中科微点-全球专利检索

  1. Login
  2. Sign Up

Search Results

77 records (took 0.028 seconds)

    Detektorvorrichtung
    31.
    发明专利
    Detektorvorrichtung 未知

    公开(公告)号：DE102012107480A1

    公开(公告)日：2013-02-21

    申请号：DE102012107480

    申请日：2012-08-15

    Applicant: LEICA MICROSYSTEMS

    Inventor： SCHREIBER FRANK ,  WIDZGOWSKI BERND ,  SEYFRIED VOLKER ,  BIRK HOLGER

    IPC: H01L31/024 ,  G01J1/02 ,  G02B21/00 ,  H01L31/0232 ,  H01L31/10

    Abstract: Die Erfindung betrifft eine Detektorvorrichtung, die dazu ausgebildet ist Licht zu empfangen und elektrische Signale zu erzeugen, mit einem Gehäuse und einem in dem Gehäuse angeordneten Detektor, wobei der Detektor einen Lichtsensor aufweist, der dazu ausgebildet ist, Licht zu empfangen und Elektronen freizusetzen. Die Detektorvorrichtung zeichnet sich dadurch aus, dass der Lichtsensor auf einem niedrigeren elektrischen Potentialniveau liegt, als das Gehäuse, und dass der Detektor durch eine elektrisch isolierende Zwischenanordnung in wärmeleitendem Kontakt zu dem Gehäuse steht, wobei innerhalb des Gehäuses die Wärmeleitungsrichtung der Lichtausbreitungsrichtung des zu detektierenden Lichtes entgegengesetzt ist.

    Equipment control in microscopy with pulsed laser light
    32.
    发明专利
    Equipment control in microscopy with pulsed laser light 未知

    公开(公告)号：GB2475768B

    公开(公告)日：2012-07-04

    申请号：GB201018955

    申请日：2010-11-09

    Applicant: LEICA MICROSYSTEMS

    Inventor： SCHULTE LUDGER ,  WIDZGOWSKI BERND

    IPC: G01B9/04 ,  G02B21/00

    Abstract: A microscope for examining an object includes a laser light source generating pulsed light so as to illuminate the object. A measuring system including a detector is adapted to detect detection light coming from the object and the measuring system generates a measurement signal based on the detection light. The microscope includes a programmable integrated circuit including a control element and at least one of a first delay element and a second delay element. The control element is configured to generate a first control signal adapted to control the detector and the measuring system. The control element is further configured to generate a second control signal adapted to control the laser light source. The first and second delay elements are configured to delay the first and second control signals, respectively.

    Lasersystem für ein Mikroskop und Verfahren zum Betreiben eines Lasersystems für ein Mikroskop
    34.
    发明专利
    Lasersystem für ein Mikroskop und Verfahren zum Betreiben eines Lasersystems für ein Mikroskop 未知

    公开(公告)号：DE102009048710A1

    公开(公告)日：2011-04-21

    申请号：DE102009048710

    申请日：2009-10-08

    Applicant: LEICA MICROSYSTEMS

    Inventor： WIDZGOWSKI BERND ,  SEYFRIED VOLKER ,  BIRK HOLGER

    IPC: G02B21/06

    Abstract: Ein Lasersystem (20) für ein Mikroskop hat ein Lasermodul (22), eine Strahlkorrekturvorrichtung (26), einen Lichtleiter (31), ein Messelement (34) und eine äußere Regeleinrichtung (37). Das Lasermodul (22) erzeugt einen Lichtstrahl (24). Der Lichtstrahl (24) durchdringt die Strahlkorrekturvorrichtung (26), die eine Abweichung eines Ist-Werts mindestens eines Parameters des Lichtstrahls (24) von einem Soll-Wert des Parameters korrigiert. Der korrigierte Lichtstrahl (24) wird in den Lichtleiter (31) eingekoppelt. Das Messelement (34) ist dem Lichtleiter (31) nachgeschaltet und erfasst einen Ist-Wert (36) der Intensität zumindest eines Teilstrahls (32) des korrigierten Lichtstrahls (24). Die äußere Regeleinrichtung (37), die mit einer Energieversorgung (39) des Lasermoduls (22) und mit dem Messelement (34) gekoppelt ist, regelt mittels der Energieversorgung (39) den Ist-Wert (36) der Intensität auf einen vorgegebenen Soll-Wert der Intensität.

