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1.发明专利Method and device for high throughput crystal structure analysis by electron diffraction 有权用于电子衍射的高通量晶体结构分析的方法和装置
公开(公告)号：JP2014142357A
公开(公告)日：2014-08-07
申请号：JP2014065931
申请日：2014-03-27
Applicant: Nanomegas Sprl , ナノメガス エスピーアールエル , Institut Polytechnique De Grenoble , インスティチュート ポリテクニック デ グレノーブル , Centre Natl De La Recherche Scientifique , セントレ・ナショナル・デ・ラ・レシェルシェ・サイエンティフィーク
Inventor： STAVROS NICOLOPOULOS , DANIEL BULTREYS , EDGARD RAUCH
IPC: G01N23/225 , H01J37/22 , H01J37/28
CPC classification number: H01J37/28 , G01N23/20058 , H01J37/05 , H01J37/222 , H01J37/256 , H01J37/2955 , H01J2237/226 , H01J2237/25 , H01J2237/2802
Abstract: PROBLEM TO BE SOLVED: To provide a method and a device for crystal structure analysis by electron diffraction.SOLUTION: A method and a device for electron diffraction tomography of a crystal sample comprises the steps of: acquiring a series of electron diffraction patterns, in combination with a beam scanning protocol so that a beam converges at every discrete location 42 and 43 of a sample 38, by using scanning of the electron beam over a plurality of discrete locations of the sample; and acquiring a common intensity scaling factor, by using template matching to determine crystal orientations and thickness maps.
Abstract translation: 要解决的问题：提供通过电子衍射进行晶体结构分析的方法和装置。解决方案：晶体样品的电子衍射断层摄影的方法和装置包括以下步骤：组合获取一系列电子衍射图案 具有光束扫描协议，使得光束在样本38的每个离散位置42和43处会聚，通过在样本的多个离散位置上扫描电子束; 并通过使用模板匹配来确定晶体取向和厚度图来获取公共强度缩放因子。
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2.发明专利Method, system and program for improving characteristic peak signals in analytical electron microscopy 有权用于改进分析电子显微镜中特征峰信号的方法，系统和程序
公开(公告)号：JP2013228375A
公开(公告)日：2013-11-07
申请号：JP2013055678
申请日：2013-03-18
Applicant: Universidad De Barcelona , ユニベルシダード デ バルセロナ , Nanomegas Sprl , ナノメガス エスピーアールエル , AppFive LLC , アップファイブ エルエルシー
Inventor： SONIA ESTRADE ALBIOL , JOAQUIM PORTILLO SERRA , FRANCISCA PEIRO MARTINEZ , JOSE MANUEL REBLED CORSELLAS , LLUIS YEDRA CARDONA , STAVROS NICOLOPOULOS , KIM STEVEN , JON KARL WEISS
IPC: G01N23/225 , G01N23/04 , G01T1/36 , G21K5/04 , H01J37/05 , H01J37/147 , H01J37/22 , H01J37/244
CPC classification number: H01J49/44 , G01N23/2251 , G01N2223/051 , G01N2223/402 , H01J37/28 , H01J2237/1505 , H01J2237/1506 , H01J2237/1507 , H01J2237/2808
Abstract: PROBLEM TO BE SOLVED: To create improved compositional mapping of samples.SOLUTION: Disclosed is a method, system and program for improving characteristic peak signals in EELS measurement and EDS measurement of crystalline materials. A beam scanning protocol is applied which varies the inclination angle and/or the azimuth angle of the incident beam while spectroscopic data is acquired. The method and system may be applied to compositional mapping.
