公开(公告)号：EP1482287A1

公开(公告)日：2004-12-01

申请号：EP03405373.6

申请日：2003-05-26

Applicant: ABB RESEARCH LTD.

Inventor： Bohnert, Klaus ,  Brändle, Hubert ,  Frank, Andreas

IPC: G01J3/45 ,  G01B9/02

CPC classification number: G01J3/45

Abstract: Das Polarisations-Fourier-Transform-Spektrometer weist zur Erzeugung eines Wegunterschiedes zwischen zwei Teilstrahlen unterschiedlicher Polarisation mindestens eine doppelbrechende planparallele Platte (5) auf, welche dreh- oder kippbar gelagert ist. Durch die Drehung oder Kippung der planparallele Platte (5) wird eine Änderung des Einfallswinkels α erzeugt, so dass der genannte Wegunterschied hervorgerufen wird. Als Absorptionsspektrometer weist das Spektrometer einen polychromatischen Lichterzeuger (1), einen Kollimator (2a), eine Probe (3) und einen Polarisator (4a) auf. Während der Veränderung des Wegunterschiedes wird von einem Detektor (7) die Intensität von Licht (L) gemessen, das die mindestens eine planparallele Platte (5) und einen Analysator (4b) durchlaufen hat. Aus dem so entstehenden Interferogramm wird in einer Signalverarbeitung (8) mittels FourierTransformation das Spektrum der Probe (3) bestimmt. Das Spektrometer ist einfach und robust, und es werden zeitaufgelöste Messungen ermöglicht.

Abstract translation: 傅里叶变换光谱仪具有枢转的双折射平面平行板（5），其枢转用于改变入射辐射的入射角，并因此导致平行光束之间的光束路径差。 还提供了对样本谱进行傅立叶变换的检测器（7）和信号处理单元（8）。 对于用于确定光谱的方法的独立权利要求，其中已经通过样品的光束的入射角变化到平面平行板，并且因此它们的光程差异。

公开(公告)号：EP1046016A4

公开(公告)日：2004-05-26

申请号：EP99902098

申请日：1999-01-06

Applicant: BIO RAD LABORATORIES

Inventor： PETTIPIECE KENNETH JAMES ,  AMOS WILLIAM BRADSHAW

IPC: G01N21/64 ,  G01J3/28 ,  G01J3/45 ,  G01B9/02

CPC classification number: G01J3/2823 ,  G01J3/45 ,  G01J2003/2866

Abstract: A method and apparatus for spectral imaging system is provided. The system is for measuring the fluorescence, luminescence, or absorption at selected locations on a sample. An interferometric spectral discriminator creates an interferogram. The system can be calibrated with a slit (503). A large offset in the pathlength in the interferometer can be introduced to produce a high fringe density thus creating a monochrome image. A metaphase finder is used to locate areas of interest.

Abstract translation: 提供了一种用于光谱成像系统的方法和设备。 该系统用于测量样品上选定位置的荧光，发光或吸收。 干涉光谱鉴别器产生干涉图。 该系统可以用狭缝（503）校准。 可以引入干涉仪中路径长度的大偏移以产生高边缘密度，从而产生单色图像。 中期搜索器用于定位感兴趣的区域。

公开(公告)号：EP1036371A4

公开(公告)日：2003-01-08

申请号：EP98958648

申请日：1998-11-19

Applicant: UNIV WASHINGTON

Inventor： BASIJI DAVID A ,  VAN DER ENGH GERRIT J ,  ESPOSITO RICHARD J

IPC: G01N21/64 ,  G01J3/443 ,  G01J3/45 ,  G01N27/447 ,  G02B26/10 ,  G06K7/10 ,  G06T1/00 ,  H04N1/113 ,  G01B9/02 ,  G02B26/12 ,  G03C8/32

CPC classification number: G01J3/443 ,  G01J3/45 ,  G06K7/10801

Abstract: The present invention provides a scanning apparatus to obtain automated, rapid and sensitive scanning of substrate fluorescence, optical density or phosphorescence. The scanner uses a constant path length optical train, which enables the combination of a moving beam for high speed scanning with phase-sensitive detection for noise reduction. The constant path length optical train comprises a light source, a scanning mirror (40) to receive light from the light source and sweep it across a steering mirror (50), the steering mirror receives the light from the scanning mirror and reflect the light to a substrate wherein the substrate reflects the light to a photodetector (70).

