公开(公告)号：WO2012021332A3

公开(公告)日：2012-04-12

申请号：PCT/US2011046239

申请日：2011-08-02

Applicant: ALTERA CORP ,  LI PENG ,  SHIMANOUCHI MASASHI ,  SHUMARAYEV SERGEY ,  DING WEIQI ,  NARAYAN SRIRAM ,  CHOW DANIEL TUN LAI ,  PAN MINGDE

Inventor： LI PENG ,  SHIMANOUCHI MASASHI ,  SHUMARAYEV SERGEY ,  DING WEIQI ,  NARAYAN SRIRAM ,  CHOW DANIEL TUN LAI ,  PAN MINGDE

IPC: G01R31/303

CPC classification number: G01R31/31709 ,  G01R31/3171 ,  G01R31/31716 ,  H04L7/0337

Abstract: An integrated circuit ("IC") may include circuitry for use in testing a serial data signal. The IC may include circuitry for transmitting the serial data signal with optional jitter, optional noise, and/or controllably variable drive strength. The IC may also include circuitry for receiving the serial data signal and performing a bit error rate ("BER") analysis in such a signal. The IC may provide output signals indicative of results of its operations. The IC can operate in various modes to perform or at least emulate functions of an oscilloscope, a bit error rate tester, etc., for testing signals and circuitry with respect to jitter-tolerance, noise-tolerance, etc.

Abstract translation: 集成电路（“IC”）可以包括用于测试串行数据信号的电路。 IC可以包括用于以可选的抖动，可选的噪声和/或可控地变化的驱动强度来发送串行数据信号的电路。 IC还可以包括用于接收串行数据信号并且在这种信号中执行误码率（“BER”）分析的电路。 IC可以提供指示其操作结果的输出信号。 IC可以以各种模式运行，以执行或至少模拟示波器，误码率测试仪等的功能，用于测试关于抖动容差，噪声容限等的信号和电路。

公开(公告)号：EP2603805A4

公开(公告)日：2016-10-19

申请号：EP11816812

申请日：2011-08-02

Applicant: ALTERA CORP

Inventor： LI PENG ,  SHIMANOUCHI MASASHI ,  SHUMARAYEV SERGEY ,  DING WEIQI ,  NARAYAN SRIRAM ,  CHOW DANIEL TUN LAI ,  PAN MINGDE

IPC: G01R31/303 ,  G01R31/317 ,  H04L7/033

CPC classification number: G01R31/31709 ,  G01R31/3171 ,  G01R31/31716 ,  H04L7/0337