： Daisuke KANAI ,  Yuichiro HASHIMOTO ,  Daisuke AKIEDA

IPC: F04B51/00

CPC classification number: F04B51/00 ,  F04B2201/0803 ,  F04B2205/05

Abstract: Provided is an inspection method for a liquid feeding device capable of preventing an increase in the number of components, a decrease in throughput, and an increase in a leakage source. The method includes: suctioning a fluid from a fluid tank into a first cylinder by driving a first plunger in a suction direction; driving the first plunger in a discharge direction after suction; stopping the first plunger for a predetermined first time; driving the first plunger in the discharge direction; and estimating a leakage amount in a flow path on an upstream side of a second check valve based on a detection value of a pressure detected by a pressure sensor from start of the driving of the first plunger in the discharge direction to end of the driving of the first plunger in the discharge direction.

公开(公告)号：US20230170198A1

公开(公告)日：2023-06-01

申请号：US17922755

申请日：2021-03-23

Applicant: Hitachi High-Tech Corporation

Inventor： Masuyuki SUGIYAMA ,  Hideki HASEGAWA ,  Yuki NAGAYA ,  Yuichiro HASHIMOTO ,  Hiroyuki YASUDA

IPC: H01J49/02 ,  H01J49/06 ,  H01J49/42

CPC classification number: H01J49/022 ,  H01J49/062 ,  H01J49/4215

Abstract: A mass spectrometer includes an ion source, an ion guide, a quadrupole mass filter, a detector, DC and RF power sources, and a voltage control device for controlling an acceleration voltage by controlling the power source. The voltage controller controls the acceleration voltage such that it is increased as the mass-to-charge ratio of ions to be measured is increased within a control region. The control region is surrounded, having one coordinate axis representing the mass-to-charge ratio of the ions passing the ion guide and another axis representing the acceleration voltage applied to the ion guide, by a line representing a lower limit of a stable region where the ions pass the ion guide stably, a line representing an ion mobility of the ions, an upper side representing an upper limit of the acceleration voltage, and a lower side representing a value at which the acceleration voltage is zero.