Abstract translation: 提供扫描装置以获得对衬底荧光，光密度或磷光的自动，快速和灵敏的扫描。 扫描仪使用恒定路径长度的光学列车，其能够将用于高速扫描的移动光束与用于降噪的相敏检测组合，包括光源，用于接收来自光源的光并扫描其的扫描镜 导向镜，转向镜，用于接收来自扫描反射镜的光并将其反射到基板，从而沿着扫描弧扫过基板;以及光电检测器，用于接收来自基板的发射或散射的光，其中光路 在整个扫描过程中，从光源到光电检测器的长度基本恒定。 光学系统还可以包括波导或反射镜以收集来自衬底的发射或散射的光并将其引导到光电探测器。 对于相敏检测，光源进行强度调制，检测器与相敏检测电路连接。 还提供了使用基板转换器的扫描仪。 对于二维成像，衬底在一个维度上平移，而扫描镜在第二维度扫描光束。 对于高通量扫描仪，将堆叠的基板从托盘进料器装载到传送带上。

公开(公告)号：EP1007946A1

公开(公告)日：2000-06-14

申请号：EP97947655.3

申请日：1997-12-17

Applicant: UNIVERSITY OF WOLLONGONG

Inventor： ESLER, Michael, Brian ,  GRIFFITH, David, William, Tracy

IPC: G01N21/35 ,  G01N21/31 ,  G01J3/02

CPC classification number: G01N21/3504 ,  G01J3/02 ,  G01J3/0286 ,  G01J3/28 ,  G01J3/45 ,  G01N21/274 ,  G01N21/61

Abstract: This invention provides a method of determining a trace gas concentration in a gas sample utilising Fourier Transform Infra-Red Spectroscopy, said method comprising the following steps i) to iii) of: i) synthetically calibrating a spectrometer by the steps of: a) calculating a theoretical spectral response function for a series of candidate chemical substances; b) convolving said theoretical spectral response function with a spectrometer instrument response function corresponding to said spectrometer device so as to produce an expected response function for said series of candidate chemical substances; and c) utilising said expected response function as the calibration of said spectrometer device in the subsequent measurement of chemical substances; ii) determining a spectral window within which to fit a calculated spectral trace to an experimental spectral trace by the steps of: a) choosing a series of candidate windows; b) determining the likely error measure associated with a fitting of said spectral trace for each of said series of candidate window; c) utilising said likely error measure associated with each of said fitting to determine a final window having substantially the lowest likely error measure; and d) utilising said final window as said spectral window; and iii) utilising said calibration and said spectral window to fit a calculated spectral trace to a spectral trace measured by the spectrometer and to thereby determine the concentrations of constituent gases and/or the ratio of the concentration of one isotope isomer (i.e. isotopomer) to that of another isotopomer of the same molecular species.

公开(公告)号：EP0849575A2

公开(公告)日：1998-06-24

申请号：EP97122558.6

申请日：1997-12-19

Applicant: The Perkin-Elmer Corporation

Inventor： Ganz, Alan M. ,  Wang, Yongdong ,  Tracy, David H. ,  Hoult, Robert A. ,  Cahill, Jerry E. ,  Huppler, David A.

IPC: G01J3/00

CPC classification number: G01J3/04 ,  G01J3/45 ,  G01J2003/2866

Abstract: Standardization is achieved for FTIR spectrometric instruments that effect an intrinsic distortion in spectral information, the distortion being associated with an aperture size. An idealized function of spectral line shape is specified. With a small calibration aperture, spectral data is obtained for a basic sample having known "true" spectral data, and standard spectral data also is obtained for a standard sample. With a larger, normal sized aperture, standard spectral data is obtained again for the calibration sample. A transformation factor, that is a function of this data and the standardized function, is applied to spectral data for test samples to effect standardized information. In another embodiment, the standard sample has known true spectral data, and the basic sample is omitted. In either case, the transformation factor is applied to the sample data in logarithm form, the antilogarithm of the result effects the standardized information.

Abstract translation: 对于影响光谱信息中的固有失真的FTIR光谱仪器实现标准化，失真与孔径尺寸相关联。 规定了光谱线形状的理想化功能。 使用小的校准孔径，获得具有已知“真实”光谱数据的基本样本的光谱数据，并且还为标准样品获得标准光谱数据。 对于较大的正常尺寸的孔径，再次为校准样品获得标准光谱数据。 作为该数据和标准化功能的函数的变换因子被应用于测试样本的光谱数据以实现标准化信息。 在另一个实施例中，标准样品具有已知的真实光谱数据，并省略了基本样品。 在任一情况下，转换因子以对数形式应用于样本数据，结果的反对数效应影响标准化信息。

公开(公告)号：EP0401599A2

公开(公告)日：1990-12-12

申请号：EP90109790.7

申请日：1990-05-23

Applicant: MILES INC.

Inventor： Sandridge, Robert L. ,  Hunt, Robert N.

IPC: G01J3/443 ,  G01J3/42 ,  G01N21/35 ,  G01J5/00 ,  G01N21/47

CPC classification number: G01J3/45 ,  G01N2021/178 ,  G01N2021/3531 ,  G01N2021/3595

Abstract: A method and apparatus are described for monitoring an area or areas for the presence of gaseous materials, particularly pollutants, by collecting and analyzing infrared radiation present in the selected area, wherein the apparatus contains a computer controlled platform which positions a reflective surface in azimuth and elevation to direct said radiation into an interferometer for analysis. The results of the spectrometric analyses are made available in a form understandable to the person or device monitoring the area for the presence of specified materials. The results of the spectrometric analysis may, for example, be displayed on a video unit, printed or used to sound an alarm.

