Abstract:
A spectral sensor 1A includes a Fabry-Perot interference filter 10 which has a light transmission region 11; a light detector 3 which detects light having transmitted the light transmission region 11; spacers 4A and 4B which support the Fabry-Perot interference filter 10 in a surrounding region of the light transmission region 11; and a die bond resin 5 which adheres the Fabry-Perot interference filter 10 and the spacers 4A and 4B to each other. The die bond resin 5 has one opening A2 communicating with an inner side of the surrounding region and an outer side of the surrounding region, when viewed from a light transmission direction in the light transmission region 11.
Abstract:
The invention concerns an evanescent wave microspectrometer comprising: a planar diopter (D) separating two transparent media, an optical sensor (30) comprising a pixel array, and disposed in the second transparent medium (M2), and an interference device ((10, F1); (11, F1_1, F1_2)) disposed such that at least a part of said interference device is in contact with evanescent waves generated at the surface of the diopter. It is essentially characterised in that it also comprises: a memory storing a map (40) comprising a set of set of data grids (41, 42, 43) comprising the optical response of said sensor (30) for a set of quasi-monochromatic wavelengths of a calibration light source, and a calculator (50) configured to determine the spectrum (ψ) of a test light source configured to generate evanescent waves at the surface of said diopter (D), on the basis of said map (40) and the optical response of said sensor (30).
Abstract:
An imaging transform spectrometer, and method of operation thereof, that is dynamically configurable "on demand" between an interferometric spectrometer function and a broadband spatial imaging function to allow a single instrument to capture both broadband spatial imagery and spectral data of a scene. In one example, the imaging transform spectrometer is configured such that the modulation used for interferometric imaging may be dynamically turned ON and OFF to select a desired mode of operation for the instrument.
Abstract:
A method of optical spectroscopy and a device for use in optical spectroscopy. The device includes a substrate, and a plurality of etalon cavities affixed to or coupled to the substrate. A signal is received from a Fabry-Perot interferometer. The signal is sampled using the device according to a generalized Nyquist-Shannon sampling criterion. The signal is sampled using the device according to a phase differential criterion for wave number resolution. An input spectrum for the signal is reconstructed based on the signal sampled according to the generalized Nyquist-Shannon sampling criterion and the signal sampled according to the phase differential criterion for wave number resolution.
Abstract:
A spectral characteristics measurement device according to present invention includes: a dividing optical system for dividing a measurement beam emitted from each of a plurality of measurement points located within a measurement area of an object to be measured, into a first measurement beam and a second measurement beam; an imaging optical system for making the first measurement beam and the second measurement beam interfere with each other; an optical path length difference providing means for providing a continuous distribution of an optical path length difference between the first measurement beam and the second measurement beam; a detector for detecting the light intensity distribution of the interference light; a processor for acquiring an interferogram of a measurement point of the object to be measured based on the light intensity distribution of the interference light detected by the detector, and for Fourier-transforming this interferogram to obtain a spectrum; a conjugate plane imaging optical system located between the object to be measured and the dividing optical system, the conjugate plane imaging optical system having a conjugate plane shared with the dividing optical system; and a periodicity providing means located on the conjugate plane, for providing a periodicity among the measurement beams emitted from the plurality of measurement points.