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公开(公告)号:KR101658037B1
公开(公告)日:2016-09-21
申请号:KR1020100111121
申请日:2010-11-09
Applicant: 삼성전자주식회사 , 서울대학교산학협력단
IPC: G09G3/30
CPC classification number: G09G3/3233 , G09G2300/0842 , G09G2310/0251
Abstract: 능동형디스플레이구동방법이개시된다. 개시된능동형디스플레이장치의구동방법은, 각화소를충전하기이전에상기화소에연결된스위칭트랜지스터에음의바이어스전압을인가하여상기스위칭트랜지스터의문턱전압을회복시키는단계를포함한다. 상기음의바이어스전압은상기스위칭트랜지스터의드레인전극에인가된다.
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公开(公告)号:KR101652826B1
公开(公告)日:2016-08-31
申请号:KR1020100001878
申请日:2010-01-08
Applicant: 삼성전자주식회사 , 서울대학교산학협력단
CPC classification number: G11C13/0002 , G11C13/0023 , G11C2213/71 , H01L27/101 , H01L27/102 , H01L27/2481 , H01L45/04 , H01L45/1233 , H01L45/146
Abstract: 본발명은저항성메모리재료막을이용한반도체소자및 그구동방법에관한것이다. 본발명의일 실시예에따른반도체소자는, 기판상에적어도하나의메모리셀들을포함하는반도체소자이며, 상기적어도하나의메모리셀들은, 인가되는전압에따라각각저저항상태또는고저항상태로가역적으로스위칭되며, 서로직렬연결된단극가변저항및 양극가변저항을포함한다.
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公开(公告)号:KR1020140046258A
公开(公告)日:2014-04-18
申请号:KR1020120112510
申请日:2012-10-10
Applicant: 삼성전자주식회사 , 서울대학교산학협력단
IPC: H01L29/78 , H01L21/336
CPC classification number: H01L21/823412 , B82Y99/00 , H01L21/02532 , H01L21/02647 , H01L21/3065 , H01L27/088 , H01L27/1222 , H01L29/0673 , H01L29/42392 , H01L29/772 , H01L29/7843 , H01L29/78651 , H01L29/78696 , Y10S977/762 , Y10S977/938
Abstract: Provided is a semiconductor device and a method of fabricating the same. The semiconductor device includes a substrate having first and second areas separated from each other; a structure formed on the substrate and formed by alternately laminating at least one sacrificial layer and at least one active layer; a first gate-all-around device formed in a first area and including a first nanowire; and a second gate-all-around device formed in a second area and including a second nanowire. The first nanowire is formed at the same level as that of a first active layer among the at least one active layer, and the second nanowire is formed at the same level as that of a second active layer among the at least one active layer. The first active layer is different from the second active layer.
Abstract translation: 提供一种半导体器件及其制造方法。 半导体器件包括具有彼此分离的第一和第二区域的衬底; 通过交替地层叠至少一个牺牲层和至少一个有源层而形成在所述基板上的结构; 形成在第一区域中并且包括第一纳米线的第一栅极全能器件; 以及形成在第二区域中并且包括第二纳米线的第二栅极全能器件。 第一纳米线形成在与至少一个有源层中的第一有源层相同的电平上,并且第二纳米线形成在与至少一个有源层中的第二有源层相同的电平上。 第一活性层与第二活性层不同。
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公开(公告)号:KR1020130083315A
公开(公告)日:2013-07-22
申请号:KR1020120004031
申请日:2012-01-12
Applicant: 삼성전자주식회사
IPC: H01L21/50
Abstract: PURPOSE: Semiconductor equipment is provided to increase an operation speed by including a transfer device which bidirectionally transfers a substrate. CONSTITUTION: A transfer device is located on a die attaching device and a wire bonding device. The transfer device includes a rail (210), a movable structure mounted on the rail, and a support structure mounted on the movable structure. The movable structure includes a slider (221) which moves on the rail and a driving motor (222) attached to one side of the slider. The support structure mounts a substrate (400). The support structure includes a first mounting unit (231), a second mounting unit (232), and a fixing unit (233).
