Abstract:
A solution relating to a sense structure is proposed. Particularly, the sense structure (200) comprises a plurality of sense amplifiers (205 i ), each sense amplifier comprising at least one measuring terminal (INm) and a reference terminal (INr) for receiving a measuring current (Im) and a reference current (Ir), respectively, output means (225) for providing an output voltage (Vout) according to a comparison between the measuring current and the reference current, and voltage regulating means in cascode configuration (220m,220r) for regulating a voltage at the measuring terminal and at the reference terminal, the regulating means comprising a measuring regulating transistor (220m) and a reference regulating transistor (220r) having a first conduction terminal coupled with the measuring terminal and with the reference terminal, respectively, a second conduction terminal coupled with the output means and a control terminal coupled with a biasing terminal (Tb), the sense structure further comprising biasing means (230) for providing a biasing voltage (Vb) to the biasing terminal of all the sense amplifiers, and common regulating means (235) for regulating the biasing voltage for all the sense amplifiers, wherein each sense amplifier further comprises local regulating means (240) for regulating the biasing voltage applied to the biasing terminal, and in that the sense structure further comprises switching means (245) selectively controllable for coupling the local regulating means of each sense amplifier with the common regulating means to refresh the local regulating means in a rest condition and for decoupling the local regulating means of each sense amplifier from the common regulating means in an operative condition.
Abstract:
A charge pump circuit (10) has a plurality of cascaded charge pump stages (S 1 , ..., S N ), each provided with: a first pump capacitor (C u ) connected to a first internal node (U i ) and receiving a first high voltage phase signal (FHX), and a second pump capacitor (C d ) connected to a second internal node (D i ) and receiving a second high voltage phase signal (FHN), complementary with respect to the first; a first transfer transistor (M pU ) coupled between the first internal node (U i ) and an intermediate node (INT), and a second transfer transistor (M pD ) coupled between the second internal node (D i ) and the intermediate node (INT). The first and second high voltage phase signals have a voltage dynamics (VddH) higher than a maximum voltage (Vdd) sustainable by the first and second transfer transistors. The circuit is further provided with a protection stage (12) set between the first internal node (U i ) and second internal node (D i ) and respectively, the first transfer transistor (M pU ) and second transfer transistor (M pD ), for protecting the same transfer transistors from overvoltages.
Abstract:
A bandgap voltage reference circuit ( 100 ) for generating a bandgap voltage reference ( Vbg ). Said circuit comprises a current generator ( 104 ) controlled by a first driving voltage ( Vpgate ) for generating a first current ( Iptat ) depending on the driving voltage, and a first reference circuit element ( 102 ) coupled to the controlled current generator ( 104 ) for receiving the first current and generating a first reference voltage ( Vpluse ) in response to the first current. The circuit further comprises a second reference circuit element ( 106 ) for receiving a second current ( Iptat ) corresponding to the first current; said second reference circuit element is adapted to generate a second reference voltage ( Vminuse ) in response to the second current. Said circuit further comprises a third reference circuit element ( 128 ) for receiving a third current ( Iptat ) corresponding to the first current and generating the bandgap reference voltage in response to the third current, and an operational amplifier ( 124 ). The operational amplifier has a first input terminal coupled to the first circuit element for receiving a first reference voltage input ( Vplus ) based on the first reference voltage, a second input terminal coupled to the second reference circuit element for receive a second input voltage ( Vminus ) based on the second reference voltage and an output terminal coupled to the controlled current generator to provide the first driving voltage ( Vpgate ) to the current generator according to the difference between the first input voltage and the second input voltage. The circuit also comprises a control circuit ( 134 ) comprising first capacitive means ( 136 ) and second capacitive means ( 138 ). The first capacitive means have a first terminal coupled to the first reference circuit element to receive the first reference voltage and a second terminal coupled to the first input terminal to provide the first input voltage. The second capacitive means comprise a first terminal coupled to the second reference circuit element for receiving the second reference voltage and a second terminal coupled to the second input terminal to provide the second input voltage. The control circuit also comprises biasing means ( 140 ) to selectively provide a common-mode voltage ( Vcm ) to the second terminals of the first and second capacitive means.
