INFRARED THERMOPILE DETECTOR SYSTEM FOR SEMICONDUCTOR PROCESS MONITORING AND CONTROL

    公开(公告)号:AU2003276827A1

    公开(公告)日:2004-02-09

    申请号:AU2003276827

    申请日:2003-05-05

    Inventor: ARNO JOSE

    Abstract: The present invention relates to a semiconductor processing system that employs infrared-based thermopile detector for process control, by analyzing a material of interest, based on absorption of infrared light at a characteristic wavelength by such material. In one embodiment, an infrared light beam is transmitted through a linear transmission path from an infrared light source through a sampling region containing material of interest into the thermopile detector. The linear transmission path reduces the risk of signal loss during transmission of the infrared light. The transmission path of the infrared light may comprise a highly smooth and reflective inner surface for minimizing such signal loss during transmission.

    APPARATUS AND METHOD FOR INHIBITING DECOMPOSITION OF GERMANE

    公开(公告)号:MY131132A

    公开(公告)日:2007-07-31

    申请号:MYPI20034080

    申请日:2003-10-27

    Abstract: A GERMANE STORAGE AND DISPENSING SYSTEM (110), IN WHICH GERMANE GAS IS SORPTIVELY RETAINED ON AN ACTIVATED CARBON SORBENT MEDIUM (116) IN A VESSEL (112) CONTAINING ADSORBED AND FREE GERMANE GAS. THE ACTIVATED CARBON SORBENT MEDIUM IS DEFLAGRATION-RESISTANT IN RELATION TO THE GERMANE GAS ADSORBED THEREON, I.E., UNDER DEFLAGRATION CONDITIONS OF 65° C. AND 650 TORR, UNDER WHICH FREE GERMANE GAS UNDERGOES DEFLAGRATION, THE ACTIVATED CARBON SORBENT MEDIUM DOES NOT SUSTAIN DEFLAGRATION OF THE ADSORBED GERMANE GAS OR THERMALLY DESORB THE GERMANE GAS SO THAT IT UNDERGOES SUBSEQUENT DEFLAGRATION. THE DEFLAGRATION-RESISTANCE OF THE ACTIVATED CARBON SORBENT MEDIUM IS PROMOTED BY PRE-TREATMENT OF THE SORBENT MATERIAL TO REMOVE EXTRANEOUS SORBABLES THEREFROM AND BY MAINTAINING THE FILL LEVEL OF THE SORBENT MEDIUM IN THE GAS STORAGE AND DISPENSING VESSEL AT A SUBSTANTIAL VALUE, E.G., OF AT LEAST 30%.(FIG 5)

    Infrared thermopile detector system for semiconductor process monitoring and control

    公开(公告)号:AU2003276827A8

    公开(公告)日:2004-02-09

    申请号:AU2003276827

    申请日:2003-05-05

    Inventor: ARNO JOSE

    Abstract: The present invention relates to a semiconductor processing system that employs infrared-based thermopile detector for process control, by analyzing a material of interest, based on absorption of infrared light at a characteristic wavelength by such material. In one embodiment, an infrared light beam is transmitted through a linear transmission path from an infrared light source through a sampling region containing material of interest into the thermopile detector. The linear transmission path reduces the risk of signal loss during transmission of the infrared light. The transmission path of the infrared light may comprise a highly smooth and reflective inner surface for minimizing such signal loss during transmission.

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