Abstract:
An electrostatic transport structure (25) is formed by a plurality of concentric conductive regions (26a, 26b, 26c) to which biasing pulse trains (V1, V2, V3) are supplied. Each biased conductive region generates an electric field attracting any dielectric particles. The pulse trains supplied to immediately adjacent conductive regions are phase-shifted of a predetermined time and in a direction linked to the desired direction of movement for the electrostatic particles. Voltage pulses are sent to each conductive region delayed with respect to voltage pulses sent to an immediately preceding conductive region in the direction of desired movement and advanced with respect the voltage pulses sent to an immediately successive conductive region.
Abstract:
The integrated microactuator (1) has a stator (3) and a rotor (4) having a circular extension with radial arms (23, 6) which support electrodes (24, 12) extending in a substantially circumferential direction and interleaved with one another. For the manufacture, first a sacrificial region (34) is formed on a silicon substrate (2); an epitaxial layer (37) is then grown; the circuitry electronic components (45) and the biasing conductive regions (26, 43) are formed; subsequently a portion of substrate (2) beneath the sacrificial region (34) is removed, forming an aperture extending through the entire substrate; the epitaxial layer (37) is excavated to define and separate from one another the rotor (4) and the stator (3), and finally the sacrificial region (34) is removed to release the mobile structures from the remainder of the chip.
Abstract:
A head (130) for a disk storage device having a plurality of tracks (117) divided into memory cells (234) comprises means (205, 230a, 230b, 250a, 250b) for reading the memory cells (234) in succession, the means (205, 230a, 230b, 250a, 250b) for reading the memory cells (234) including at least two partial reading means (206a, 230a, 250a; 206b, 230b, 250b) each for reading a portion (234a; 234b) of each memory cell (234), the portions (234a; 234b) being arranged transversely relative to the longitudinal axis (233) of the corresponding track (117).
Abstract:
The pressure sensor comprises a semiconductor material single crystal substrate (21); a semiconductor material layer (28) on the substrate (21); an air gap (55) arranged between the substrate (21) and the semiconductor material layer (28); and at least an opening (53) extending between the lower outer surface (52) of the substrate (21) and the air gap (55). The semiconductor material layer (28) is formed by a polycrystalline region (29) forming a diaphragm over the air gap (55) and by a monocrystalline region (30) elsewhere. Piezoresistive elements (46) extend over the semiconductor material layer (28), insulated therefrom by a dielectric layer (45), at a lateral delimitation edge of the diaphragm (29) and are connected one another so as to form a Wheatstone bridge the unbalancing whereof allows the pressure exerted onto the sensor to be measured.
Abstract:
To increase the sensitivity of the sensor the suspended structure (40) forming the seismic mass has a tungsten core (26) which has high density. To manufacture it, a sacrificial layer (21) of silicon oxide, a polycrystal silicon layer (24), a tungsten layer (26) and a silicon carbide layer (28) are deposited in succession over a single crystal silicon body (1); the suspended structure (40) is defined by selectively removing the silicon carbide (28), tungsten (26) and polycrystal silicon (24) layers; spacers (30') of silicon carbide are formed which cover the uncovered ends of the tungsten layer (26); and the sacrificial layer (21) is then removed.