Abstract:
A regulator circuit for a charge pump voltage generator comprises a voltage comparator means (400) for performing a voltage comparison between a charge pump output voltage (Vout) and a reference voltage (Vbg), and means (425) responsive to the voltage comparator means for conditioning a charge pump clocking to the result of the voltage comparison. The voltage comparator means includes sampling means (C3,C4,SW3-SW5,SMP) for sampling the charge pump output voltage at a sampling rate. Sampling rate control means (410,415) are provided, responsive to the voltage comparison, for controlling the sampling rate according to the result of the voltage comparison.
Abstract:
The present invention relates to a current reference circuit for low supply voltages comprising a current source (I), connected at a side to a supply voltage (Vcc) and to the other side to a series (21) composed by a resistance (R2) and diode (D1), said diode (D1) having the cathode electrode connected to the ground and the anode electrode connected with said resistance (R2), characterized in that to comprise also a transistor (M1) and an operational amplifier (OP), said transistor (M1) having the gate electrode connected to the output of said operational amplifier (OP), said transistor (M1) having the source electrode connected to the ground, said transistor (M1) having the drain electrode connected to the positive electrode of said operational amplifier (OP), with said current source (I) and with said series (21), said operational amplifier (OP) having the negative electrode connected to a band gap reference voltage (V BG ).
Abstract:
Bandgap type reference voltage source using an operational transimpedance amplifier (31). The bandgap stage is formed by a first and a second bandgap branch (2, 3) parallel-connected; the first bandgap branch (2) comprises a first diode (6) and a transistor (5), series-connected and forming a first output node (10); the second bandgap branch (3) comprises a second diode (9) and a second transistor (7) series-connected and forming a second output node (11). The operational amplifier (31) has inputs (31a, 31b) connected to the output nodes (10, 11) of the bandgap stage (18). An amplifier current detecting stage (40) is connected to the outputs (37a, 38a) of the operational amplifier (31) and supplies a current (I RES ) related to the current drawn by the operational amplifier (31). A diode current detecting stage (41) is connected to the output (40c) of the amplifier current detecting stage (40) and to an output (38a) of the operational amplifier (31) and supplies a current (I D ) related to the current (I) flowing in the first diode (6). An output stage (33) transforms this current into a stabilized voltage.
Abstract:
A solution relating to a sense structure is proposed. Particularly, the sense structure (200) comprises a plurality of sense amplifiers (205 i ), each sense amplifier comprising at least one measuring terminal (INm) and a reference terminal (INr) for receiving a measuring current (Im) and a reference current (Ir), respectively, output means (225) for providing an output voltage (Vout) according to a comparison between the measuring current and the reference current, and voltage regulating means in cascode configuration (220m,220r) for regulating a voltage at the measuring terminal and at the reference terminal, the regulating means comprising a measuring regulating transistor (220m) and a reference regulating transistor (220r) having a first conduction terminal coupled with the measuring terminal and with the reference terminal, respectively, a second conduction terminal coupled with the output means and a control terminal coupled with a biasing terminal (Tb), the sense structure further comprising biasing means (230) for providing a biasing voltage (Vb) to the biasing terminal of all the sense amplifiers, and common regulating means (235) for regulating the biasing voltage for all the sense amplifiers, wherein each sense amplifier further comprises local regulating means (240) for regulating the biasing voltage applied to the biasing terminal, and in that the sense structure further comprises switching means (245) selectively controllable for coupling the local regulating means of each sense amplifier with the common regulating means to refresh the local regulating means in a rest condition and for decoupling the local regulating means of each sense amplifier from the common regulating means in an operative condition.