Abstract translation: 描述了通过收集和分析存在于所选择的区域中的红外辐射来监测气体材料特别是污染物的存在的区域的方法和装置，其中所述装置包含计算机控制的平台，其将反射表面定位在方位角，并且 高程将所述辐射引导到干涉仪中进行分析。 光谱分析的结果以对于指定材料的存在监视该区域的人或设备可理解的形式提供。 光谱分析的结果可以例如显示在视频单元上，打印或用于发出报警。

公开(公告)号：EP4403890A1

公开(公告)日：2024-07-24

申请号：EP22869606.8

申请日：2022-03-23

Applicant: Shimadzu Corporation

Inventor： ARAKI, Takahisa ,  WAKUDA, Shinya

IPC: G01J3/45

CPC classification number: G01J3/45

Abstract: Provided is a Fourier transform infrared spectrophotometer configured to hinder, to a greater extent, heat transfer from an infrared light source to an interferometer. The Fourier transform infrared spectrophotometer (100) includes: an infrared light source (21) that emits infrared light; an interferometer (10) that includes a beam splitter, a fixed mirror, and a moving mirror, and generates interference light from the infrared light; and a base plate (2) including a first portion (2a) where the infrared light source (21) is located and a second portion (2b) where the interferometer (10) is located. The base plate (2) has a shape forming a predetermined angle between the first portion (2a) and the second portion (2b).

公开(公告)号：EP3361226A1

公开(公告)日：2018-08-15

申请号：EP18154715.9

申请日：2018-02-01

Applicant: Samsung Electronics Co., Ltd. ,  IMEC vzw

Inventor： CLAES, Tom ,  AHN, Sung Mo ,  LEE, Woo Chang

IPC: G01J3/26 ,  G01J3/28 ,  G01J3/44

CPC classification number: G01J3/45 ,  G01J3/26 ,  G01J3/2803 ,  G01J3/44

Abstract: A spectrometer is provided. The spectrometer may include an image sensor including a pixel array; and a photonics layer disposed on the pixel array and including a plurality of resonators and a plurality of couplers evanescently coupled to the plurality of resonators.

公开(公告)号：EP2813828B8

公开(公告)日：2018-07-18

申请号：EP14171217.4

申请日：2014-06-04

Applicant: Airbus Defence and Space SAS ,  Centre National d'Etudes Spatiales (CNES)

Inventor： Pasternak, Frédéric

IPC: G01J3/453

CPC classification number: G01B9/02049 ,  G01B9/02015 ,  G01J3/45 ,  G01J3/4535 ,  G01J3/4537

公开(公告)号：EP3321650A1

公开(公告)日：2018-05-16

申请号：EP15897747.0

申请日：2015-07-10

Applicant: Hamamatsu Photonics K.K.

Inventor： WARASHINA, Yoshihisa ,  SUZUKI, Tomofumi ,  KASAMORI, Kohei ,  OKUMURA, Ryosuke ,  KOTANI, Kyosuke

IPC: G01J3/45 ,  G01B9/02

CPC classification number: G01B9/02049 ,  G01B9/02015 ,  G01B9/02027 ,  G01B9/02051 ,  G01J3/0205 ,  G01J3/021 ,  G01J3/0262 ,  G01J3/45 ,  G01J3/453 ,  G01J3/4535

Abstract: An optical interferometer 1A includes a branching-combining unit 10, a first optical system 20, a second optical system 30, and a drive unit 40, which can be MEMS-based components. The branching-combining unit 10 includes a branching surface 11, an incident surface 12, an output surface 13, and a combining surface 14 on an interface between the interior and the exterior of a transparent member. The branching-combining unit 10, on the branching surface 11, partially reflects incident light L 0 and outputs as first branched light L 11 , and transmits the rest of the incident light into the interior as second branched light L 21 . The branching-combining unit 10, on the combining surface 14, outputs the first branched light L 12 to the outside, reflects the second branched light L 22 , and combines the light beams to be output to the outside as combined light L 3 . Thus, a MEMS-based optical interferometer capable of decreasing light loss from branching to combining and improving interference efficiency is realized.

Abstract translation: 光干涉仪1A包括分支结合单元10，第一光学系统20，第二光学系统30和驱动单元40，其可以是基于MEMS的部件。 分支结合单元10包括在透明构件的内部和外部之间的界面上的分支表面11，入射表面12，输出表面13和结合表面14。 分支结合单元10在分支表面11上部分地反射入射光L0并作为第一分支光L11输出，并将其余的入射光透射到内部作为第二分支光L21。 分支合成单元10在合成面14上向外部输出第一分支光L12，反射第二分支光L22，并将要输出到外部的光束合成为合成光L3。 因此，实现了能够减少从分支到合并并提高干扰效率的光损耗的基于MEMS的光学干涉仪。