Abstract translation: 目的:提供半导体设备以通过包括双向传送衬底的传送装置来提高操作速度。 构成:转移装置位于模具附着装置和引线接合装置上。 传送装置包括轨道(210),安装在轨道上的可移动结构以及安装在可移动结构上的支撑结构。 可移动结构包括在轨道上移动的滑块(221)和附接到滑块的一侧的驱动马达(222)。 支撑结构安装基板(400)。 支撑结构包括第一安装单元(231),第二安装单元(232)和固定单元(233)。
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公开(公告)号:KR1020130081994A
公开(公告)日:2013-07-18
申请号:KR1020120003147
申请日:2012-01-10
Applicant: 삼성전자주식회사 , 서울대학교산학협력단
IPC: H01L21/28 , H01L21/336 , H01L29/78
CPC classification number: H01L21/76889 , H01L21/28518 , H01L21/743 , H01L21/76843 , H01L21/76855 , H01L23/485 , H01L23/535 , H01L27/0688 , H01L27/1108 , H01L27/1157 , H01L27/11582 , H01L27/2409 , H01L2924/0002 , H01L2924/00
Abstract: PURPOSE: A manufacturing method of semiconductor device which comprises a filling wiring and a device relating the same are provided to prevent a contamination of a semiconductor substrate by comprising the filling wiring in the lower part of an active element. CONSTITUTION: An inter-layer insulating film which covers a sacrificed pattern, a body and an active element is formed (140). A contact hole which exposes the sacrificed pattern through the inter-layer insulating film is formed. An empty space is formed by removing the sacrificed pattern (150). An amorphous silicon film is formed inside the contact hole and the empty space (160). The amorphous silicon film is transformed to the metal silicide layer (170). [Reference numerals] (110) Producing sacrificed pattern; (120) Forming semiconductor layer; (130) Forming gate transmission membrane and electrode; (140) Forming inter-layer insulation membrane; (150) Removing the sacrificed pattern; (160) Forming amorphous silicone membrane; (170) Forming metal silicide membrane; (180) Forming core
Abstract translation: 目的:提供一种包括填充布线和与其相关的装置的半导体器件的制造方法,以通过在有源元件的下部包括填充布线来防止半导体衬底的污染。 构成:形成覆盖牺牲图案,主体和有源元件的层间绝缘膜(140)。 形成通过层间绝缘膜露出牺牲图案的接触孔。 通过去除牺牲图案(150)形成空白空间。 在接触孔和空的空间160内形成非晶硅膜。 将非晶硅膜转变成金属硅化物层(170)。 (附图标记)(110)生产牺牲图案; (120)形成半导体层; (130)形成栅极传输膜和电极; (140)形成层间绝缘膜; (150)去除牺牲图案; (160)形成无定形硅胶膜; (170)形成金属硅化物膜; (180)成核
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公开(公告)号:KR1020120139067A
公开(公告)日:2012-12-27
申请号:KR1020110058623
申请日:2011-06-16
Applicant: 삼성전자주식회사 , 서울대학교산학협력단
IPC: H01L27/088 , H01L29/78 , H01L21/336
CPC classification number: H01L27/1104 , H01L21/823487 , H01L21/823885 , H01L27/092 , H01L29/7827
Abstract: PURPOSE: A semiconductor device with a vertical device and a non-vertical device and a forming method thereof are provided to implement a semiconductor device with a threshold voltage of various levels without an additional process. CONSTITUTION: A p-well(24), an n-well(25) and a device isolation layer(23) are formed on a semiconductor substrate(21). An n-drain region(26), a first source/drain region(27), and a second source/drain region(29) are formed on the p-well. A p- vertical channel region(31P) and an n- source region(33S) are formed on the n- drain region. A channel region(28) is formed between the first source/drain region and the second source/drain region. A second gate electrode(43B) is formed on the channel region. A second gate dielectric layer(41B) is interposed between the second gate electrode and the channel region.
Abstract translation: 目的:提供具有垂直装置和非垂直装置及其形成方法的半导体装置,以实现具有各种级别的阈值电压的半导体装置,而无需额外的工艺。 构成:在半导体衬底(21)上形成p阱(24),n阱(25)和器件隔离层(23)。 在p阱上形成n沟道区(26),第一源极/漏极区(27)和第二源极/漏极区(29)。 在n-漏极区上形成p-垂直沟道区(31P)和n-源极区(33S)。 在第一源极/漏极区域和第二源极/漏极区域之间形成沟道区域(28)。 第二栅电极(43B)形成在沟道区上。 在第二栅极电极和沟道区域之间插入第二栅极介电层(41B)。
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公开(公告)号:KR1020110037646A
公开(公告)日:2011-04-13
申请号:KR1020090095174
申请日:2009-10-07
Applicant: 삼성전자주식회사
IPC: H01L21/58
CPC classification number: H01L24/83 , H01L24/75 , H01L2224/83 , H01L2224/838 , H01L2924/01006 , H01L2924/01033 , H01L2924/01047 , H01L2924/01074 , H01L2924/01082 , Y10T156/1707 , Y10T156/1744
Abstract: PURPOSE: A die bonding apparatus of a semiconductor is provided to increase the productivity by including two bonding heads for die-bonding semiconductor chips in one substrate alternately to reduce a cycle time. CONSTITUTION: In a die bonding apparatus of a semiconductor, a first bonding head(11) transfers a first semiconductor chip(1) along a transfer path to a bonding point on a substrate. A first transfer unit(13) moves the first bonding head and a second bonding head(12) transfers a second semiconductor chip to the bonding point along the transfer path. A second transfer unit(14) moves a second bonding head. A controller(15) applies a transfer signal and a return signal to the first and second transfer unit.
