Abstract:
In a substrate-level assembly (22), a device substrate (20) of semiconductor material has a top face (20a) and houses a first integrated device (1; 16), in particular provided with a buried cavity (3), formed within the device substrate (20), and with a membrane (4), suspended over the buried cavity (3) in the proximity of the top face (20a). A capping substrate (21) is coupled to the device substrate (20) above the top face (20a) so as to cover the first integrated device (1; 16), in such a manner that a first empty space (25) is provided above the membrane (4). Electrical-contact elements (28a, 28b) electrically connect the integrated device (1; 16) with the outside of the substrate-level assembly (22). In one embodiment, the device substrate (20) integrates at least a further integrated device (1', 10) provided with a respective membrane (4'); and a further empty space (25'), fluidically isolated from the first empty space (25), is provided over the respective membrane (4') of the further integrated device (1', 10).
Abstract:
A planar electric circuit board may include a planar support of a foldable material defining a base surface and wings coupled to the base surface along respective folding lines so that the wings, when folded along the folding lines, are erected with respect to the base surface and remain in that position. An auxiliary circuit is on the planar support and may include pairs of capacitive coupling plates defined on the wings and on the base surface, and electric communication lines coupled to corresponding ones of the pairs of capacitive coupling plates.
Abstract:
A package (15) for devices (100) insertable into a solid structure (300) for detecting and monitoring one or more local parameters is described. The package (15) is made of a building material formed of particles of micrometric or sub-micrometric dimensions. A device (100) for detecting and monitoring one or more local parameters within a solid structure is further described. The device (100) comprises an integrated detection module (1), having at least one integrated sensor (10), and a package (15), having the above-mentioned characteristics, so arranged as to coat at least one portion of the device (100), comprising the integrated detection module (1). A method for manufacturing the device (100), and a system (200) for monitoring parameters in a solid structure (300), comprising such a device (100), are also described.
Abstract:
A method of manufacturing semiconductor devices, such as integrated circuits comprises: - providing a support surface (10), - arranging one or more semiconductor dice (12) on the support surface (10), - molding laser direct structuring (LDS) material (14) onto the support surface (10) having the semiconductor die/dice (12) arranged thereon, - laser beam processing (L) the laser direct structuring material (14) molded onto the support surface (10) having the semiconductor die/dice (12) arranged thereon to provide electrically conductive formations (16) for the semiconductor die/dice (12) arranged on the support surface, and - separating from the support surface (10) the semiconductor die/dice (12) provided with said electrically-conductive formations (16).
Abstract:
A method of manufacturing semiconductor devices (10) comprises: - providing a plastic material substrate (100) having at least one die mounting location (102) for a semiconductor die (104), - forming metallic traces (108a, 108b) on selected areas of the plastic material substrate (100), wherein the metallic traces (108a, 108b) provide electrically-conductive paths for coupling to the semiconductor die (104), - attaching the semiconductor die (104) onto the at least one die mounting location (102), - bonding the semiconductor die (104) attached onto the at least one die mounting location (102) to selected ones of the metallic traces (108a, 108b) formed on the plastic material substrate (100), - molding package material (110) onto the semiconductor die (104) attached onto the at least one die mounting location (102).
Abstract:
A method of manufacturing semiconductor devices, such as integrated circuits comprises: - providing a support surface (10), - arranging one or more semiconductor dice (12) on the support surface (10), - molding laser direct structuring (LDS) material (14) onto the support surface (10) having the semiconductor die/dice (12) arranged thereon, - laser beam processing (L) the laser direct structuring material (14) molded onto the support surface (10) having the semiconductor die/dice (12) arranged thereon to provide electrically conductive formations (16) for the semiconductor die/dice (12) arranged on the support surface, and - separating from the support surface (10) the semiconductor die/dice (12) provided with said electrically-conductive formations (16).
Abstract:
A substrate-level assembly having a device substrate of semiconductor material with a top face and housing a first integrated device, including a buried cavity formed within the device substrate, and with a membrane suspended over the buried cavity in the proximity of the top face. A capping substrate is coupled to the device substrate above the top face so as to cover the first integrated device in such a manner that a first empty space is provided above the membrane. Electrical-contact elements electrically connect the integrated device with the outside of the substrate-level assembly. In one embodiment, the device substrate integrates at least a further integrated device provided with a respective membrane, and a further empty space, fluidly isolated from the first empty space, is provided over the respective membrane of the further integrated device.