Abstract:
PROBLEM TO BE SOLVED: To remove a deposit on an optical element such as a radiating condenser of an aligner. SOLUTION: In a method for cleaning a deposit of the radiating condenser; a collector assembly has a radiating condenser, a cover plate, and a support for connecting the radiating condenser to the cover plate. The cover plate is provided so as to cover the opening of a collector chamber 48. The opening may be large enough to allow the passage of the radiating condenser and the support. The radiating condenser is cleaned by different cleaning processing. This processing is performed by a cleaner. The cleaner may include a surrounding cover designed to form a storage capacity surrounding at least the radiating condenser, an inlet configured to supply at least one of cleaning gas and a cleaning solution to the storage capacity to clean at least the radiating condenser, and an outlet configured to remove at least one of the cleaning gas and the cleaning solution from the storage capacity. COPYRIGHT: (C)2007,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a projection system which realizes high positioning precision necessary for an EUV lithographic apparatus and does not need to cool a frame to which an optical element is fixed, and to perform predictive temperature compensation positioning control which is complicated and expensive. SOLUTION: In this lithographic projection apparatus, the projection system comprises a plurality of optical elements or sensors mounted on a frame. The frame is made of a glass ceramic material with a coefficient of thermal expansion of less than or approximately equal to 0.1×10 K thereby avoiding the need for expensive cooling system and/or predictive temperature compensation.
Abstract:
PROBLEM TO BE SOLVED: To suppress transmission of undesirable vibrations with respect to a lithography device and a device manufacturing method. SOLUTION: The lithography device includes a projection system configured to project an image on a substrate, a substrate table configured to support the substrate, a first chamber including the projection system, and a second chamber including the substrate table and first frame. The device includes a base frame configured so as to support the second chamber and an intermediate frame coupled to the base frame. The intermediate frame is configured to separate the first chamber and the second chamber. The device includes a support coupled to the first frame. The support is configured to support the first chamber through coupled openings that the intermediate frame and second chamber have. COPYRIGHT: (C)2010,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide lithography equipment which makes temperature stability of a projection system surer by active heat transport, while minimizing impact of mechanical vibration by the heat transport. SOLUTION: In the lithography projection equipment, the projection system comprises one or more optical operating mirrors, and a heat shield which shields heat emission to the mirrors and/or a supporting structure of the mirrors or from the mirrors and/or the supporting structure of the mirrors. Although the heat shield is cooled compulsorily, as the mirrors and the heat shield are supported separately by a supporting frame, vibration of the mirrors by forced cooling is reduced. Preferably, the heat shield includes a heat shield which shields heat emission to the mirrors or from the mirrors, and shields heat emission to heat shields and/or supporting structures for individual mirrors or from the heat shields and/or the supporting structures. COPYRIGHT: (C)2005,JPO&NCIPI
Abstract:
A lithographic apparatus includes a radiation system including a radiation source (SO) for the production of a radiation beam, and a contaminant trap (10,110) arranged in a path of the radiation beam. The contaminant trap includes a plurality of foils or plates defining channels which are arranged substantially parallel to the direction of propagation of said radiation beam. The foils or plates can be oriented substantially radially with respect to an optical axis of the radiation beam. The contaminant trap can be provided with a gas injector (12,112) which is configured to inject gas at least at two different positions directly into at least one of the channels of the contaminant trap.
Abstract:
A lithographic projection apparatus in which the projection system comprises a plurality of optical elements or sensors mounted on a frame. The frame is made of a glass ceramic material with a coefficient of thermal expansion of less than or approximately equal to 0.1 x 10 K thereby avoiding the need for expensive cooling systems and/or predictive temperature compensation.
Abstract:
A lithographic projection apparatus in which the projection system comprises a plurality of optical elements or sensors mounted on a frame. The frame is made of a glass ceramic material with a coefficient of thermal expansion of less than or approximately equal to 0.1 x 10 K thereby avoiding the need for expensive cooling systems and/or predictive temperature compensation.
Abstract:
A lithographic apparatus includes a radiation system including a radiation source (SO) for the production of a radiation beam, and a contaminant trap (10,110) arranged in a path of the radiation beam. The contaminant trap includes a plurality of foils or plates defining channels which are arranged substantially parallel to the direction of propagation of said radiation beam. The foils or plates can be oriented substantially radially with respect to an optical axis of the radiation beam. The contaminant trap can be provided with a gas injector (12,112) which is configured to inject gas at least at two different positions directly into at least one of the channels of the contaminant trap.
Abstract:
A lithographic projection apparatus contains a projection system for projecting a patterned beam onto a target portion of the substrate. The projection system contains one or more optically active mirrors (20) and heat shields (22,28,29) specifically located for intercepting heat radiation to or from the mirrors and/or their support structure (26). The heat shields are actively cooled and the mirrors and the heat shields and the mirrors are supported separately on a support frame to reduce vibration of the mirrors due to active cooling. The heat shields preferably include heat shields that intercept heat radiation to or from the support structure and/or respective heat shields for individual mirrors that intercept heat radiation to or from the mirrors.