Abstract translation: 要解决的问题：创建改进的样品组成映射。解决方案：公开了一种用于改进EELS测量和结晶材料EDS测量中的特征峰值信号的方法，系统和程序。 应用光束扫描协议，其在获取光谱数据的同时改变入射光束的倾斜角和/或方位角。 该方法和系统可以应用于组合映射。
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公开(公告)号：US20230010573A1
公开(公告)日：2023-01-12
申请号：US17783869
申请日：2020-12-18
Applicant: Universidad Rey Juan Carlos , NANOMEGAS SPRL
Inventor： Jesus Gonzales Casablanca , Stavros Nicolopoulos
IPC: G01N23/046
Abstract: Devices and methods are described for performing high angle tilting tomography on samples in a liquid medium using transmission electron beam instruments.
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4.发明授权Method and system for improving characteristic peak signals in analytical electron microscopy 有权用于改善分析电子显微镜中特征峰信号的方法和系统公开(公告)号：US09406496B2
公开(公告)日：2016-08-02
申请号：US13681245
申请日：2012-11-19
Applicant: Universitat de Barcelona , Nanomegas SPRL , AppFive LLC
Inventor： Sonia Estrade Albiol , Joaquin Portillo Serra , Francisca Peiró Martinez , José Manuel Rebled Corsellas , Lluís Yedra Cardona , Stavros Nicolopoulos , Steven Kim , Jon Karl Weiss
IPC: G01N23/225 , H01J49/44 , H01J37/28
CPC classification number: H01J49/44 , G01N23/2251 , G01N2223/051 , G01N2223/402 , H01J37/28 , H01J2237/1505 , H01J2237/1506 , H01J2237/1507 , H01J2237/2808
Abstract: A method and system are disclosed for improving characteristic peak signals in electron energy loss spectroscopy (EELS) and energy dispersive x-ray spectroscopy (EDS) measurements of crystalline materials. A beam scanning protocol is applied which varies the inclination, azimuthal angle, or a combination thereof of the incident beam while spectroscopic data is acquired. The method and system may be applied to compositional mapping.
Abstract translation: 公开了用于改善电子能量损失光谱（EELS）中的特征峰值信号和结晶材料的能量色散X射线光谱（EDS）测量的方法和系统。 应用波束扫描协议，其在获取光谱数据的同时改变入射光束的倾斜度，方位角或其组合。 该方法和系统可以应用于组合映射。
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公开(公告)号：WO2021123305A
公开(公告)日：2021-06-24
申请号：PCT/EP2020/087220
申请日：2020-12-18
Inventor： CASABLANCA, Jesus Gonzalez , NICOLOPOULOS, Stavros
IPC: G01N23/2204 , H01J37/20 , G01N23/2251 , G01N23/046 , H01J37/28 , G01N2223/418 , H01J2237/2004 , H01J2237/2006 , H01J2237/2611 , H01J2237/2802
Abstract: Devices and methods are described for performing high angle tilting tomography on samples in a liquid medium using transmission electron beam instruments.
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Patent Agency Ranking6.发明申请METHODS AND DEVICES FOR HIGH THROUGHPUT CRYSTAL STRUCTURE ANALYSIS BY ELECTRON DIFFRACTION 审中-公开通过电子衍射进行高通量晶体结构分析的方法和装置
公开(公告)号：WO2010052289A1
公开(公告)日：2010-05-14
申请号：PCT/EP2009/064726
申请日：2009-11-06
Applicant: NanoMEGAS SPRL , INSTITUT POLYTECHNIQUE DE GRENOBLE , CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE , NICOLOPOULOS, Stavros , BULTREYS, Daniel , RAUCH, Edgard
Inventor： NICOLOPOULOS, Stavros , BULTREYS, Daniel , RAUCH, Edgard
CPC classification number: H01J37/28 , G01N23/20058 , H01J37/05 , H01J37/222 , H01J37/256 , H01J37/2955 , H01J2237/226 , H01J2237/25 , H01J2237/2802
Abstract: A method and device for electron diffraction tomography of a crystal sample, which employs scanning of the electron beam over a plurality of discrete locations of the sample, in combination with a beam scanning protocol as the beam converges at every discrete location (42, 43) of the sample (38) to obtain a series of electron diffraction patterns, use of template matching to determine crystal orientations and thickness maps to obtain a common intensity scaling factor.
