Optical pumping enhancement of a two-photon spectrometer and a two-photon frequency standard

    公开(公告)号:US12025495B2

    公开(公告)日:2024-07-02

    申请号:US17750264

    申请日:2022-05-20

    CPC classification number: G01J3/10 G01J3/447

    Abstract: A light frequency standard for use as an optical clock is disclosed that is improved by optical pumping. Optical pumping is utilized to change the ground states of the atomic vapor from transition-forbidden to transition-allowed ground states involved in two-photon absorption process. Using an optical pump creates a stronger absorption line signal used for locking the laser to an absolute frequency. An optical spectrometer based upon two-photon absorption is disclosed that is improved by optical pumping, utilizing two optical pumps. The first optical pump provides photons that may combine with probe light for two-photon absorption, but it also depletes absorbing atoms that are in ground states. The second optical pump replenishes the supply of absorbing atoms into ground states allowing two-photon absorption between the first optical pump and the probe light. Two-photon absorption between the second pump light and the probe light is forbidden due to energy mismatch.

    HEAT ASSISTED DETECTION AND RANGING BASED ON SPECTROPOLARIMETRIC IMAGING

    公开(公告)号:US20230341265A1

    公开(公告)日:2023-10-26

    申请号:US17778842

    申请日:2020-12-06

    Abstract: A method of generating object surface texture in thermal infrared images is disclosed which includes receiving heat radiation from a scene by a spectropolarimetric imaging system, generating a plurality of spectral frames associated with the scene, each frame having a plurality of pixels, for each pixel from the generated plurality of spectral frames, extracting spectral information associated with the scene, including pixel-specific temperature representing an objects temperature, and thermal texture factor representing the objects texture, for each of a plurality of materials having a specific emissivity in a library, generating reference spectral information as a function of temperature and thermal texture, matching the extracted spectral information for each pixel from the generated plurality of spectral frames to the generated reference spectral information using a statistical method to minimize the associated variation, and extracting spectral metadata from the matched reference spectral information for the associated material based on the match.

    PULSED LIGHT WAVEFORM MEASUREMENT METHOD AND WAVEFORM MEASUREMENT DEVICE

    公开(公告)号:US20190128741A1

    公开(公告)日:2019-05-02

    申请号:US16088875

    申请日:2017-03-15

    Abstract: In a waveform measurement method, first, initial pulsed light is spatially dispersed for respective wavelengths. Next, the initial pulsed light is input to a polarization dependent type SLM in a state where a polarization plane is inclined with respect to a modulation axis direction, and a phase spectrum of a first polarization component of the initial pulsed light along the modulation axis direction is modulated, to cause a time difference between first pulsed light Lp1 including the first polarization component and second pulsed light Lp2 including a second polarization component orthogonal to the first polarization component. After combining the wavelength components, an object is irradiated with the pulsed light Lp1 and the pulsed light Lp2, and light generated in the object is detected. The above detection operation is performed while changing the time difference, and a temporal waveform of the pulsed light Lp1 is obtained.

    SYSTEM FOR ANALYZING OPTICAL PROPERTIES OF AN OBJECT

    公开(公告)号:US20180299252A1

    公开(公告)日:2018-10-18

    申请号:US16013664

    申请日:2018-06-20

    Abstract: Apparatus and methods are described including a line spectrometer that receives a point of light. The line spectrometer includes a first optical element, and a second optical element configured to convert the point of light to a line of light and to direct the line of light toward the first optical element. The first optical element defines first and second surfaces, a distance between the first and second surface varying as a function of distance along the first optical element, the first optical element thereby being configured to generate first and second reflected lines of light that reflect respectively from the first and second surfaces. A detector array receives the first and second lines of light, and generates an interferogram in response thereto. A computer processor determines a spectrum of the point of light, by analyzing the interferogram. Other applications are also described.

    SPATIALLY RESOLVED AEROSOL DETECTION
    388.
    发明申请

    公开(公告)号:US20180284013A1

    公开(公告)日:2018-10-04

    申请号:US15562791

    申请日:2016-03-30

    Abstract: The invention pertains to an aerosol detector system for spatially resolved detection of an aerosol distribution in an area, comprising: a wide field polarization preserving telescope having telecentric imaging optics for imaging the earth surface onto a detector; said detector receiving phase stepped images imaged by said telescope; and a controller coupled to the detector, arranged to provide a resulting image as a function of corresponding pixel values of the multiple images to produce an image at a spatially resolved polarization state corresponding to said aerosol substance; wherein the telescope comprises a first telecentric imaging lens group and a wavelength filter positioned in a field image of the first telescope telecentric beam to define a spectral range of interest; the telescope further comprising: a converging lens group converging the beam to a pupil stop; relay optics including a second telecentric imaging lens group arranged to generate a telecentric beam; and splitter optics, comprising a polarization splitter for the selected wavelength range to split the telebeam into polarized beams; a further splitter; and a retarder to create multiple phase stepped images at different polarizations, the detector comprising multiple image sensors positioned in imaging planes after the splitter optics, and said polarization splitter, further splitter and retarder positioned in the telecentric beam of the second telecentric imaging lens group.

    METROLOGY METHOD AND APPARATUS, SUBSTRATE, LITHOGRAPHIC METHOD AND ASSOCIATED COMPUTER PRODUCT

    公开(公告)号:US20180238737A1

    公开(公告)日:2018-08-23

    申请号:US15962826

    申请日:2018-04-25

    Abstract: A method of measuring n values of a parameter of interest (e.g., overlay) relating to a structure forming process, where n>1. The method includes performing n measurements on each of n+1 targets, each measurement performed with measurement radiation having a different wavelength and/or polarization combination and determining the n values for a parameter of interest from the n measurements of n+1 targets, each of the n values relating to the parameter of interest for a different pair of the layers. Each target includes n+1 layers, each layer including a periodic structure, the targets including at least n biased targets having at least one biased periodic structure formed with a positional bias relative to the other layers, the biased periodic structure being in at least a different one of the layers per biased target. Also disclosed is a substrate having such a target and a patterning device for forming such a target.

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