Abstract:
The present invention relates to a photocurable composition including a silicone compound with an amide group (A) represented by the following formula 1, a barrier layer including the same, a barrier stack including the same, an encapsulated device including the same, and an encapsulation method using the same.
Abstract:
The present invention relates to an encapsulation material comprising: a filler having a surface treated by a silane coupling agent having at least one fluorine; a first polysiloxane having a silicon-bonded hydrogen at the terminal end (Si-H); and an encapsulation material including a second polysiloxane having a silicon-bonded alkenyl group at the terminal end (Si-Vi) and an electronic device comprising the encapsulation material.
Abstract:
본 발명의 일 구현예에 따른 포토레지스트 하층막용 조성물은(A) 하기 화학식 1로 표시되는 폴리실록산 수지, 및 (B) 용매를 포함한다. [화학식 1] {(SiO 1.5 Y-SiO 1.5 ) x (SiO 2 ) y (XSiO 1.5 ) z }(OH) e (OR 1 ) f 따라서, 우수한 보관 안정성 및 내에치성(etch resistance)을 가질 수 있고, 표면 물성의 조절이 용이할 수 있으며, 포토레지스트 패턴의 안정적인 형성을 가능하게 한다. 하층막, 포토레지스트, 실리콘, 폴리실록산
Abstract:
PURPOSE: A compound for filling micro-gap in a semiconductor device, a composition comprising the compound and a process for fabricating a semiconductor capacitor are provided to ensure excellent storage stability since the development rate and molecular weight is not changed according to keeping days. CONSTITUTION: A compound for filling micro-gap in a semiconductor device comprises (a) hydrolyzates prepared by the hydrolysis of compounds represented by formula 1:[RO]3Si-[CH2]nR', formula 2: HOOC[CH2]R2Si-O-SiR'2[CH2]COOH and formula 3: R3Si-O-X in the presence of an acid catalyst or (b) a poly condensate prepared by polycondensation of the hydrolysates, wherein n is from 0 to 10; R and R' are independently a hydrogen atom, a C1-C12 alkyl group or a C6-C20 aryl group; and X is R' or SiR'.
Abstract:
PURPOSE: A resist under-layer composition, and a manufacturing method of a semiconductor integrated circuit device using thereof are provided to offer a resist under-layer with the excellent anti-reflection property by easily control the absorbance and the refractive index of the composition. CONSTITUTION: A resist under-layer composition contains the following: more than one compound selected from the group containing compounds marked with [R1]3Si-[Ph1]l-Si[R2]3 and [R1]3Si-[Ph1]m-Ph2; an organic silane polycondensate selected from the group containing compounds marked with [R1]3Si-(CH2)n-R3, [R1]3Si-R4, and [R1]3Si-X-Si[R1]3; and a solvent. In the chemical formulas, Ph1 and Ph2 area substituted or non-substituted phenylene group, respectively. R1 and R2 are selected from the group consisting of a halogen group, an alkoxy group, a carboxy group, and others, respectively. R3 is a substituted or non-substituted aryl group with the carbon number of 6~12.