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公开(公告)号:DE60143178D1
公开(公告)日:2010-11-18
申请号:DE60143178
申请日:2001-06-15
Inventor: NISHIMURA YUKIO , YAMAHARA NOBORU , YAMAMOTO MASAFUMI , KAJITA TORU , SHIMOKAWA TSUTOMU , ITO HIROSHI
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公开(公告)号:JP2003241383A
公开(公告)日:2003-08-27
申请号:JP2002046520
申请日:2002-02-22
Inventor: NISHIMURA YUKIO , HOSHI MICHIAKI , SOYANO AKIMASA , KAJITA TORU , ALLEN ROBERT D , VARANASI PUSHKARA RAO
IPC: G03F7/039 , C08F220/26 , C08F220/34 , C08F220/38 , C08F222/06 , C08F232/08 , G03F7/004 , H01L21/027
Abstract: PROBLEM TO BE SOLVED: To provide a radiation-sensitive resin composition excellent in contrast, capable of forming a fine resist pattern with a high degree of accuracy and excellent also in transparency to a radiation, sensitivity and resolution. SOLUTION: The radiation-sensitive resin composition comprises (A) a resin comprising an acid-dissociable group-containing norbornene compound typified by 5-[(1-methylcyclohexyl)oxycarbonyl]norbornene or 5-(2-methyl-1- adamantyloxycarbonyl)norbornene and maleic anhydride, (B) a radiation-sensitive acid generator and (C) a compound typified by a di-t-butyl 1,3- adamantanedicarboxylate or 2,5-dimethyl-2,5-di(1-adamantylcarbonyloxy)hexane. Preferably the resin (A) further comprises a polar group-containing alicyclic ester of (meth)acrylic acid typified by 3-hydroxy-1-adamantyl (meth)acrylate. COPYRIGHT: (C)2003,JPO
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公开(公告)号:JP2002072484A
公开(公告)日:2002-03-12
申请号:JP2001108824
申请日:2001-04-06
Inventor: NISHIMURA YUKIO , YAMAHARA NOBORU , YAMAMOTO MASASHI , KAJITA TORU , SHIMOKAWA TSUTOMU , ITO HIROSHI
Abstract: PROBLEM TO BE SOLVED: To provide a new radiation sensitive resin composition having high transparency to radiation, having excellent basic properties as a resist, e.g. sensitivity, resolution and pattern shape, not causing development defects in microfabrication and capable of producing semiconductor devices in a high yield. SOLUTION: The radiation sensitive resin composition contains (A) an acid dissociable group-containing resin having a structure of formula (1) (where R1 is H, a monovalent acid dissociable group, an alkyl having no acid dissociable group or an alkylcarbonyl having no acid dissociable group; X1 is a 1-4C linear or branched fluoroalkyl; and R2 is H, a linear or branched alkyl or a linear or branched fluoroalkyl) and (B) a radiation sensitive acid generating agent.
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公开(公告)号:JP2011070209A
公开(公告)日:2011-04-07
申请号:JP2010246045
申请日:2010-11-02
Applicant: Internatl Business Mach Corp
, Jsr Corp , Jsr株式会社 , インターナショナル・ビジネス・マシーンズ・コーポレーションInternational Business Maschines Corporation Inventor: NISHIMURA YUKIO , YAMAHARA NOBORU , YAMAMOTO MASASHI , KAJITA TORU , SHIMOKAWA TSUTOMU , ITO HIROSHI
IPC: G03F7/039 , C08F214/18 , C08F220/22 , C08F220/24 , C08F232/08 , C08G61/08 , C08K5/10 , C08L27/12 , C08L33/06 , C08L33/16 , C08L35/00 , C08L101/08 , G03F20060101 , G03F7/004 , H01L21/027
Abstract: PROBLEM TO BE SOLVED: To provide a novel radiation sensitive resin composition having high transparency to radiation, excellent basic physical properties for a resist pattern such as in sensitivity, resolution, and pattern shapes, without causing development defects during fine machining, to manufacture semiconductor elements at a high yield.
SOLUTION: The radiation-sensitive resin compositions comprises (A) a resin containing an acid dissociable group obtained by the open ring polymerization of the norbornene derivative having a structure shown by the following general formula (1), and (B) a radiation-sensitive acid generator. In the general formula (1), R
1 represents a hydrogen atom and a univalent acid dissociation group, X
1 a low-grade fluorinated alkyl group, and R
2 a hydrogen atom, an alkyl group or a fluorinated alkyl group.
COPYRIGHT: (C)2011,JPO&INPITAbstract translation: 要解决的问题:提供一种对辐射具有高透明度的新颖的辐射敏感性树脂组合物,用于抗敏剂图案的极好的基本物理性能,例如灵敏度,分辨率和图案形状,而不会在精加工期间引起显影缺陷, 以高产率制造半导体元件。 解决方案:辐射敏感性树脂组合物包含(A)含有通过具有下列通式(1)所示结构的降冰片烯衍生物的开环聚合获得的酸解离基的树脂,(B) 辐射敏感酸发生器。 在通式(1)中,R
1 SP>表示氢原子和一价酸解离基团,低级氟化烷基,X 1, 2个氢原子,烷基或氟化烷基。 版权所有(C)2011,JPO&INPIT -
公开(公告)号:DE69733164T2
公开(公告)日:2006-02-16
申请号:DE69733164
申请日:1997-02-07
Applicant: JSR CORP
Inventor: SUWA MITSUHITO , KAJITA TORU , IWANAGA SHIN-ICHIRO , OTA TOSHIYUKI
Abstract: A radiation-sensitive resin composition including (A) a resin containing an alicyclic skeleton in its backbone, and (B) a radiation-sensitive acid-generating agent, is provided. This composition is excellent in transparency with respect to radiation and dry etching resistance, and can give a photoresist pattern excellent in adhesion to substrates, sensitivity, resolution, and developability.
