성막 방법, 반도체 장치의 제조 방법, 반도체 장치 및 성막장치
    4.
    发明公开
    성막 방법, 반도체 장치의 제조 방법, 반도체 장치 및 성막장치 失效
    沉积膜的工艺,制造半导体器件的工艺,用于沉积膜的半导体器件和系统

    公开(公告)号:KR1020060016814A

    公开(公告)日:2006-02-22

    申请号:KR1020057024111

    申请日:2004-04-27

    Abstract: A process for depositing a film on a substrate being processed placed in a processing container, comprising a first film deposition step repeating a first step for supplying a first material gas of organic metal compound containing no halogen element into the processing container and then removing the first material gas from the inside of the processing container and a second step for supplying a second material gas containing hydrogen or a hydrogen compound into the processing container and then removing the second material gas from the inside of the processing container, and a second film deposition step repeating a third step for supplying a third material gas of metal halide into the processing container and then removing the third material gas from the substrate being processed and a fourth step for supplying a fourth material gas containing hydrogen or a hydrogen compound into the processing container and then removing the fourth material gas from the inside of the processing container.

    Abstract translation: 一种用于在被处理的基板上沉积薄膜的方法,放置在处理容器中,包括第一薄膜沉积步骤,重复第一步骤,用于将不含卤素元素的有机金属化合物的第一原料气体供应到处理容器中, 从处理容器的内部的原料气体和向处理容器供给含有氢或氢化合物的第二原料气体,然后从处理容器的内部除去第二原料气体的第二工序,以及第二成膜工序 重复第三步骤,将金属卤化物的第三原料气体供应到处理容器中,然后从被处理的基板中除去第三原料气体;第四步骤,将含有氢或氢化合物的第四材料气体供应到处理容器中, 然后从处理配件的内部去除第四原料气体 TAINER。

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