41.
    发明专利
    未知

    公开(公告)号:DE10120424B4

    公开(公告)日:2004-08-05

    申请号:DE10120424

    申请日:2001-04-26

    Abstract: A scanning microscope has a light source that emits illuminating light for illumination of a specimen, at least one first detector for detection of the detected light proceeding from the specimen, an objective arranged in both an illumination beam path and a detection beam path, and a coupling-out element that is selectably for descan detection and non-descan detection positionable in the illumination and detection beam path. A light-guiding fiber is provided for transporting at least a portion of the detection light from the coupling-out element to the first detector.

    43.
    发明专利
    未知

    公开(公告)号:DE19949272C2

    公开(公告)日:2003-09-11

    申请号:DE19949272

    申请日:1999-10-12

    Abstract: The confocal laser scan microscope has in addition to the laser source (1) a second non single mode light source (5) for the ultraviolet (UV) band which illuminates the object without focussing object and the scan (15) parameters of the objective are adjusted to achieve the required signal to noise ratio.

    44.
    发明专利
    未知

    公开(公告)号:DE10120424A1

    公开(公告)日:2002-11-07

    申请号:DE10120424

    申请日:2001-04-26

    Abstract: A scanning microscope has a light source that emits illuminating light for illumination of a specimen, at least one first detector for detection of the detected light proceeding from the specimen, an objective arranged in both an illumination beam path and a detection beam path, and a coupling-out element that is selectably for descan detection and non-descan detection positionable in the illumination and detection beam path. A light-guiding fiber is provided for transporting at least a portion of the detection light from the coupling-out element to the first detector.

    48.
    发明专利
    未知

    公开(公告)号:AT415641T

    公开(公告)日:2008-12-15

    申请号:AT04787202

    申请日:2004-09-23

    Abstract: A scanning microscope includes a light source for evanescently illuminating a sample disposed on a slide. A point detector receives detection light emanating from a scanning point of the sample. A beam deflection device disposed in an optical path of the detection light can shift a position of the scanning point.

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