Abstract:
Bei einem Verfahren zur Behandlung und/oder Umwandlung von gasförmigen Brennstoffen, insbesondere zur Erzeugung von Wasserstoff für dezentrale Anwendungen, werden nicht thermische Plasmen eingesetzt. Dabei werden erfindungsgemäss Elektronenstrahlen mit einer Beschleunigungsspannung bis zu 20 kV verwendet. Bei der zugehörigen Vorrichtung sind der Elektronenquelle (41) geeignete Mittel (42 bis 47) zur Erzeugung eines Elektronenstrahls (48) und Einkopplung in einen Reaktor zugeordnet.
Abstract:
A method for creating an electron lens (28) includes the steps of applying a polymer layer (12) on an emitter surface (36) of an electron emitter (60) and then curing the polymer layer (12) to reduce volatile content.
Abstract:
본 발명은 진공배기 후에 진공배기라인 연결부를 밀봉하고 게터를 전자총 내부에 포함시켜 진공을 유지하며 교환 가능한 전자총 및 이를 포함하는 전자현미경에 관한 것으로, 진공배기 후에 진공배기라인 연결부를 밀봉하고 게터를 전자총 내부에 포함시켜 진공을 유지하며, 전자현미경용 전자총을 전자빔 칼럼에서 분리 가능하여 손쉽게 교체가 가능하고, 전자빔 광학계와 함께 전자현미경을 구성하거나, 기존의 전자현미경의 전자총 교체용품으로 사용이 가능하여 경제적이다.
Abstract:
A device (100) for imparting an orbital angular momentum to a charged particle wave propagating along a beam axis (104) in a charged particle beam generating apparatus is described. The device comprises a support element (106) having a target region (108) adapted for transmitting a charged particle wave propagating along a beam axis (104) and an induction means (112) for inducing a magnetic flux along an elongated profile having a free end portion located in said target region (108) and the induction means (112) is adapted for providing a magnetic flux in said elongated profile in order to induce an angular gradient, relative to the beam axis (104), of the phase of the charged particle wave when transmitted through said target region (108). A corresponding method is also disclosed, as well as the use thereof in electron microscopy.
Abstract:
The present invention provides an electron gun (12) comprising a cathode (20), for generating electrons; an anode (22); an intermediate electrode (24), located between the cathode and the anode; and a controller (14). The controller applies an electrical potential to said intermediate electrode, analysing a resultant electrical parameter to determine the integrity of said intermediate electrode; and controls the electron gun to emit a pulse of electrons.
Abstract:
Die vorliegende Erfindung betrifft ein Verfahren zur Erzeugung eines Elektronenstrahls mit einer Anordnung, die mindestens eine Kathode (1), ein elektrisch leitfähiges Gitter (2) und eine Anode (3) umfasst, sowie eine zugehörige Anordnung. In einem an die Kathode (1) und das Gitter (2) angrenzenden Bereich wird ein Plasma (6) erzeugt, aus dem über das Gitter (2) Elektronen (7) ausgekoppelt und in Richtung der Anode (3) beschleunigt werden. Das Plasma (6) wird beim vorgeschlagenen Verfahren durch Fokussieren von Laserpulsen auf eine Oberfläche der Kathode (1) erzeugt. Das Verfahren und die Anordnung lassen sich dadurch problemlos auch im Hochvakuum oder Ultrahochvakuum einsetzen und ermöglichen die Erzeugung sowohl von sub-μs-Pulsen als auch einen DC-Betrieb.
Abstract:
본 발명은 아크의 발생이 억제되고, 전자빔의 집속각의 조절이 가능한 서프레서가 구비된 캐소드 구조의 전자빔 방출장치에 관한 것으로서, 본 발명의 일 형태에 따르면, 애노드, 상기 애노드와 대향되도록 구비되는 캐소드, 상기 캐소드의 전자빔 방출면으로부터 상기 애노드를 향한 방향으로 이격되게 구비되며, 상기 캐소드와 전기적으로 연결되고, 상기 애노드 측에서 볼 때 전자빔이 방출되는 캐소드의 중앙부위는 노출되도록 개구되며, 상기 캐소드의 테두리 부위는 가려지는 형태로 형성되는 서프레서를 포함하는 서프레서가 구비된 캐소드 구조의 전자빔 방출장치가 개시된다.
Abstract:
The present invention relates to an electron beam generating apparatus capable of reducing the emittance of an electron beam. For this purpose, the electron beam generating apparatus according to the present invention comprises: a housing having a rear surface portion for generating an electron beam, a front surface portion having an electron beam emitting hole for emitting the generated electron beam to the outside, and a side surface portion for interconnecting the rear surface portion and the front surface portion, wherein the side surface portion has a first hole, and the opposite side surface portion facing said side surface with the first hole has a second hole to reduce an electric field imbalance caused by the first hole; and a waveguide arranged at the side surface portion to supply electromagnetic waves into the housing through the first hole. The laser beam applied into the housing generates an electron beam, and the thus-generated electron beam is accelerated by the electromagnetic waves supplied into the housing.
Abstract:
The charged-particle beam system includes a non-axisymmetric diode forms a non-axisymmetric beam having an elliptic cross-section. A focusing element utilizes a magnetic field for focusing and transporting the non-axisymmetric beam, wherein the non-axisymmetric beam is approximately matched with the channel of the focusing element.