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公开(公告)号：US20150338322A1
公开(公告)日：2015-11-26
申请号：US14719905
申请日：2015-05-22
Applicant: PROTOCHIPS, INC.
Inventor： John DAMIANO, JR. , Stephen E. MICK , David P. NACKASHI , Madeline DUKES
IPC: G01N1/36
CPC classification number: G01N1/36 , G01N23/20025 , G02B21/34 , H01J37/20 , H01J37/26 , H01J2237/2003
Abstract: A sample support structure with integrated support features and methods of making and using the reinforced membrane. The sample support structures are useful for supporting samples for analysis using microscopic techniques, such as electron microscopy, optical microscopy, x-ray microscopy, UV-VIS spectroscopy and nuclear magnetic resonance (NMR) techniques.
Abstract translation: 具有集成支撑特征的样品支撑结构和制造和使用增强膜的方法。 样品支持结构可用于支持使用微观技术（如电子显微镜，光学显微镜，X射线显微镜，UV-VIS光谱和核磁共振（NMR））技术进行分析的样品。
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2.发明申请公开(公告)号：US20160126056A1
公开(公告)日：2016-05-05
申请号：US14994724
申请日：2016-01-13
Applicant: PROTOCHIPS, INC.
Inventor： John DAMIANO, JR. , David P. NACKASHI , Stephen E. MICK
CPC classification number: H01J37/20 , H01J37/16 , H01J37/18 , H01J37/26 , H01J37/29 , H01J37/30 , H01J2237/2002 , H01J2237/2003 , H01J2237/2007
Abstract: A novel sample holder for specimen support devices for insertion in electron microscopes. The novel sample holder of the invention allows for the introduction of gases or liquids to specimens for in situ imaging, as well as electrical contacts for electrochemical or thermal experiments.
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公开(公告)号：US20200020505A1
公开(公告)日：2020-01-16
申请号：US16491057
申请日：2018-03-13
Applicant: Protochips, Inc.
Inventor： John DAMIANO, JR. , Hessam GHASSEMI , Ian Patrick WELLENIUS
IPC: H01J37/244 , H01J37/20
Abstract: An electrical device for electrically measuring a sample during electron microscope imaging includes: a chip through which a slit is defined, the chip having at least one peripheral edge, the slit having an open end at the at least one peripheral edge; an electrically conductive first contact on the chip; and an electrically conductive second contact on the chip; wherein the slit is at least partially positioned between the first contacts and second contact. An electrically conductive first wire may extend along the chip electrically connected to the first contact; and an electrically conductive second wire may extend along the chip electrically connected to the second contact. The first wire and second wire may diverge from each other in extending along the chip away from the slit.
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Patent Agency Ranking
4.发明申请ELECTRON MICROSCOPE SAMPLE HOLDER FOR FORMING A GAS OR LIQUID CELL WITH TWO SEMICONDUCTOR DEVICES 有权用于形成具有两个半导体器件的气体或液体电池的电子显微镜样品保持器公开(公告)号：US20150162164A1
公开(公告)日：2015-06-11
申请号：US14481390
申请日：2014-09-09
Applicant: PROTOCHIPS, INC.
Inventor： John DAMIANO, JR. , David P. NACKASHI , Stephen E. MICK
CPC classification number: H01J37/20 , H01J37/16 , H01J37/18 , H01J37/26 , H01J37/29 , H01J37/30 , H01J2237/2002 , H01J2237/2003 , H01J2237/2007
Abstract: A novel sample holder for specimen support devices for insertion in electron microscopes. The novel sample holder of the invention allows for the introduction of gases or liquids to specimens for in situ imaging, as well as electrical contacts for electrochemical or thermal experiments.
Abstract translation: 用于插入电子显微镜的样品支撑装置的新型样品架。 本发明的新型样品保持器允许将气体或液体引入用于原位成像的样品，以及用于电化学或热学实验的电触点。
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5.发明申请DEVICE FOR IMAGING ELECTRON MICROSCOPE ENVIRONMENTAL SAMPLE SUPPORTS IN A MICROFLUIDIC OR ELECTROCHEMICAL CHAMBER WITH AN OPTICAL MICROSCOPE 审中-公开在具有光学显微镜的微流控或电化学室中成像电子显微镜环境样品支持的装置公开(公告)号：US20140268321A1
公开(公告)日：2014-09-18
申请号：US14207905
申请日：2014-03-13
Applicant: PROTOCHIPS, INC.
