Abstract:
PROBLEM TO BE SOLVED: To provide a radiation sensitive resin composition having high transparency to a radiation and useful as a chemically amplified resist excellent in basic physical properties as a resist, such as sensitivity and resolution, and excellent also in pattern shape, uniformity in film thickness and storage stability. SOLUTION: The radiation sensitive resin composition comprises (A) an alkali-insoluble or slightly alkali-soluble resin having an acid-dissociating protective group represented by formula (I), (B) a radiation sensitive acid generator and (C) propylene glycol monomethyl ether acetate, γ-butyrolactone and cyclohexanone as solvents. COPYRIGHT: (C)2004,JPO
Abstract:
PROBLEM TO BE SOLVED: To provide a radiation-sensitive resin composition excellent in contrast, capable of forming a fine resist pattern with a high degree of accuracy and excellent also in transparency to a radiation, sensitivity and resolution. SOLUTION: The radiation-sensitive resin composition comprises (A) a resin comprising an acid-dissociable group-containing norbornene compound typified by 5-[(1-methylcyclohexyl)oxycarbonyl]norbornene or 5-(2-methyl-1- adamantyloxycarbonyl)norbornene and maleic anhydride, (B) a radiation-sensitive acid generator and (C) a compound typified by a di-t-butyl 1,3- adamantanedicarboxylate or 2,5-dimethyl-2,5-di(1-adamantylcarbonyloxy)hexane. Preferably the resin (A) further comprises a polar group-containing alicyclic ester of (meth)acrylic acid typified by 3-hydroxy-1-adamantyl (meth)acrylate. COPYRIGHT: (C)2003,JPO
Abstract:
PROBLEM TO BE SOLVED: To provide a radiation sensitive resin composition having high transparency to radiation, excellent in basic physical properties as a resist, e.g. sensitivity, resolution and pattern shape, excellent also in shelf stability as a composition and retaining satisfactory adhesiveness to a substrate. SOLUTION: The radiation sensitive resin composition contains (A) a low molecular compound obtained by preparing a compound having one or more amino groups with at least one hydrogen atom bonding to a nitrogen atom and substituting a t-butoxycarbonyl group for one or more of such hydrogen atoms bonding to a nitrogen atom, (B) a radiation sensitive acid generating agent and (C) an alkali-insoluble or slightly alkali-soluble acid dissociable group- containing resin having an alicyclic structure in the principal chain and/or a side chain and a carboxylic acid anhydride structure in a side chain and convertible to an alkali-soluble resin when the acid dissociable group is dissociated.
Abstract:
PROBLEM TO BE SOLVED: To provide a radiation sensitive resin composition excellent in basic physical resist properties such as sensitivity and resolution and showing only a small sensitivity change due to long-term storage. SOLUTION: The radiation sensitive resin composition contains (A) an alkali- insoluble or slightly alkali-soluble acid dissociable group-containing resin having a 3-30C alicyclic skeleton substituted by a group of formula 1 [where R1 is a group of formula 2 (where R2 and R3 are each a 1-4C alkyl or combine to each other to form a 3- to 8-membered cyclic structure) or formula 3 (where R4 is a 1-4C alkyl)] and convertible to an alkali-soluble resin when the acid dissociable group is dissociated and (B) a radiation sensitive acid generating agent.
Abstract:
PROBLEM TO BE SOLVED: To provide a resist composition for liquid immersion exposure, which exhibits sufficient general characteristics such as sensitivity and LWR (line width roughness), can reduce development defects during development and is excellent in storage stability.SOLUTION: The resist composition for liquid immersion exposure comprises: [A] a polymer, which has a structural unit (I) including a group expressed by formula (i) and includes a fluorine atom; and [B] an acid generator. In formula (i), Rrepresents an alkali dissociable group; A represents -SO-O-*, -SO-O-*, -NO-O-*, -N-O-*, -B(OR)-O-*, -P(=O)(OR)-O-* or a group expressed by formula (ii), in which * represents a coupling moiety with the above R; and Rand Reach independently represent a monovalent hydrocarbon group having 1 to 20 carbon atoms.
Abstract:
PROBLEM TO BE SOLVED: To provide a radiation-sensitive resin composition which improves pattern rectangularity in addition to LWR for a line-and-space pattern, as well as circularity for a contact hole pattern and circularity holding capability for a narrow pitch pattern, suitable for liquid immersion process for a line width of 45 nm or less; and a pattern formation method using the same.SOLUTION: A radiation-sensitive resin composition contains a polymer [A] having a structural unit (I) represented by the following formula (1) and an acid generating material [B] including a compound represented by the following formula (2).
Abstract:
PROBLEM TO BE SOLVED: To provide a radiation-sensitive resin composition suppressing generation of particles in a liquid of the composition even when stored for a long period of time, and having excellent storage stability as showing little change with time in characteristics such as superior sensitivity to radiation and a high receding contact angle during exposure.SOLUTION: The radiation-sensitive resin composition contains: a fluorine-containing polymer (A) including a structural unit (f1) having a base-dissociable group; a compound (C) that generates an acid by irradiation with radiation; and a salt (D) that generates a compound having a specified pKa by irradiation with radiation.
Abstract:
PROBLEM TO BE SOLVED: To provide a radiation-sensitive resin composition which ensures good LWR after development and hardly causes film shrinkage. SOLUTION: The radiation-sensitive resin composition comprises (A) a polymer having a repeating unit represented by general formula (1) and an acid dissociable group, (B) a radiation-sensitive acid generator, and (C) a fluorine atom-containing polymer, wherein R 1 denotes H or the like; R 2 denotes a single bond or the like; and R 3 denotes a trivalent organic group. COPYRIGHT: (C)2011,JPO&INPIT
Abstract translation:要解决的问题:提供一种在显影后保证良好的LWR并且几乎不引起膜收缩的辐射敏感性树脂组合物。 解决方案:辐射敏感性树脂组合物包含(A)具有由通式(1)表示的重复单元和酸解离基的聚合物,(B)辐射敏感性酸产生剂,和(C)氟 含有原子的聚合物,其中R 1表示H等; R 2 SP>表示单键等; R 3表示三价有机基团。 版权所有(C)2011,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a radiation-sensitive resin composition which forms a resist pattern with small LWR (line width roughness) and an excellent pattern shape. SOLUTION: The radiation-sensitive resin composition comprises (A) a polymer including a specific repeating unit, (B) a radiation-sensitive acid generator, and (C) an organic solvent. COPYRIGHT: (C)2011,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a radiation-sensitive resin composition of excellent resolution performance, capable of forming a chemical amplification type resist of small nano edge roughness. SOLUTION: This radiation-sensitive resin composition contains a sulfonic acid group containing radiation-sensitive acid generating agent (A) expressed by General Formula (1) wherein R 1 represents a hydrocarbon group or the like, and M + represents a monovalent onium cation, and a resin (B) containing 25-40 mol% of repetition units as total having an acid dissociative group, per 100 mol% of total resin component. COPYRIGHT: (C)2010,JPO&INPIT