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公开(公告)号:WO2013118937A1
公开(公告)日:2013-08-15
申请号:PCT/KR2012/002054
申请日:2012-03-22
IPC: H01L21/365
CPC classification number: H01L21/02554 , H01L21/02565 , H01L21/0262 , H01L29/7869
Abstract: 본 발명은 아연 및 주석 전구체를 사용하여 화학 기상 증착법(chemcal vapor deposition, CVD) 또는 원자층 증착법(atomic layer deposition, ALD)으로 아연주석 산화물 박막을 형성하는 방법 및 이를 이용한 TFT(thin film transistors) 소자 제조방법에 관한 것으로, 본 발명에 따른 아연주석 산화물 박막의 제조방법은 주석과 아연의 조성제어가 가능하며, 낮은 온도에서 공정이 가능하며, 삼차원 구조의 기재 상에서도 두께가 균일한 박막을 제조할 수 있고 제조된 주석 산화물은 높은 전계 효과 이동도(field effect mobility)를 가지고 있어 TFTs의 채널재료로 적용할 수 있다.
Abstract translation: 本发明涉及通过化学气相沉积(CVD)或原子层沉积(ALD)形成使用锌和锡前体的氧化锌锡薄膜的方法,以及制造薄膜晶体管(TFT)的方法, 元素使用该方法。 根据本发明的制造锌锡氧化物薄膜的方法能够在低温下控制和加工锡锌组合物。 根据本发明的方法,可以制造具有均匀厚度的薄膜,即使在具有三维结构的基底上。 这样制造的氧化锡具有高的场效应迁移率,并且可以用作TFT通道的材料。
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公开(公告)号:KR1020130091615A
公开(公告)日:2013-08-19
申请号:KR1020120013032
申请日:2012-02-08
Applicant: 한국화학연구원
IPC: H01L21/20 , H01L21/205 , H01L21/336 , H01L29/786
CPC classification number: H01L21/02554 , H01L21/02565 , H01L21/0262 , H01L29/7869 , H01L27/1225
Abstract: PURPOSE: A method for manufacturing a zinc tin oxide thin film is provided to form various zinc tin oxide thin films by controlling compositions. CONSTITUTION: A substrate is introduced into a deposition chamber. A zinc tin oxide thin film is manufactured by supplying tin, oxygen, and zinc. The zinc tin oxide thin film is manufactured by a chemical vapor deposition method or an atomic layer deposition method. The tin, the oxygen, and the zinc are supplied at the same time in the chemical vapor deposition method. The tin, the oxygen, and the zinc are alternatively supplied in the atomic layer deposition method.
Abstract translation: 目的:提供一种制造锌锡氧化物薄膜的方法,通过控制组合物形成各种氧化锌锡薄膜。 构成:将衬底引入沉积室。 通过供给锡,氧和锌来制造氧化锌锡薄膜。 氧化锌锡薄膜通过化学气相沉积法或原子层沉积法制造。 同时在化学气相沉积法中提供锡,氧和锌。 锡,氧和锌交替地以原子层沉积方法提供。
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公开(公告)号:KR1020120125102A
公开(公告)日:2012-11-14
申请号:KR1020110043189
申请日:2011-05-06
Applicant: 한국화학연구원
IPC: H01L21/205 , C23C16/06 , C23C16/44
CPC classification number: H01L21/28556 , H01L21/02175 , H01L21/324
Abstract: PURPOSE: A method for manufacturing a tin oxide thin film is provided to improve electrical characteristics by using a tin source in which fluorine pollution material is eliminated and to produce a thin film in which thickness is uniform. CONSTITUTION: A tin amino alkoxide is provided to an atomic layer deposition reactor. A tin chemical species is absorbed on a substrate. An oxygen source is provided to the atomic layer deposition reactor. An oxygen chemical species is absorbed on the substrate which absorbs the tin chemical species.
