봉지재 및 상기 봉지재를 포함하는 전자 소자
    13.
    发明公开
    봉지재 및 상기 봉지재를 포함하는 전자 소자 有权
    封装材料和包括其的电子器件

    公开(公告)号:KR1020140065952A

    公开(公告)日:2014-05-30

    申请号:KR1020120133067

    申请日:2012-11-22

    CPC classification number: H01L2224/48091 H01L2924/00014

    Abstract: The present invention relates to an encapsulation material comprising: a filler having a surface treated by a silane coupling agent having at least one fluorine; a first polysiloxane having a silicon-bonded hydrogen at the terminal end (Si-H); and an encapsulation material including a second polysiloxane having a silicon-bonded alkenyl group at the terminal end (Si-Vi) and an electronic device comprising the encapsulation material.

    Abstract translation: 本发明涉及一种包封材料,其包括:具有通过具有至少一个氟的硅烷偶联剂处理的表面的填料; 在末端具有与硅键合的氢的第一聚硅氧烷(Si-H); 以及包含在末端具有与硅键合的烯基的第二聚硅氧烷(Si-Vi)的封装材料和包含该封装材料的电子器件。

    반도체 디바이스의 미세 갭 필용 화합물, 이를 포함하는 조성물 및 반도체 캐패시터의 제조방법
    16.
    发明公开
    반도체 디바이스의 미세 갭 필용 화합물, 이를 포함하는 조성물 및 반도체 캐패시터의 제조방법 有权
    用于在半导体器件中填充小GAPS的化合物,包含该化合物的组合物和用于制造半导体电容器的方法

    公开(公告)号:KR1020110079609A

    公开(公告)日:2011-07-07

    申请号:KR1020117003554

    申请日:2008-12-31

    CPC classification number: C08G77/04 Y10T428/31663

    Abstract: PURPOSE: A compound for filling micro-gap in a semiconductor device, a composition comprising the compound and a process for fabricating a semiconductor capacitor are provided to ensure excellent storage stability since the development rate and molecular weight is not changed according to keeping days. CONSTITUTION: A compound for filling micro-gap in a semiconductor device comprises (a) hydrolyzates prepared by the hydrolysis of compounds represented by formula 1:[RO]3Si-[CH2]nR', formula 2: HOOC[CH2]R2Si-O-SiR'2[CH2]COOH and formula 3: R3Si-O-X in the presence of an acid catalyst or (b) a poly condensate prepared by polycondensation of the hydrolysates, wherein n is from 0 to 10; R and R' are independently a hydrogen atom, a C1-C12 alkyl group or a C6-C20 aryl group; and X is R' or SiR'.

    Abstract translation: 目的:提供一种用于填充半导体器件中的微间隙的化合物,包含该化合物的组合物和用于制造半导体电容器的方法,以确保优异的储存稳定性,因为显影速率和分子量根据保持天数不改变。 构成:用于填充半导体器件中的微间隙的化合物包括(a)通过水解由式1表示的化合物制备的水解产物:[RO] 3Si- [CH 2] n R',式2:HOOC [CH 2] R 2 Si-O -SiR'2 [CH2] COOH和式3:R3Si-OX在酸催化剂存在下反应,或(b)通过水解产物缩聚制备的聚缩合物,其中n为0至10; R和R'独立地是氢原子,C 1 -C 12烷基或C 6 -C 20芳基; X是R'或SiR'。

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