Abstract:
A long wave infrared imaging polarimeter (LWIP) is disclosed including a pixilated polarizing array (PPA) in close proximity to a microbolometer focal plane array (MFPA), along with an alignment engine for aligning and bonding the PPA and MFPA and method for assembly.
Abstract:
Exemplary thin-film optical devices have first and second layer groups disposed as a layer stack on a substrate. The first layer group comprises a first PPN layer, a first LCP layer, and a first barrier layer all superposed. The second layer group is superposed relative to the first layer group, and includes a second PPN layer, a second LCP layer, and a second barrier layer all superposed. The first and second layer groups cooperate to polarize multiple wavelengths of an incident light flux in a broadband and/or wide-angle manner. Each of the layer groups has an alignment layer, a respective liquid-crystal polymer layer, and a barrier layer.
Abstract:
A device for enhancing transmission of incident electromagnetic radiation at a predetermined wavelength is presented that includes an aperture array structure in a thin film. The structure includes a repealing unit cell having more than one aperture including a first aperture and a second aperture, wherein a parameter of the first aperture differs from that of the second aperture. The unit cell repeats with a periodicity on the order of or less than said predetermined wavelength, The structure parameters are configured to preferentially support cavity modes for coupling to and enhancing transmission of a predetermined polarization state at the predetermined wavelength. By structuring the unit cell with apertures that differ by appropriate degrees in at least one of dimension, height, dielectric constant of material filling the apertures, shape, and orientation, the devices can be adapted for polarization and/or wavelength filtering- and/or light circulating, weaving, or channeling.
Abstract:
An optical device, particularly a polarimeter, is provided for analyzing a liquid sample, having: a light-generating system for generating light for the surface irradiation of the sample; a detection system which is set up for the spatially resolved detection of light which originates from the transmission of the light provided for the surface irradiation through the sample; a telecentric optical system with a lens between the sample and the detection system and with an aperture diaphragm in the focal plane of the lens between the lens and the detection system.
Abstract:
According to the invention, there is provided a circular polarizing filter for selectively transmitting circularly polarized light of any one sense of either right-handed circularly polarized light or left-handed circularly polarized light at a specific wavelength in which scattering transmittance/vertical transmittance when circularly polarized light of the sense of the specific wavelength enters from any one surface is less than scattering reflectance/regular reflectance when circularly polarized light of the other sense enters from the surface. The circular polarizing filter includes a circularly-polarized light separating layer, the circularly-polarized light separating layer includes a reflected light-scattering circularly-polarized light separating layer, and may further include a reflected light-non-scattering circularly-polarized light separating layer, the reflected light-scattering circularly-polarized light separating layer is composed of a layer having a cholesteric liquid crystalline phase fixed therein, and the reflected light-non-scattering circularly-polarized light separating layer is composed of a layer having a cholesteric liquid crystalline phase fixed therein, or a laminate including a linearly-polarized light separating layer and a λ/4 phase difference layer. The circular polarizing filter of the invention has a high circular polarizance, and a high-sensitivity sensor system can be provided using the circular polarizing filter of the invention.
Abstract:
A surface inspecting method includes: irradiating an incident light beam of a first polarized state on a target object, the incident light beam comprising parallel light and having a cross-sectional area: measuring a second polarized state of a reflected light beam reflected from the target object; and performing inspection on an entire area of the target object on which the incident light beam is irradiated, based on a variation between the first polarized state and the second polarized state.
Abstract:
Provided is an optical element rotation type Mueller-matrix ellipsometer for solving a problem of measurement accuracy and measurement precision occurring due to residual polarization of a light source, polarization dependence of a photo-detector, measurement values of Fourier coefficients of a high order term in dual optical element rotation type Mueller-matrix ellipsometers according to the related art capable of measuring some or all of components of a Mueller-matrix for any sample.
Abstract:
A surface inspecting method includes: irradiating an incident light beam of a first polarized state on a target object, the incident light beam comprising parallel light and having a cross-sectional area: measuring a second polarized state of a reflected light beam reflected from the target object; and performing inspection on an entire area of the target object on which the incident light beam is irradiated, based on a variation between the first polarized state and the second polarized state.
Abstract:
A polarimeter for measuring chirality of a material comprising an optical ring cavity comprising a plurality of reflective elements configured to promote bi-directional propagation of a laser beam within the cavity, a laser-emitting device configured to introduce a first input beam and a second input beam into the cavity, a Faraday rotator, a phase compensator, an acousto-optic modulator configured to shift the frequency of the first output beam, an optical recombination device configured to recombine shifted and unshifted output beams, and first and second detectors configured to receive the recombined beams, wherein the plurality of reflective elements, Faraday rotator, and phase compensator are configured such that light from the first and second input beams passes through a chiral material located within the cavity a sufficient number of times for a measurement of optical rotary dispersion and circular dichroism of light transmitted through the material to be obtained at the detectors.
Abstract:
A polarimeter for measuring chirality of a material comprising an optical ring cavity comprising a plurality of reflective elements configured to promote bi-directional propagation of a laser beam within the cavity, a laser-emitting device configured to introduce a first input beam and a second input beam into the cavity, a Faraday rotator, a phase compensator, an acousto-optic modulator configured to shift the frequency of the first output beam, an optical recombination device configured to recombine shifted and unshifted output beams, and first and second detectors configured to receive the recombined beams, wherein the plurality of reflective elements, Faraday rotator, and phase compensator are configured such that light from the first and second input beams passes through a chiral material located within the cavity a sufficient number of times for a measurement of optical rotary dispersion and circular dichroism of light transmitted through the material to be obtained at the detectors.