Abstract:
The invention relates to a charge pump latch circuit (10) comprising at least one first and one second charge pump stage (CBi-1, CBi) interconnected in an intermediate circuit node (INT) and a stabilization stage (20) connected to the intermediate circuit node (INT) and to control terminals of transistors comprised in the first and second charge pump stages (CBi-1, CBi). Advantageously according to the invention, the stabilisation stage (20) is connected to at least one first and one second pair (CFO1, CFO2) of first and second enable terminals receiving suitable and distinct phase signals able to ensure the turn-off of the stabilisation stage (20) during the overlapping periods of the phase signals.
Abstract:
L'invention concerne un procédé d'écriture de données dans une mémoire non volatile. Le procédé comprend les étapes consistant à prévoir, dans la mémoire, une zone mémoire principale (MA) non volatile comprenant des pages cible, une zone mémoire auxiliaire (XA) non volatile comprenant des pages auxiliaires, et, dans la zone mémoire auxiliaire : un secteur courant (CUR) comprenant des pages auxiliaires effacées utilisables pour écrire des données, un secteur de sauvegarde (ERM) comprenant des pages auxiliaires contenant des données rattachées à des pages cible à effacer ou en cours d'effacement, un secteur de transfert (CTM) comprenant des pages auxiliaires contenant des données à transférer dans des pages cible effacées, et un secteur indisponible (UNA) comprenant des pages auxiliaires à effacer ou en cours d'effacement. Application notamment aux mémoires Flash.
Abstract:
A charge pump architecture (10) is described of the type comprising at least one first pump (11) for the generation of a first working voltage (VXR), a second pump (12) for the generation of a second working voltage (VYP) and a third pump (13) for the generation of a third working voltage (VNEG). Advantageously according to the invention, the first pump (11) is connected to an internal supply voltage reference (Vdd) having limited value and has an output terminal (OUT1) connected to the second and third pumps (12,13) and supplying them with the first working voltage (VXR) as supply voltage. A method is also described for managing the generation of voltages to be used together with the charge pump architecture (10) according to the invention.
Abstract:
A circuit (10) is described for the generation of a temperature-compensated voltage reference (VBG) of the type comprising at least one generator circuit of a Band Gap voltage (13), inserted between a first and a second voltage reference (VDD, GND) and including an operational amplifier (OA1), having in turn a first and a second input terminal (T1, T2) connected to an input stage (15) connected to these first and second input terminal (T1, T2) and comprising at least one pair of a first and a second bipolar transistor (Q1, Q2) for the generation of a first voltage component (ΔVBE) proportional to the temperature. Advantageously according to the invention, the circuit (10) comprises the control block (14) connected to the generator circuit of a Band Gap voltage (13) in correspondence with at least one first control node (Xc1) which is supplied with a biasing voltage value (VBase) comprising at least one voltage component which increases with the temperature for compensating the variations of the base-emitter voltage (Vbe) of the first and second bipolar transistors (Q1, Q2) and ensure the turn-on of a pair of input transistors of the operational amplifier (OA1). The circuit (10) has an output terminal (OUT) suitable for supplying a temperature-compensated voltage value (VBG) obtained by the sum of the first voltage component proportional to the temperature (ΔVBE) and of a second component inversely proportional to the temperature (VBE3).
Abstract:
L'invention concerne un procédé d'écriture de données dans une mémoire non volatile (MA, XA) comportant des cellules mémoire devant être effacées avant d'être écrites. Le procédé comprend les étapes consistant à prévoir une zone mémoire principale non volatile (MA) comprenant des pages cibles, prévoir une zone mémoire auxiliaire non volatile (XA) comprenant des pages auxiliaires, prévoir une table de correspondance (VAM) pour associer à une adresse (RAD) de page cible invalide une adresse (XAD) de page auxiliaire valide, et, en réponse à une commande (CMD) d'écriture d'une donnée dans une page cible écrire la donnée ainsi que l'adresse de la page cible dans une première page auxiliaire effacée, invalider la page cible, et mettre à jour la table de correspondance.
Abstract:
A charge pump circuit (10) of the latch type is described comprising at least one first and a second charge pump stage (CBi-1,CBi) interconnected in correspondence with an intermediate circuit node (INT), in turn comprising: - first pump capacitors (CUpi-1,CUpi), (FX,FN) and respective (Upi-1,Upi); - second pump capacitors (CDowni-1,CDowni) and respective - latch transistors (MpU,MnU;MpD,MnD) inner circuit nodes (Upi-1,Upi;Downi-1), first and second enable terminals (FX,FN) receiving respective phase signals (FX,FN), the one complementary to the other. A stabilisation circuit (20) having at least one stabilisation stage (20) inserted between the intermediate circuit node (INT) and these first and second enable terminals (FX,FN) and connected to control terminals (PgU,NgU;PgD,NgD) of the latch transistors (MpU,MnU;MpD,MnD) and apt to supply them with suitable control signals for ensuring their correct turn-on and turn-off during a charge sharing period of the charge pump circuit (10).