公开(公告)号：US20150338322A1

公开(公告)日：2015-11-26

申请号：US14719905

申请日：2015-05-22

Applicant: PROTOCHIPS, INC.

Inventor： John DAMIANO, JR. ,  Stephen E. MICK ,  David P. NACKASHI ,  Madeline DUKES

IPC: G01N1/36

CPC classification number: G01N1/36 ,  G01N23/20025 ,  G02B21/34 ,  H01J37/20 ,  H01J37/26 ,  H01J2237/2003

Abstract: A sample support structure with integrated support features and methods of making and using the reinforced membrane. The sample support structures are useful for supporting samples for analysis using microscopic techniques, such as electron microscopy, optical microscopy, x-ray microscopy, UV-VIS spectroscopy and nuclear magnetic resonance (NMR) techniques.

Abstract translation: 具有集成支撑特征的样品支撑结构和制造和使用增强膜的方法。 样品支持结构可用于支持使用微观技术（如电子显微镜，光学显微镜，X射线显微镜，UV-VIS光谱和核磁共振（NMR））技术进行分析的样品。

公开(公告)号：US20150179397A1

公开(公告)日：2015-06-25

申请号：US14525894

申请日：2014-10-28

Applicant: PROTOCHIPS, INC.

Inventor： John DAMIANO, JR. ,  Stephen E. MICK ,  David P. NACKASHI

IPC: H01J37/20 ,  H01J37/26

CPC classification number: H01J37/20 ,  H01J37/26 ,  H01J37/261 ,  H01J2237/188 ,  H01J2237/2001 ,  H01J2237/2002 ,  H01J2237/2003 ,  H01J2237/2007 ,  H01J2237/2008 ,  H01J2237/2602 ,  H01J2237/28 ,  H01J2237/2802

Abstract: Electron microscope support structures and methods of making and using same. The support structures are generally constructed using semiconductor materials and semiconductor manufacturing processes. The temperature of the support structure may be controlled and/or gases or liquids may be confined in the observation region for reactions and/or imaging.

Abstract translation: 电子显微镜支撑结构及其制作和使用方法。 支撑结构通常使用半导体材料和半导体制造工艺构造。 可以控制支撑结构的温度和/或气体或液体被限制在观察区域中用于反应和/或成像。

公开(公告)号：US20150162164A1

公开(公告)日：2015-06-11

申请号：US14481390

申请日：2014-09-09

Applicant: PROTOCHIPS, INC.

Inventor： John DAMIANO, JR. ,  David P. NACKASHI ,  Stephen E. MICK

IPC: H01J37/20 ,  H01J37/29

CPC classification number: H01J37/20 ,  H01J37/16 ,  H01J37/18 ,  H01J37/26 ,  H01J37/29 ,  H01J37/30 ,  H01J2237/2002 ,  H01J2237/2003 ,  H01J2237/2007

Abstract: A novel sample holder for specimen support devices for insertion in electron microscopes. The novel sample holder of the invention allows for the introduction of gases or liquids to specimens for in situ imaging, as well as electrical contacts for electrochemical or thermal experiments.

Abstract translation: 用于插入电子显微镜的样品支撑装置的新型样品架。 本发明的新型样品保持器允许将气体或液体引入用于原位成像的样品，以及用于电化学或热学实验的电触点。

公开(公告)号：US20160172153A1

公开(公告)日：2016-06-16

申请号：US15051210

申请日：2016-02-23

Applicant: PROTOCHIPS, INC.

Inventor： John DAMIANO, Jr. ,  Stephen E. MICK ,  David P. NACKASHI

IPC: H01J37/20 ,  H01J37/26

CPC classification number: H01J37/20 ,  H01J37/26 ,  H01J37/261 ,  H01J2237/188 ,  H01J2237/2001 ,  H01J2237/2002 ,  H01J2237/2003 ,  H01J2237/2007 ,  H01J2237/2008 ,  H01J2237/2602 ,  H01J2237/28 ,  H01J2237/2802

Abstract: Electron microscope support structures and methods of making and using same. The support structures are generally constructed using semiconductor materials and semiconductor manufacturing processes. The temperature of the support structure may be controlled and/or gases or liquids may be confined in the observation region for reactions and/or imaging.

公开(公告)号：US20160126056A1

公开(公告)日：2016-05-05

申请号：US14994724

申请日：2016-01-13

Applicant: PROTOCHIPS, INC.

Inventor： John DAMIANO, JR. ,  David P. NACKASHI ,  Stephen E. MICK

IPC: H01J37/16 ,  H01J37/26 ,  H01J37/18

CPC classification number: H01J37/20 ,  H01J37/16 ,  H01J37/18 ,  H01J37/26 ,  H01J37/29 ,  H01J37/30 ,  H01J2237/2002 ,  H01J2237/2003 ,  H01J2237/2007

Abstract: A novel sample holder for specimen support devices for insertion in electron microscopes. The novel sample holder of the invention allows for the introduction of gases or liquids to specimens for in situ imaging, as well as electrical contacts for electrochemical or thermal experiments.