Inventor： John DAMIANO, JR. , David NACKASHI , Daniel Stephen GARDINER , Franklin Stampley WALDEN, II , William Bradford CARPENTER , Madeline DUKES , Steven BUDD
CPC classification number: G02B21/26 , G02B21/34 , H01J37/20 , H01J2237/2003 , H01J2237/2008
Abstract: A sample holder for optical microscopy that incorporates sample holders typically used in electron microscopy to maximize the correlation between optical and electron microscopy images and data.
Abstract translation: 用于光学显微镜的样品架，其包含通常用于电子显微镜中的样品保持器，以最大化光学和电子显微镜图像和数据之间的相关性。
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6.发明申请METHOD FOR FORMING AN ELECTRICAL CONNECTION TO A SAMPLE SUPPORT IN AN ELECTRON MICROSCOPE HOLDER 有权在电子显微镜支架中形成电气连接到样品支持的方法公开(公告)号：US20170054239A1
公开(公告)日：2017-02-23
申请号：US15254522
申请日：2016-09-01
Applicant: PROTOCHIPS, INC.
Inventor： John DAMIANO, JR. , David P. NACKASHI , Daniel Stephen Gardiner , Franklin Stampley WALDEN, II , William Bradford CARPENTER
CPC classification number: H01R13/24 , H01J37/20 , H01J37/26 , H01J2237/2003 , H01J2237/2007 , H01J2237/2008 , H01J2237/206 , H01R12/721 , H01R12/79
Abstract: An electrical connector for use in electron microscopy sample holders. The electrical connector provides electrical contacts to the sample support devices which are positioned in the sample holders for electrical, temperature and/or electrochemical control.
Abstract translation: 用于电子显微镜样品架的电连接器。 电连接器为位于样品保持器中的样品支撑装置提供电接触，用于电气，温度和/或电化学控制。
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公开(公告)号：US20150179397A1
公开(公告)日：2015-06-25
申请号：US14525894
申请日：2014-10-28
Applicant: PROTOCHIPS, INC.
Inventor： John DAMIANO, JR. , Stephen E. MICK , David P. NACKASHI
CPC classification number: H01J37/20 , H01J37/26 , H01J37/261 , H01J2237/188 , H01J2237/2001 , H01J2237/2002 , H01J2237/2003 , H01J2237/2007 , H01J2237/2008 , H01J2237/2602 , H01J2237/28 , H01J2237/2802
Abstract: Electron microscope support structures and methods of making and using same. The support structures are generally constructed using semiconductor materials and semiconductor manufacturing processes. The temperature of the support structure may be controlled and/or gases or liquids may be confined in the observation region for reactions and/or imaging.
Abstract translation: 电子显微镜支撑结构及其制作和使用方法。 支撑结构通常使用半导体材料和半导体制造工艺构造。 可以控制支撑结构的温度和/或气体或液体被限制在观察区域中用于反应和/或成像。
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8.发明申请METHOD FOR FORMING AN ELECTRICAL CONNECTION TO AN SAMPLE SUPPORT IN AN ELECTRON MICROSCOPE HOLDER 有权在电子显微镜支架中形成与样品支持电气连接的方法公开(公告)号：US20140138558A1
公开(公告)日：2014-05-22
申请号：US14079223
申请日：2013-11-13
Applicant: PROTOCHIPS, INC.
Inventor： John DAMIANO, JR. , David P. NACKASHI , Daniel Stephen GARDINER , Franklin Stampley WALDEN, II , William Bradford CARPENTER
IPC: H01R33/945 , H01J37/20
CPC classification number: H01R13/24 , H01J37/20 , H01J37/26 , H01J2237/2003 , H01J2237/2007 , H01J2237/2008 , H01J2237/206 , H01R12/721 , H01R12/79
Abstract: An electrical connector for use in electron microscopy sample holders. The electrical connector provides electrical contacts to the sample support devices which are positioned in the sample holders for electrical, temperature and/or electrochemical control.
Abstract translation: 用于电子显微镜样品架的电连接器。 电连接器为位于样品保持器中的样品支撑装置提供电接触，用于电气，温度和/或电化学控制。
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