72.
    实用新型
    失效

    公开(公告)号:JPS51121420U

    公开(公告)日:1976-10-01

    申请号:JP3985475

    申请日:1975-03-25

    CIRCUIT FOR APPLYING SUPPLEMENTARY VOLTAGES TO RF MULTIPOLE DEVICES

    公开(公告)号:CA2474862C

    公开(公告)日:2011-05-31

    申请号:CA2474862

    申请日:2003-02-04

    Inventor: SYKA JOHN E P

    Abstract: A circuit is described for applying RF and AC voltages to the elements or electrodes of an ion trap or ion guide. The circuit includes an RF transformer having a primary winding and a secondary winding. The secondary winding includes at least two filars. A broadband transformer adapted to be connected to a source of AC voltage applies AC voltage across the low-voltage end of two of the filars. Another broadband transformer connected to the filars at the high-voltage end provides a combined RF and AC output for application to selected electrodes. Also described is a circuit employing a multi-filar RF transformer and broadband transformers for applying RF and AC voltages to spaced rods of a linear ion trap. Also described is a circuit employing a multi-filar RF transformer and broadband transformers for applying RF and AC voltages to the electrodes in each section of a linear ion trap of the type having a center section and end sections, and different DC voltages to the electrodes in the end sections.

    ELECTRONIC OPTICAL LENS BARREL AND PRODUCTION METHOD THEREFOR

    公开(公告)号:AU2003242174A1

    公开(公告)日:2003-12-31

    申请号:AU2003242174

    申请日:2003-06-10

    Abstract: The present invention provides an electron optical lens column suitable for miniaturization, and provides the manufacturing method thereof. The column unit (1) comprises an inner column (11) and an outer column (12). The column unit is, as a whole, structured from a high-resistance electrically conductive ceramic. Electrostatic lenses (21, 22, 23, and 24) are affixed to the inner surface (111) of the inner column using a means such as plating or vapor deposition. Of the electrodes or electrode parts (211 - 213, 221, 231, 232, and 241 - 243) from which the lens is structured, those that share the same electric potential are connected by shared interconnections. This makes it possible to connect all of the electrodes or electrode parts with shared electric potentials as a group to the external interconnections.

    DEVICE AND METHOD FOR ELECTRON BEAM EMISSION

    公开(公告)号:RU2219606C2

    公开(公告)日:2003-12-20

    申请号:RU99106679

    申请日:1999-03-26

    Abstract: FIELD: emitting electron beams for extracting polluting components from stack gas. SUBSTANCE: device has electron beam emission source, acceleration tube for accelerating electrons emitted from mentioned electron emitting source, focusing electromagnet for superimposing magnetic field onto high-energy electron beam produced by means of acceleration tube to control diameter (sectional area) of electron beam, and electromagnet for deflecting and sweeping adjustable-diameter electron beam by superimposing magnetic field onto electron beam, electric current component IF, of this magnetic field being synchronized with electric current IS of focusing electromagnet electric current IF superimposing of focusing electromagnet, with the result that focusing electromagnet current IF is adjusted so as to ensure that mentioned diameter (sectional area) of electron beam were at maximum in sweep maximum points. EFFECT: provision for eliminating problem of electron beam convergence at beam maximum sweep points and for obtaining emission zone with constant energy density. 4 cl, 7 dwg

    80.
    发明专利
    未知

    公开(公告)号:DE69432670D1

    公开(公告)日:2003-06-18

    申请号:DE69432670

    申请日:1994-11-18

    Abstract: A particle-beam column comprising a needle-type ions source (1) such as a liquid metal ion source, one or more round lenses (2), and a plurality of interleaved quadrupole lenses (14, 16). Also an ion-beam column comprising a liquid alloy ion source (1), interleaved quadrupole lenses (14, 16), and a Wien velocity filter (22). Such columns produce a more finely focused beam than columns based only on electrostatic lenses, and allow increased lens apertures and larger beam currents.

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