    36.
    发明专利
    未知

    公开(公告)号：DE60033227T2

    公开(公告)日：2007-11-15

    申请号：DE60033227

    申请日：2000-12-05

    Applicant: LEICA MICROSYSTEMS

    Inventor： ENGELHARDT JOHANN ,  WIDZGOWSKI BERND

    IPC: G02B21/00

    Abstract: The invention discloses a method for processing scan signals from a confocal microscope and a confocal microscope with a system for processing scan-signals. The confocal microscope comprises an illumination source (2) and a scanning device (6) with a scanning mirror system (7). A control and processing unit (16) is provided, which uses a plurality of programmable devices for processing the digital signals in real-time. The control and processing unit (16) has at least three input ports (161, 162, 163) and one output port (164). A first detector (12) generates analog signals from light reflected from a specimen (10) within the microscope and a second detector (14) generates analog signals proportional to the intensity of the light from the illumination source (2). In addition a position signal of the scanning laser beam is provided to the control and processing unit (16). Analog digital converters (301, 302, 303) are located prior to the input ports (161, 162, 163) of the control and processing unit (16) for providing digital signals, generated from the analog signals from the first and second detector and the position signal of the scanning device.

    37.
    发明专利
    未知

    公开(公告)号：DE102005045163A1

    公开(公告)日：2007-03-29

    申请号：DE102005045163

    申请日：2005-09-21

    Applicant: LEICA MICROSYSTEMS

    Inventor： WIDZGOWSKI BERND ,  BIRK HOLGER

    IPC: G02B21/00

    Abstract: The microscope has a detector (19) to receive the light emanating from a specimen (15) to generate a detected signal. A digital circuit (30) periodically interrogates the detected signal for each pixel and calculates an average based on the clock frequency. An independent claim is included for fluorescent light detection method.

    38.
    发明专利
    未知

    公开(公告)号：DE60033227D1

    公开(公告)日：2007-03-22

    申请号：DE60033227

    申请日：2000-12-05

    Applicant: LEICA MICROSYSTEMS

    Inventor： ENGELHARDT JOHANN ,  WIDZGOWSKI BERND

    IPC: G02B21/00

    Abstract: The invention discloses a method for processing scan signals from a confocal microscope and a confocal microscope with a system for processing scan-signals. The confocal microscope comprises an illumination source (2) and a scanning device (6) with a scanning mirror system (7). A control and processing unit (16) is provided, which uses a plurality of programmable devices for processing the digital signals in real-time. The control and processing unit (16) has at least three input ports (161, 162, 163) and one output port (164). A first detector (12) generates analog signals from light reflected from a specimen (10) within the microscope and a second detector (14) generates analog signals proportional to the intensity of the light from the illumination source (2). In addition a position signal of the scanning laser beam is provided to the control and processing unit (16). Analog digital converters (301, 302, 303) are located prior to the input ports (161, 162, 163) of the control and processing unit (16) for providing digital signals, generated from the analog signals from the first and second detector and the position signal of the scanning device.

    Compensating for intensity fluctuations in a confocal microscope
    40.
    发明专利
    Compensating for intensity fluctuations in a confocal microscope 未知

    公开(公告)号：GB2358922A

    公开(公告)日：2001-08-08

    申请号：GB0026120

    申请日：2000-10-25

    Applicant: LEICA MICROSYSTEMS

    Inventor： ENGELHARDT JOHANN ,  WIDZGOWSKI BERND

    IPC: G02B21/00 ,  G02B21/06 ,  G01J1/16 ,  G01J1/44

    Abstract: A system for compensating for intensity fluctuations of an illumination system in a confocal microscope comprises first and second analog-to-digital converters (34, 36) for digitizing a first electrical signal corresponding to the light reflected from a specimen and a second electrical signal corresponding to an illumination reference, respectively. The digitized signals are sent to first and second look-up tables (38, 40) carrying out a log conversion of the first and second electrical signals, respectively. Also provided is a calculator (42) for correcting the first electrical signal for intensity fluctuations of the second electrical signal. The corrected electrical signal is sent to a third look-up table (44) for converting the corrected electric signal. The conversion is done by exponentiation of the corrected electrical signal.

Patent Agency Ranking