Abstract translation: 一种晶体样品的电子衍射断层摄影的方法和装置，当束在每个离散位置（42,43）处会聚时，其结合光束扫描方案，在样本的多个离散位置上扫描电子束， 的样品（38）以获得一系列电子衍射图案，使用模板匹配来确定晶体取向和厚度图以获得共同的强度比例因子。
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公开(公告)号：US12099022B2
公开(公告)日：2024-09-24
申请号：US17783869
申请日：2020-12-18
Applicant: Universidad Rey Juan Carlos , NANOMEGAS SPRL
Inventor： Jesus Gonzalez Casablanca , Stavros Nicolopoulos
IPC: G01N23/04 , G01N23/046
CPC classification number: G01N23/046 , G01N2223/418
Abstract: Devices and methods are described for performing high angle tilting tomography on samples in a liquid medium using transmission electron beam instruments.
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8.发明申请METHOD AND SYSTEM FOR IMPROVING CHARACTERISTIC PEAK SIGNALS IN ANALYTICAL ELECTRON MICROSCOPY 有权改进分析电子显微镜特征峰信号的方法与系统公开(公告)号：US20130240728A1
公开(公告)日：2013-09-19
申请号：US13681245
申请日：2012-11-19
Applicant: UNIVERSITAT DE BARCELONA , NANOMEGAS SPRL , APPFIVE LLC
Inventor： Sonia Estrade Albiol , Joaquin Portillo Serra , Francisca Peiro Martinez , José Manuel Rebled Corsellas , Lluis Yedra Cardona , Stavros Nicolopoulos , Steven Kim , Jon Karl Weiss
IPC: H01J49/44
CPC classification number: H01J49/44 , G01N23/2251 , G01N2223/051 , G01N2223/402 , H01J37/28 , H01J2237/1505 , H01J2237/1506 , H01J2237/1507 , H01J2237/2808
Abstract: A method and system are disclosed for improving characteristic peak signals in electron energy loss spectroscopy (EELS) and energy dispersive x-ray spectroscopy (EDS) measurements of crystalline materials. A beam scanning protocol is applied which varies the inclination, azimuthal angle, or a combination thereof of the incident beam while spectroscopic data is acquired. The method and system may be applied to compositional mapping.
Abstract translation: 公开了一种用于改善电子能量损失谱（EELS）和结晶材料的能量色散X射线光谱（EDS）测量中的特征峰值信号的方法和系统。 应用波束扫描协议，其在获取光谱数据的同时改变入射光束的倾斜度，方位角或其组合。 该方法和系统可以应用于组合映射。
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公开(公告)号：DE60330067D1
公开(公告)日：2009-12-24
申请号：DE60330067
申请日：2003-09-02
Applicant: NANOMEGAS SPRL
IPC: H01J37/295 , G01N23/20
Abstract: A device and method which enable a transmission electron microscope to measure electron diffraction patterns of a sample very precisely are disclosed. The patterns are suitable for structure determination. The electron beam is precessed by means of deflector coils (6) in the transmission electron microscope before the sample (4), in combination with a similar precession of the electron diffraction pattern by means of deflector coils (9) situated after the sample. The electron diffraction pattern is scanned by means of deflector coils (9) situated after the sample.
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公开(公告)号：AT448561T
公开(公告)日：2009-11-15
申请号：AT03750478
申请日：2003-09-02
Applicant: NANOMEGAS SPRL
IPC: H01J37/295 , G01N23/20
Abstract: A device and method which enable a transmission electron microscope to measure electron diffraction patterns of a sample very precisely are disclosed. The patterns are suitable for structure determination. The electron beam is precessed by means of deflector coils (6) in the transmission electron microscope before the sample (4), in combination with a similar precession of the electron diffraction pattern by means of deflector coils (9) situated after the sample. The electron diffraction pattern is scanned by means of deflector coils (9) situated after the sample.
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