Abstract:
An apparatus and method are provided for treating pollutants in a process effluent stream. The apparatus comprises an up-flow canister having a lower section plenum space (22), a section for a sorbent bed material (18), an upper section plenum space (24), and inlet (20) for introducing a process effluent stream to the lower section plenum space, and an outlet (26) for egress of the process effluent stream from the canister, the inlet, lower section plenum space, and sorbent bed material being arranged in a manner which provides for process effluent stream to flow into the sorbent bed against gravity, by a pressure differential.
Abstract:
A method and apparatus for abatement of effluent from a CVD process using a source reagent having a metal organic loosely bound to an organic or organometallic molecule such that upon exposure to heat (36) such bond is readily cleavable, e.g., copper deposition process involving the formation of films on a substrate (32) by metalorganic chemical vapor deposition (CVD) utilizing a precursor composition (16) for such film formation. The abatement process in specific embodiments facilitates high efficiency abatement of effluents from copper deposition processes utilizing Cu(hfac)TMVS as a copper source reagent (14).
Abstract:
An improved, non-plasma, static method for removing accumulated films and solid residues from interior surfaces of processing chambers used in thermal or plasma CVD treatment processes. The method includes introducing a reactive substance into a processing chamber while adjusting the pressure within the processing chamber to a predetermined level. The flow of the reactive substance into the processing chamber is terminated and the reactive substance is retained in the processing chamber to react with solid residues and form reaction products, following which the reaction products are subsequently removed from the processing chamber. Advantageously, terminating the flow of reactive substance into the processing chamber results in etching action that more effectively utilizes the cleaning agent and generates less hazardous materials.
Abstract:
A thermopile-based detector (20) for monitoring and/or controlling semiconductor processes, and a method of monitoring and/or controlling semiconductor processes using thermopile-based sensing of conditions in and/or affecting such processes.
Abstract:
Apparatus and method for abatement of effluent from multi-component metal oxides deposited by CVD processes using metal source reagent liquid solutions which comprise at least one metal coordination complex including a metal to which is coordinatively bound at least one ligand in a stable complex and a suitable solvent medium for that metal coordination complex e.g., a metalorganic chemical vapor deposition (MOCVD) process for forming barium strontium titanate (BST) thin films on substrates. The effluent is sorptively treated to remove precursor species and MOCVD process by-products for the effluent. An endpoint detector (62) such as a quartz microbalance detector may be employed to detect incipient breakthrough conditions in the sorptive treatment unit.
Abstract:
The present invention relates to a semiconductor processing system that employs infrared-based thermopile detector for process control, by analyzing a material of interest, based on absorption of infrared light at a characteristic wavelength by such material. In one embodiment, an infrared light beam is transmitted through a linear transmission path from an infrared light source through a sampling region containing material of interest into the thermopile detector. The linear transmission path reduces the risk of signal loss during transmission of the infrared light. The transmission path of the infrared light may comprise a highly smooth and reflective inner surface for minimizing such signal loss during transmission.
Abstract:
A GERMANE STORAGE AND DISPENSING SYSTEM (110), IN WHICH GERMANE GAS IS SORPTIVELY RETAINED ON AN ACTIVATED CARBON SORBENT MEDIUM (116) IN A VESSEL (112) CONTAINING ADSORBED AND FREE GERMANE GAS. THE ACTIVATED CARBON SORBENT MEDIUM IS DEFLAGRATION-RESISTANT IN RELATION TO THE GERMANE GAS ADSORBED THEREON, I.E., UNDER DEFLAGRATION CONDITIONS OF 65° C. AND 650 TORR, UNDER WHICH FREE GERMANE GAS UNDERGOES DEFLAGRATION, THE ACTIVATED CARBON SORBENT MEDIUM DOES NOT SUSTAIN DEFLAGRATION OF THE ADSORBED GERMANE GAS OR THERMALLY DESORB THE GERMANE GAS SO THAT IT UNDERGOES SUBSEQUENT DEFLAGRATION. THE DEFLAGRATION-RESISTANCE OF THE ACTIVATED CARBON SORBENT MEDIUM IS PROMOTED BY PRE-TREATMENT OF THE SORBENT MATERIAL TO REMOVE EXTRANEOUS SORBABLES THEREFROM AND BY MAINTAINING THE FILL LEVEL OF THE SORBENT MEDIUM IN THE GAS STORAGE AND DISPENSING VESSEL AT A SUBSTANTIAL VALUE, E.G., OF AT LEAST 30%.(FIG 5)
Abstract:
The present invention relates to a semiconductor processing system that employs infrared-based thermopile detector for process control, by analyzing a material of interest, based on absorption of infrared light at a characteristic wavelength by such material. In one embodiment, an infrared light beam is transmitted through a linear transmission path from an infrared light source through a sampling region containing material of interest into the thermopile detector. The linear transmission path reduces the risk of signal loss during transmission of the infrared light. The transmission path of the infrared light may comprise a highly smooth and reflective inner surface for minimizing such signal loss during transmission.
Abstract:
Apparatus and method for abatement of effluent from multi-component metal oxides deposited by CVD processes using metal source reagent liquid solutions which comprise at least one metal coordination complex including a metal to which is coordinatively bound at least one ligand in a stable complex and a suitable solvent medium for that metal coordination complex e.g., a metalorganic chemical vapor deposition (MOCVD) process for forming barium strontium titanate (BST) thin films on substrates. The effluent is sorptively treated to remove precursor species and MOCVD process by-products from the effluent. An endpoint detector such as a quartz microbalance detector may be employed to detect incipient breakthrough conditions in the sorptive treatment unit.