Abstract:
An integrated circuit incorporating programmable pullup and pulldown devices into each input/output (I/O) pad is described. Each I/O pad may be individually programmed to include a pullup or pulldown function. Pullpup and pulldown resistors may be removed from a system employing the present integrated circuit. Programming of the I/O pads may be accomplished in a number of ways. Following the deassertion of a reset signal, high impedance states may be transferred into a shift data storage within the integrated circuit. Once the states are received, they are shifted to the respective I/O pads through a serial chain connection of the pullup and pulldown devices within each I/O pad. The states are then maintained by each pullup and pulldown device until a subsequent reprogramming. Software programs may also reprogram the pullup and pulldown states by storing appropriate values into the shift data storage. The program then sets an appropriate value into a status register included within the integrated circuit. Upon detection of the value within the status register, the integrated circuit reprograms the high impedance states of the I/O pads with the states stored in the shift data storage.
Abstract:
A method of depositing a premetal dielectric layer (110) on a semiconductor substrate (102) involves depositing of a triple premetal dielectric layer (110) in in-situ deposition in a single fabrication tool with each subsequent layer being deposited after a previous layer with no intervening handling step. Thus, no intervening cleaning steps or other intermediate steps are performed; the substrate is then cleaned and chemical mechanical polished.
Abstract:
An improved control gate-addressed CMOS memory cell is provided which allows for programming and erasing by tunneling through the gate oxides of the PMOS and NMOS transistors. The CMOS memory cell (400) includes a PMOS transistor (402), an NMOS transistor (403), and an NMOS pass transistor (405). A capacitor (430) has a first terminal coupled to a common floating gate (416) of the PMOS and NMOS transistors and has a second terminal coupled to a control gate node.
Abstract:
A reference circuit for overerase correction in a flash memory includes a reference flash memory cell biased in a substantially similar manner to that of an overerased flash memory cell. The leakage current for the reference flash memory cell is preset to a tolerable level of leakage current for a maximum operating temperature of the flash memory and the reference flash memory cell tracks the temperature characteristics of the overerased flash memory cell, to avoid costly overcorrection at high temperatures.
Abstract:
A microprocessor employing a DSP unit and an instruction decode unit is provided. The instruction decode unit is configured to detect an instruction field included with an instruction, and to dispatch instructions having the instruction field to the DSP unit. The DSP unit performs DSP functions, such as a multiply-accumulate function. In one embodiment, the inclusion of an instruction prefix field in an x86 instruction indicates that the instruction is a DSP instruction. In one particular implementation, the inclusion of a segment override prefix byte within the prefix field of an x86 instruction indicates that the instruction is a DSP instruction. Embodiments of the DSP unit may include a vector memory for storing operands. A block of operands may be stored into the vector memory prior to initiating a large number of DSP operations upon the block of operands.
Abstract:
An integrated circuit including an array of flash EEPROM memory cells wherein overerase correction is provided after application of each erase pulse.
Abstract:
A memory device including an array of cells, where a reference current is generated by a predetermined number of reference cells disposed separate from the array of cells, the transconductance of such reference cells being equal to the transconductance of the cells of the array.
Abstract:
A scan chain (900) for sequential entries that store objects identifies an object of a first type following an object of a second type. Conceptually, if a preceding entry does not assert an "only" term, an entry storing an object of the second type generates a scan bit and asserts the "only" term which inhibits further generation of the scan bit. Each subsequent entry propagate the scan bit or if the entry stores an object of the first type, kills the scan bit and selects itself. Look-ahead logic (910, 920, 930, and 940) determines group terms from single-entry terms to indicate whether a scan bit would be generated, propagated, or killed by a group of entries. Combination of the group terms selects an entry without the delay for sequential propagation through all entries.
Abstract:
Scheduler logic (e.g., 434a.1, 434a.2, 434a.3, 434a.4, 434a.5, 434a.6, 434b.1, 434b.2, 434b.3, 434b.4, 434b.5, 434b.6) which tracks the relative age of stores with respect to a particular load (and of loads with respect to a particular store) allows a load-store execution controller (e.g., 403, 413, 434a, 434b) constructed in accordance with the present invention to hold younger stores until the completion of older loads (and to hold younger loads until completion of older stores). Address matching logic (510, 610) allows a load-store execution controller constructed in accordance with the present invention to avoid load-store (and store-load) dependencies. Propagate-kill scan chains (e.g., 710) supply the relative age indication of loads with respect to stores (and of stores with respect to loads).
Abstract:
A ROM-based decoder exploits the high degree of redundancy between instructions to share various operation structures and substantially reduce memory size. The decoder includes a circuit which merges and shares common ROM sequences to reduce ROM size. A superscalar microprocessor includes an instruction decoder having an emulation code control circuit and an emulation ROM which emulates the function of a logic instruction decoder. An instruction register is loaded with a current instruction and has various bit-fields that are updated according to the state of the processor. An entry point circuit derives an emulation ROM entry point from the instruction stored in the instruction register. The emulation ROM entry point is used to address the emulation ROM, from which an operation (Op) is read. Various fields of the Op are selectively substituted from the instruction register and emulation environment registers.