Handfarbmessgerät
    142.
    发明公开

    公开(公告)号:EP2505973A3

    公开(公告)日:2012-11-07

    申请号:EP11165484.4

    申请日:2011-05-10

    Abstract: Ein Handfarbmessgerät umfasst ein Gehäuse mit einer opto-elektronischen Messeinheit. Diese umfasst eine Optikanordnung zum Empfangen von Messlicht und eine vom Messlicht beaufschlagte Sensoranordnung, welche das Messlicht in elektrische Messsignale umwandelt und diese zu digitalen Messdaten verarbeitet. Die Messeinheit (M) besteht aus einer asphärischen Eingangslinse (L 1 ), einer Blende (B) zur Begrenzung des Einfallswinkelbereichs, einem depolarisierenden Diffusor (D), einer Sensor-Linse (L 2 ) und mindestens drei durch Farbfilter (F 1 , F 2 , F 3 ) auf unterschiedliche spektrale Empfindlichkeiten sensibilisierte Sensoren (S 1 , S 2 , S 3 ). Die Blende (B) liegt im Wesentlichen in der Brennebene der Eingangslinse (L 1 ), der Diffusor (D) ist in unmittelbarer Nähe der Blende (B) und in der Brennebene der Sensor-Linse (L 2 ) angeordnet. Die Filter (F 1 , F 2 , F 3 ) und die Sensoren (S 1 , S 2 , S 3 ) sind nahe der optischen Achse (A) angeordnet und werden mit im Wesentlichen parallelem Messlicht beaufschlagt. Die Filter (F 1 , F 2 , F 3 ) sind auf die spektralen Charakteristiken der Color Matching Functions des Standard-Beobachters nach CIE 1931 ausgelegt. Für Umgebungslichtmessungen kann ein zusätzlicher Diffusor (D E ) der Eingangslinse vorgesetzt werden.

    APPARATUS AND METHOD FOR ILLUMINATOR-INDEPENDENT COLOR MEASUREMENTS
    145.
    发明授权
    APPARATUS AND METHOD FOR ILLUMINATOR-INDEPENDENT COLOR MEASUREMENTS 有权
    DEVICE AND METHOD FOR照明无关的色彩测量

    公开(公告)号:EP1960749B1

    公开(公告)日:2011-09-28

    申请号:EP06845058.4

    申请日:2006-12-11

    Abstract: A method includes generating at least one first light beam (114) and generating at least one second light beam (118) and at least one third light beam (120) using the at least one first light beam (114) . The at least one first light beam (114) has a plurality of first regions, the at least one second light beam (118) has a plurality of second regions, and the at least one third light beam (120) has a plurality of third regions. Each of the first, second, and third light beams (114, 118, 120) has at least two regions that are spectrally different . The method also includes measuring a spectrum in each of a plurality of first wavelength bands for each of the second regions. The method further includes illuminating at least part of an object (102) with the at least one third light beam (120) to produce at least one fourth light beam (126) . The at least one fourth light beam (126) has a plurality of fourth regions, where at least two of the fourth regions are spectrally different. In addition, the method includes measuring a spectrum in each of a plurality of second wavelength bands for each of the fourth regions and identifying a radiance transfer factor of the object (102) using at least some of the measured spectra.

    Method and apparatus for spectrum analysis and encoder
    146.
    发明公开
    Method and apparatus for spectrum analysis and encoder 审中-公开
    进行频谱分析和编码器的方法和装置

    公开(公告)号:EP1666856A3

    公开(公告)日:2009-06-10

    申请号:EP06075401.7

    申请日:1999-06-25

    Abstract: A disc serving as a spatial radiation modulator has dispersed radiation filters thereon. Each filter has a transmittance or reflectance modulation function of the form sin 2 (mθ +π/4), where m is a positive integer and p has one of the four values 0, 1, 2, 3. A radiation beam including selected wavelength components is diffracted into an elongated image dispersed according to wavelength. Different wavelength components are focused onto different filters on the modulator and are encoded by corresponding filters. Since the modulation functions of the filters are orthogonal to one another, it is possible to extract the amplitude of each wavelength component after it has been encoded or modulated by corresponding filter from the total detected signal during one measurement.

    Microscopic-measurement apparatus
    147.
    发明公开
    Microscopic-measurement apparatus 审中-公开
    MikroskopischesMessgerät

    公开(公告)号:EP2053441A1

    公开(公告)日:2009-04-29

    申请号:EP08167147.1

    申请日:2008-10-21

    Abstract: A microscopic-measurement apparatus capable of conducting measurement successively in several set areas regardless of the type of stage driving system or the precision of the stage driving system.
    The microscopic-measurement apparatus for acquiring optical information from desired portions of a sample by moving a measuring optical axis on a surface of the sample includes an observation-image display section for displaying a sample surface image as an observation image, in a range of visual field which is observable at a present sample position; an optical-axis display section for displaying areas to be measured and a present position of the measuring optical axis in an overlapped state with the observation image; an area setting section capable of setting measuring areas by expanding, reducing, changing in shape and moving the areas to be measured; and an optical-information acquisition section for measuring one set measuring area or several set measuring areas successively with an instruction of starting measurement.

    Abstract translation: 一种能够在几个设定区域中依次进行测量而不管舞台驱动系统的类型或舞台驱动系统的精度的微观测量装置。 用于通过在样品的表面上移动测量光轴从样本的期望部分获取光学信息的微观测量装置包括:用于在视觉范围内显示样本表面图像作为观察图像的观察图像显示部分 在当前样本位置可观察到的场; 用于以与观察图像重叠的状态显示测量区域和测量光轴的当前位置的光轴显示部分; 区域设定部,其能够通过扩大,缩小,变形和移动待测量的区域来设定测量区域; 以及光学信息获取部分,用于以开始测量的指令连续地测量一个测量区域或几个测量区域。

    BEAM ALIGNMENT IN SPECTROSCOPIC MICROSCOPES
    149.
    发明公开
    BEAM ALIGNMENT IN SPECTROSCOPIC MICROSCOPES 审中-公开
    光束对准​​FOR光谱显微镜

    公开(公告)号:EP1971837A2

    公开(公告)日:2008-09-24

    申请号:EP07716641.1

    申请日:2007-01-12

    CPC classification number: G01J3/02 G01J3/0289 G02B7/003

    Abstract: A spectroscopic microscope includes a laser or other light source which emits light from the entrance aperture of its spectrograph, and also includes a light sensor situated on the microscope sample stage upon which a specimen is to be situated for microscopic/spectrometric analysis. The sample stage is positioned such that the signal from the light sensor is maximized, thereby indicating good alignment between the sample stage and spectrograph. Additionally, the microscope sample stage bears a light source which can emit light to be detected by a light sensor situated at the vantage point of a user/viewer utilizing the microscope, and such a light sensor can simply take the form of a video camera or other image recordation unit associated with the microscope. The sample stage can also be positioned to optimize the signal at the light sensor to signify good alignment between the sample stage and the microscope.

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