Abstract:
Described herein is a method for storing a datum in a first and a second memory cells of a nonvolatile memory. The storage method envisages programming the first and second memory cells in a differential way, by setting a first threshold voltage in the first memory cell and a second threshold voltage different from the first threshold voltage in the second memory cell, the difference between the threshold voltages of the two memory cells representing a datum stored in the memory cells themselves.
Abstract:
An architecture of a FLASH memory organized in a plurality of physical sectors wherein read, write and erase operations of data occupying a fractional memory space of any one of said physical sectors are carried out, may include splitting a physical sector in a plurality of singularly addressable logic sectors. Each logic sector (j) is defined by a memory space of pre-established size (PAYLOAD j ), a chain pointer (CHAIN_PTR j ) assuming a neutral value (NULL) or a value pointing directly or indirectly to a second logic sector associated to a respective chain pointer (CHAIN_PTR 2 ) at neutral value (NULL), a status indicator (STATUS j ) assuming a first value (FREE) if the logic sector is empty, a second value (OD) if the data contained in it belongs to the logic sector, a third value (NOD) if the data do not belong to the logic sector, or a fourth value (DEL) if the data has been erased, and a remap pointer (REMAP_PTR j ) assuming the neutral value (NULL) or a value pointing directly or indirectly to the chain pointer (CHAIN_PTR 3 ) of a third logic sector. A further improvement consists in attributing to each physical sector a logical address (LOGICAL_ADDRESS) permitting to destine to the function of temporary buffer, for partly erasing the content of a physical sector, in rotation all the physical sectors, not to repeatedly stressing the same sector.
Abstract:
The method includes restoring the charge lost from memory cells, such as to restore the original voltage levels, within a time equivalent to the retention time. The decision concerning when the memory is to be restored is taken for example when the memory is switched on, based on the time elapsed since the previous programming/restoration, or based on the difference between the present threshold voltage of the reference cells and the original threshold voltage of the (suitably stored) reference cells, or when predetermined operating conditions occur. This makes it possible to prolong the life of nonvolatile memories, in particular of multilevel type, wherein the retention time decreases as the number of levels (bits/cell) is increased.
Abstract:
For each cell (1) to be programmed, the present threshold value (V o ) of the cell is determined; the desired threshold value (V TAR ) is acquired; the analog distance between the present threshold value and the desired threshold value is calculated; and a programming pulse (S) is then generated, the duration of which is proportional to the analog distance calculated. The programming and reading cycle is repeated until the desired threshold is reached. By this means a time saving is obtained, owing to the reduction of the number of intermediate reading steps. The method permits programming in parallel and simultaneously of a plurality of cells (1) of a memory array (2) which is connected to a single word line (5 1 ) and to different bit lines (4 1 - 4 N ), each with a programming pulse (S 1 - S N ) the duration of which is proportional to the analog distance calculated for the same cell. The programming process is thus very fast, owing to parallel application of the programming and the saving in the intermediate reading cycles.
Abstract:
An analog reading circuit (10) comprising a current mirror circuit (19) forcing two identical currents into a cell (2) to be read and into a reference cell (27) and an operational amplifier (31) having an inverting input connected to the drain terminal (13) of the cell (2) to be read, a non-inverting input connected to the drain terminal (28) of the reference cell (27) and an output connected to the gate terminal (30) of the reference cell. The reference cell (27) therefore forms part of a negative feedback loop which maintains the overdrive voltages of the cell (2) to be read and the reference cell (27) constant, irrespective of temperature variations. The reading circuit (10) is also of high precision and has a high reading speed.