Abstract translation: 目的:提供一种半导体的管芯接合装置,通过包括两个用于将一个衬底中的半导体芯片芯片接合的结合头来交替地降低循环时间来提高生产率。 构成:在半导体的管芯接合装置中,第一接合头(11)将第一半导体芯片(1)沿着传输路径传送到基板上的接合点。 第一传送单元(13)移动第一接合头,第二接合头(12)沿着传送路径将第二半导体芯片传送到接合点。 第二转印单元(14)移动第二粘合头。 控制器(15)将传送信号和返回信号应用于第一和第二传送单元。
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公开(公告)号:KR1020080051065A
公开(公告)日:2008-06-10
申请号:KR1020070123002
申请日:2007-11-29
Applicant: 삼성전자주식회사
IPC: H01L27/115 , H01L21/8247
CPC classification number: H01L27/2436 , H01L27/2463
Abstract: A flash memory and a driving method thereof are provided to remove interference of adjacent cells by easily depleting a body region of a memory cell formed on a semiconductor pin. A local bit line is connected with a bit line on a semiconductor substrate(110) of first conductive type. A local source line is connected with a common source line crossing the bit line. Plural memory cells are connected parallel with the local source line and the bit line. The local bit line and the local source line are vertically spaced apart from each other in the semiconductor substrate, and include a first doped layer(121) and a second doped layer(122). A first select transistor connects the bit line with the local bit line, and a second select transistor connects the common source line with the local source line. A drain select line(DSL) and a source select line(SSL) are connected to the first select transistor and the second select transistor, respectively. Plural word lines are connected to the memory cells.
Abstract translation: 提供闪速存储器及其驱动方法以通过容易地消耗形成在半导体引脚上的存储单元的体区来消除相邻单元的干扰。 局部位线与第一导电类型的半导体衬底(110)上的位线连接。 本地源极线与穿过位线的公共源极线连接。 多个存储单元与本地源极线和位线并联连接。 局部位线和局部源极线在半导体衬底中彼此垂直间隔开,并且包括第一掺杂层(121)和第二掺杂层(122)。 第一选择晶体管将位线与局部位线连接,第二选择晶体管将公共源极线与本地源极线连接。 漏极选择线(DSL)和源选择线(SSL)分别连接到第一选择晶体管和第二选择晶体管。 多个字线连接到存储单元。
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公开(公告)号:KR100734317B1
公开(公告)日:2007-07-02
申请号:KR1020060043948
申请日:2006-05-16
Applicant: 삼성전자주식회사
IPC: H01L21/8247 , H01L27/115 , B82Y10/00
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公开(公告)号:KR1020070053395A
公开(公告)日:2007-05-25
申请号:KR1020050111135
申请日:2005-11-21
Applicant: 삼성전자주식회사
Abstract: 본 발명은 칩 접착 장치의 가변형 프리베이커 매거진(pre-baker magazine)에 관한 것으로, 칩 접착 공정을 진행하는 배선기판의 폭에 따라서 매거진의 폭도 조절해 주어야 하는데, 종래의 경우 프리베이커에서 매거진을 분리한 후 배선기판의 폭에 맞게 매거진을 재조립을 한 다음 다시 프리베이커에 설치해 주어야 했다. 이와 같이 매거진의 폭 조절을 수동으로 진행했기 때문에, 칩 접착 장치의 가동율이 떨어지고, 분해/조립에 따른 공정이 길어지고, 배선기판의 폭에 대응되는 각각의 부품들을 구비해야 하고, 안전사고의 위험을 안고 있었다.
본 발명은 상기한 문제점을 해결하기 위해서, 제 1 및 제 2 적재판의 하단부에 설치되어 적재홈에 적재될 배선기판의 폭에 대응되게 제 1 및 제 2 적재판 사이의 폭을 자동으로 조절하는 이동 수단을 구비하는 가변형 프리베이커 매거진을 제공한다. 본 발명에 따르면, 프리베이커에 설치된 매거진의 분해 없이 폭을 조절하여 칩 접착 공정을 바로 진행할 수 있기 때문에, 칩 접착 장치의 가동율을 향상시킬 수 있다. 자동으로 매거진의 폭이 조절되기 때문에, 매거진의 분해 및 조립에 따른 공정 시간을 줄일 수 있고, 안정사고의 위험을 줄일 수 있다. 그리고 배선기판의 폭에 대응되는 하부 및 상부 고정 블록을 별도로 구비할 필요가 없다.
프리베이커, 칩 접착, 매거진, 가변, 폭
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