Abstract:
A memory architecture (10) is described of the type comprising at least one matrix (2) of memory cells of the EEPROM type (3) organised in rows or word lines (WL) and columns or bit lines (BL), each memory cell (3) comprising a floating gate cell transistor (MC) and a selection transistor (TS) and being connected to a source line (SL) shared by the matrix (2). The memory cells (3) are organised in words (6), all the memory cells (3) belonging to a same word (6) being driven by a byte switch (5), in turn connected to at least one control gate line (CGT). Advantageously according to the invention, the memory cells (3) have accessible substrate terminals connected to a first additional line (EEW). Also a biasing method of a memory architecture is described.
Abstract:
A non-volatile memory device is proposed. The memory device (100) includes a plurality of blocks (115) of memory cells (125), each block having a common biasing node (SL) for all the memory cells of the block, biasing means (150) for providing a biasing voltage, and selection means (140, 145) for selectively applying the biasing voltage to the biasing node of a selected block, for each block the selection means including first switching means (N8, N9, N10) and second switching means (N7) connected in series, the first switching means being connected with the biasing node and the second switching means being connected with the biasing means, wherein the second switching means of all the blocks are connected in parallel, the selection means including means (145) for closing the first switching means of the selected block and the second switching means of all the blocks, and for opening the second switching means of each unselected block.
Abstract:
A sensing circuit (120) for sensing currents, including at least one sense amplifier (122), comprising: a measure circuit branch (132i), having a measure node for receiving an input current (Ic) to be sensed, for converting the input current into a corresponding input voltage (V-); at least one comparison circuit branch (132o), having a comparison node for receiving a comparison current (Igs), for converting the comparison current into a corresponding comparison voltage (V+); and at least one voltage comparator (140) for comparing the input and comparison voltages, and means (N3s,135; N3s,135';N3s,135" ) for generating the comparison current based on a reference current (Ir), said means comprising: at least one voltage generator (135;135';135'') for receiving the reference current and for generating a corresponding sense amplifier biasing voltage (Vsab); and means (N3s) for converting the sense amplifier biasing voltage into the comparison current. The at least one voltage generator includes a first circuit branch (232i), having a first node for receiving the reference current, for converting the reference current into a corresponding reference voltage (Vref), a second circuit branch (232o), having a second node for receiving a regulation current (Ii), in current mirror configuration with the first circuit branch for mirroring a current (Img) corresponding to the reference current, the second circuit branch generating by conversion a non-regulated voltage (Vgen) corresponding to the mirrored current and to the regulation current, and voltage regulator means (N3g,240) receiving the reference voltage and the non-regulated voltage for regulating the sense amplifier biasing voltage by controlling the non-regulated voltage through the regulation current.
Abstract:
A power management unit (115) for a non-volatile memory device (100) is proposed. The power management unit includes means (125) for providing a reference voltage, resistive means (Rr) for deriving a reference current from the reference voltage, means (135 1 -135 n ) for generating a plurality of operative voltages from a power supply voltage, and means (145 1 -145 n ) for regulating the operative voltages; in the power management unit of the invention, for each operative voltage the means for regulating includes means (220) for deriving a scaled reference current from the reference current according to a scaling factor, further resistive means (245 i ) for deriving a rating voltage from the scaled reference current, means (220,245 i ) for deriving a measuring voltage from the operative voltage and the rating voltage, and means (250 i ) for controlling the operative voltage according to a comparison between the measuring voltage and the reference voltage.
Abstract:
Memory sense amplifier, specifically EEPROM memories, operating in an extended supply voltage range, comprising a comparator that on an input receives a signal available on a bit line representative of the current flowing through the read memory cell and on another input it receives a signal representative of a reference current available on another bit line, and a bit lines polarization system. According to this invention the comparator comprises a stage in common source configuration (N2) and an active load (P5) for said stage. Moreover, the bit lines polarization system releases a polarization value (VBL) independent from the supply voltage value (VDD).