Abstract:
The bandwidth selection mechanism includes a first actuator mounted on a second face of a dispersive optical element, the second face being opposite from a reflective face, the first actuator having a first end coupled to a first end block and a second end coupled to a second end block, the first actuator being operative to apply equal and opposite forces to the first end block and the second end block to bend the body of the dispersive optical element along the longitudinal axis of the body and in a first direction normal to the reflective face of the dispersive optical element. The bandwidth selection mechanism also includes a second actuator being operative to apply equal and opposite forces to bend the body along the longitudinal axis of the body, in a second direction perpendicular to the reflective face of the dispersive optical element.
Abstract:
Interferometric transform spectrometer (ITS) systems and methods of operation thereof. In one example, an ITS system includes a Michelson interferometer that introduces a varying optical path length difference (OPD) between its two arms so as to produce an interferogram, a detector that receives and samples the interferogram, and a scan controller coupled to the detector and to Michelson interferometer. The scan controller controls the Michelson interferometer to vary the OPD in discrete steps such that the detector provides M samples of the interferogram for each of two scan segments. In the first scan segment, the M samples have a uniform or non-uniform sample spacing and the OPD has a first maximum value. In the second scan segment, the M samples have an incrementally increasing sample spacing and the OPD has a second maximum value that is at least twice the first maximum value.
Abstract:
The invention relates to an apparatus for analyzing a surface area of an object, comprising: a laser device (10) configured to emit monochromatic incident light (101) of a first wavelength (λ 1 ) as well as optionally a monochromatic incident light (102) of a second wavelength (λ 2 ) that differs from the first wavelength (λ 1 ), a first deflection means (20) configured to deflect said incident light (101, 102) onto a point (P ij (x i , y j )) of a surface area (A) of an object that is to be analyzed so that scattered light (104) is generated at said point (P ij (x i , y j )), wherein said deflection means (20) is further configured to deflect said incident light (101, 102) such that said surface area (A) is scanned in a pointwise fashion by said incident light (101, 102), a first sensor means (40) configured to detect said scattered light (104) and to provide from said detected scattered light (104) a scatter data set (S ij (λ k )) for the respective point (P ij (x i , y j )), wherein the respective scatter data set (S ij (λ k )) comprises intensities of the detected scattered light (104) for different wave numbers, and a processing unit (50) for processing and/or analyzing said data sets. Further, the invention relates to a method for analyzing a surface area of an object.
Abstract:
A spectrometer is disclosed, which comprises a diffraction grating (204); and a resonant scanner drive system (200) comprising: a taut band (202) providing a rotational axis for the diffraction grating (204), wherein the diffraction grating (204) is fastened at a first side of the taut band (202); a permanent magnet (206) fastened to a second side of the taut band (202); and a first and a second spacer (208), wherein the first spacer is provided between the diffraction grating (204) and the taut band (202), wherein the second spacer is provided between the permanent magnet (206) and the taut band (202).
Abstract:
A spectral microscopy device includes a spectral detecting unit including a light source that is capable of controlling an output wavelength, a microscope section that is provided with an observation area that is illuminated with light output from the light source, and a signal detector that detects light from the observation area as spectral data; a moving unit configured to move the observation area; and a controller that performs a control operation to allow the spectral detecting unit and the moving unit to move in response to each other. The spectral microscopy device is controlled so that switching between different measurement conditions is performed at an observation area movement time in which the observation area is moved by the moving unit and measurement is performed and at an observation area movement stoppage time in which the observation area is fixed and measurement is performed.
Abstract:
Ein Monochromator (1) umfasst zumindest ein gegenüber einfallendem Licht einer Lichtquelle (3) drehbar ausgebildetes optisches Gitter (2); eine Antriebs-Einheit (8) zum Drehen des optischen Gitters (2) mittels einer mit diesem verbundenen Antriebs-Stange (7) um eine Längsachse (9); und eine Steuereinheit (10), welche die Antriebs-Einheit (8) und damit die Drehung des optischen Gitters (2) steuert. Die Antriebs-Einheit (8) des Monochromators (1) umfasst zudem ein erstes Dämpfungs-Element (11) mit zumindest einer elektrisch leitfähigen Fläche und ein zweites Dämpfungs-Element (12), das zumindest ein Magnetfeld mit einer magnetischen Achse (14) bereitstellt, welche die elektrisch leitfähige Fläche durchdringt. Dabei ist das erste oder zweite Dämpfungs-Element (11,12) mit der Antriebs-Stange (7) fest verbunden und mit dieser um deren Längsachse (9) drehbar in Relation zum zweiten oder ersten Dämpfungs-Element (12,11) ausgebildet.
Abstract:
The invention relates to a method for a marker-free demarcation of distinct areas of a tissue in vitro, comprising the steps of recording at least two different spectra and/or spectral images of the tissue, analyzing the recorded spectra and/or spectral images by a multivariate data analysis to segment the tissues into distinct areas of similar spectral signature, and classifying each area as physiological, pathological or dead according to its spectral signature.
Abstract:
An apparatus and source arrangement for filtering an electromagnetic radiation can be provided which may include at least one spectral separating arrangement (200) configured to physically separate one or more components (320, 340) of the electromagnetic radiation based on a frequency of the electromagnetic radiation. The apparatus and source arrangement may also have at least one continuously rotating optical arrangement, e.g., a spinning reflector disk scanner (500), which is configured to receive at least one signal that is associated with the one or more components (320, 340). Further, the apparatus and source arrangement can include at least one beam selecting arrangement configured to receive the signal. Rotating disk (500) may comprise reflecting patterns (520) to generate a wavelength scan depending on the rotation frequency of the disk (500).
Abstract:
Provided is a detection optical system that is provided with a dispersed-light detection function and that can increase the amount of detected light by enhancing the diffraction efficiency. A detection optical system 10 is employed which includes a transmissive VPH diffraction grating 11 that disperses fluorescence from a specimen into a plurality of wavelength bands; a rotating mechanism that rotates the VPH diffraction grating 11 about an axial line L that is perpendicular to an incident optical axis of the fluorescence from the specimen and an emission optical axis from the VPH diffraction grating 11; a light detection portion 15 that detects the fluorescence from the specimen that has been dispersed by the VPH diffraction grating 11; and a correcting portion that corrects an incident position on the light detection portion 15 in accordance with a displacement of the optical axis caused by the rotation of the VPH diffraction grating 11 in synchronization with the rotating mechanism.