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公开(公告)号:DE69728366T2
公开(公告)日:2005-02-24
申请号:DE69728366
申请日:1997-12-12
Applicant: JSR CORP
Inventor: SUWA MITSUHITO , IWASAWA HARUO , KAJITA TORU , IWANAGA SHIN-ICHIRO
Abstract: A positive-tone or negative-tone radiation sensitive resin composition comprising (A) a photoacid generator represented by the following formula (1-1) or (1-2): wherein R , R , R , and R are an alkyl group , R and R are a hydroxyl group or -OR (wherein R is an organic group), A1 and A2 indicate a monovalent anion, a and c denote an integer of 4-7, and b and d an integer of 0-7. The positive-tone resin composition further comprises (B1) an acid-cleavable group-containing resin or (B2) an alkali-soluble resin and an alkali solubility control agent, and the negative-tone radiation sensitive resin composition further comprises (C) an alkali-soluble resin and (D) a crosslinking agent. The resin compositions are highly sensitive and exhibit superior resolution and pattern forming performance.
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公开(公告)号:DE69736024T2
公开(公告)日:2006-11-23
申请号:DE69736024
申请日:1997-02-07
Applicant: JSR CORP
Inventor: SUWA MITSUHITO , KAJITA TORU , IWANAGA SHIN-ICHIRO , OTA TOSHIYUKI
Abstract: A radiation-sensitive resin composition including (A) a resin containing an alicyclic skeleton in its backbone, and (B) a radiation-sensitive acid-generating agent, is provided. This composition is excellent in transparency with respect to radiation and dry etching resistance, and can give a photoresist pattern excellent in adhesion to substrates, sensitivity, resolution, and developability.
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公开(公告)号:SG125883A1
公开(公告)日:2006-10-30
申请号:SG200004850
申请日:2000-09-16
Applicant: JSR CORP
Inventor: DOUKI KATSUJI , MURATA KIYOSHI , ISHII HIROYUKI , KAJITA TORU , SHIMOKAWA TSUTOMU
Abstract: A radiation-sensitive resin composition comprising (A) a resin containing an acid-dissociable group which is insoluble or scarcely soluble in alkali and becomes alkali soluble when the acid-dissociable group dissociates, comprising the following recurring unit (I), recurring unit (II), and at least one of the recurring units (III-1) and (III-2), and (B) a photoacid generator. The radiation-sensitive resin composition is suitable for use as a chemically-amplified resist showing sensitivity to active radiation such as deep ultraviolet rays represented by a KrF excimer laser or ArF excimer laser, exhibiting superior dry etching resistance without being affected by types of etching gas, having high radiation transmittance, exhibiting excellent basic characteristics as a resist such as sensitivity, resolution, and pattern shape, possessing excellent storage stability as a composition, and exhibiting sufficient adhesion to substrates.
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公开(公告)号:DE60025297T2
公开(公告)日:2006-08-17
申请号:DE60025297
申请日:2000-09-14
Applicant: JSR CORP
Inventor: DOUKI KATSUJI , MURATA KIYOSHI , ISHII HIROYUKI , KAJITA TORU , SHIMOKAWA TSUTOMU
Abstract: A radiation-sensitive resin composition comprising (A) a resin containing an acid-dissociable group which is insoluble or scarcely soluble in alkali and becomes alkali soluble when the acid-dissociable group dissociates, comprising the following recurring unit (I), recurring unit (II), and at least one of the recurring units (III-1) and (III-2), and (B) a photoacid generator. The radiation-sensitive resin composition is suitable for use as a chemically-amplified resist showing sensitivity to active radiation such as deep ultraviolet rays represented by a KrF excimer laser or ArF excimer laser, exhibiting superior dry etching resistance without being affected by types of etching gas, having high radiation transmittance, exhibiting excellent basic characteristics as a resist such as sensitivity, resolution, and pattern shape, possessing excellent storage stability as a composition, and exhibiting sufficient adhesion to substrates.
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公开(公告)号:DE60025297D1
公开(公告)日:2006-03-30
申请号:DE60025297
申请日:2000-09-14
Applicant: JSR CORP
Inventor: DOUKI KATSUJI , MURATA KIYOSHI , ISHII HIROYUKI , KAJITA TORU , SHIMOKAWA TSUTOMU
Abstract: A radiation-sensitive resin composition comprising (A) a resin containing an acid-dissociable group which is insoluble or scarcely soluble in alkali and becomes alkali soluble when the acid-dissociable group dissociates, comprising the following recurring unit (I), recurring unit (II), and at least one of the recurring units (III-1) and (III-2), and (B) a photoacid generator. The radiation-sensitive resin composition is suitable for use as a chemically-amplified resist showing sensitivity to active radiation such as deep ultraviolet rays represented by a KrF excimer laser or ArF excimer laser, exhibiting superior dry etching resistance without being affected by types of etching gas, having high radiation transmittance, exhibiting excellent basic characteristics as a resist such as sensitivity, resolution, and pattern shape, possessing excellent storage stability as a composition, and exhibiting sufficient adhesion to substrates.
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