Abstract translation: 目的:提供一种制造氧化锡薄膜的方法,以通过使用消除氟污染物质的锡源和改善厚度均匀的薄膜来提高电气特性。 构成:将锡氨基醇盐提供给原子层沉积反应器。 锡化学物质被吸收在基材上。 向原子层沉积反应器提供氧源。 氧化学物质被吸收在吸收锡化学物质的基底上。
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公开(公告)号:KR1020100010998A
公开(公告)日:2010-02-03
申请号:KR1020080072021
申请日:2008-07-24
Applicant: 한국화학연구원
IPC: C23C16/455 , C23C16/00
Abstract: PURPOSE: A manufacturing method of a copper oxide thin film by an atomic layer deposition method is provided to perform a process even in the low temperature, and to easily control the thickness of a thin film. CONSTITUTION: A manufacturing method of a copper oxide thin film is as follows. Copper species are absorbed on a substrate by supplying aminoalkoxide of a chemical formula 1. Copper elements which are not reacted and reaction products are removed from an atomic layer deposition reactor. Oxygen elements are supplied to the atomic layer deposition reactor, and oxidation reaction is generated by absorbing oxygen species on the substrate that the copper elements are absorbed. Oxygen elements which are not reacted and reaction products are removed from the atomic layer deposition reactor.
Abstract translation: 目的:提供通过原子层沉积方法制造氧化铜薄膜的方法,即使在低温下进行处理也能够容易地控制薄膜的厚度。 构成:氧化铜薄膜的制造方法如下。 通过提供化学式1的氨基烷氧化物,将铜物质吸收在基材上。未反应的铜元素和反应产物从原子层沉积反应器中除去。 氧元素被提供给原子层沉积反应器,并且通过吸收铜元素被吸收在基底上的氧物质而产生氧化反应。 未反应的氧元素和反应产物从原子层沉积反应器中除去。
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公开(公告)号:KR101344856B1
公开(公告)日:2013-12-26
申请号:KR1020120013032
申请日:2012-02-08
Applicant: 한국화학연구원
IPC: H01L21/20 , H01L21/205 , H01L21/336 , H01L29/786
CPC classification number: H01L21/02554 , H01L21/02565 , H01L21/0262 , H01L29/7869
Abstract: 본발명은아연및 주석전구체를사용하여화학기상증착법(chemcal vapor deposition, CVD) 또는원자층증착법(atomic layer deposition, ALD)으로아연주석산화물박막을형성하는방법및 이를이용한 TFT(thin film transistors) 소자제조방법에관한것으로, 본발명에따른아연주석산화물박막의제조방법은주석과아연의조성제어가가능하며, 낮은온도에서공정이가능하며, 삼차원구조의기재상에서도두께가균일한박막을제조할수 있고제조된주석산화물은높은전계효과이동도(field effect mobility)를가지고있어 TFTs의채널재료로적용할수 있다.
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公开(公告)号:KR1020100025870A
公开(公告)日:2010-03-10
申请号:KR1020080084602
申请日:2008-08-28
Applicant: 한국화학연구원
IPC: C23C16/18 , C23C16/455
Abstract: PURPOSE: A method for manufacturing copper thin films using copper precursor by an atomic layer deposition process is provided to manufacture a thin film which has exact composition and has uniform thickness. CONSTITUTION: A method for manufacturing copper thin films using copper precursor by an atomic layer deposition process comprises following steps. The copper amino alkoxide is supplied to an atomic layer deposition reactor and copper chemical species are adsorbed on a substrate. Copper element and reaction by-products which do not react are eliminated from the reactor. Ligand is removed from the substrate by supplying hydrogen plasma to the reactor. The reaction by-product is eliminated from the reactor.
Abstract translation: 目的:提供一种通过原子层沉积工艺制造使用铜前体的铜薄膜的方法,以制造具有精确组成并具有均匀厚度的薄膜。 构成:通过原子层沉积工艺制造使用铜前体的铜薄膜的方法包括以下步骤。 将铜氨基醇盐供应到原子层沉积反应器中,并将铜化学物质吸附在基底上。 从反应器中除去铜元素和不反应的反应副产物。 通过向反应器供应氢等离子体,将配体从基板上除去。 反应副产物从反应器中排除。
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