Abstract:
The memory array (30) comprises a plurality of cells (50), grouped together in sectors (31) and arranged in sector rows and columns, and has both hierarchical row decoding and hierarchical column decoding. Global word lines (35) are connected to at least two word lines (36) in each sector (31), through local row decoders (33); global bit lines (42) are connected to at least two local bit lines (43) in each sector (31), through local column decoders (40). The global column decoder (41) is arranged in the centre of the memory array (30), and separates from each other an upper half (30a) and a lower half (30b) of the memory array (30). Sense amplifiers (47) are also arranged in the middle of the array, thus saving space. This architecture also provides lesser stress of the cells, better reliability, and better production performance. In addition, each sector (31) is completely disconnected from the remaining sectors, and only the faulty row or column of a single sector should be doubled.
Abstract:
A boosting circuit supplied by a first voltage level (Vcc) and a second voltage level (Gnd), and having an output line (13) capable of taking a third voltage level, characterized by comprising at least two distinct circuits (A1,11,A2,12) for generating said third voltage level, the at least two circuits selectively activatable for generating said third voltage level and selectively couplable to said output line (13).
Abstract:
A non-volatile memory device is provided. The memory device includes a memory matrix (105; 605) comprising a plurality of memory cells (Mc), arranged according to a plurality of rows and a plurality of columns. The memory device further includes a plurality of word lines (WL(i)); each word line is associated with one respective row of said plurality and is connected to the memory cells of the row; the word lines are grouped into at least one packet (WLP). The memory device includes a row selector (160; 660) coupled to the word lines and adapted to selectively biasing them. The row selector includes, for each packet of word lines, a plurality of first paths, wherein each first path is adapted to apply a first biasing voltage to a corresponding word line of the packet depending on an operation to be performed on the memory cells connected to the corresponding word line. Each first path includes at least a first (N(i)) and a second (P(i)) selection transistors series-connected between a first terminal and a second terminal of the first path. The second terminal is coupled to the corresponding word line. The memory device further includes enabling means (110) for commonly providing an enabling voltage to the first terminal of the first paths associated to a selected packet of word lines including a selected word line. The enabling voltage depends on the operation to be performed on the memory cells connected to the selected word line and is adapted to enable the execution of said operation. The memory device further includes selection means (150) for selecting one among said plurality of first paths. the selected first path corresponding to the selected word line. The selection means are adapted to activate the first selection transistor of the selected first path in order to obtain the first biasing voltage from the enabling voltage by a voltage drop introduced by the first selection transistor; said selection means are further adapted to activate the second selection transistor of the selected first path in order to transfer the first biasing voltage provided by the first selection transistor onto the selected word line.
Abstract:
A circuit is disclosed. The circuit comprises a first input terminal (INA1), a second input terminal (INA2) and an output terminal (OUT). The circuit further includes a first circuital branch (610) connected between the first input terminal and the output terminal, and a second circuital branch (620) connected between the second input terminal and the output terminal. The first circuital branch is selectively activatable for coupling the first input terminal with the output terminal, and the second circuital branch is selectively activatable for coupling the second input terminal with the output terminal. The first and second circuital branches comprise each at least one electronic device having at least a first and a second device terminals. Said at least one electronic device is designed to guarantee the capability of sustaining voltage differences across at least the first and second device terminals thereof that are up-limited in absolute value by a first predetermined maximum value lower than the maximum of absolute values of voltage differences between the output terminal and the first input terminal, and between the output terminal and the second input terminal, respectively.
Abstract:
The invention relates to a method for replacing failed non-volatile memory cells, and to a corresponding non-volatile memory device of the programmable and electrically erasable type implementing the method, and comprising a memory cell array (4) organized in a row-and-column layout, and divided in array sectors (20), including at least one row decode circuit portion being supplied positive and negative voltages (Vpcx,HVNEG). The method is applied whenever the result of the erase algorithm is negative, and comprises the following steps:-
forcing an incompletely erased sector (20) into a read condition; scanning the rows of said sector (20) to check for the possible presence of a spurious current indicating a fail state; identifying and electrically isolating the failed row; re-addressing from said failed row to a redundant row provided in the same sector (20); re-starting the erase algorithm.