Abstract:
PROBLEM TO BE SOLVED: To provide a lithographic projection apparatus which can reduce the consumption of purge gas. SOLUTION: In a purge system of the lithographic projection apparatus, a flow rate of the purge gas to the system is reduced substantially once a contamination level has fallen below a threshold level. The control is performed on the basis of a detected level of contamination or a timetable. COPYRIGHT: (C)2008,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a lithography projector capable of reducing the purge gas consumption. SOLUTION: In a purge gas system of a lithographic apparatus, the rate of flow of a purge gas to the system is reduced extremely when a contamination level falls to a threshold level or below. The control is made on the basis of a detected level of contamination or on the basis of a timetable. COPYRIGHT: (C)2005,JPO&NCIPI
Abstract:
A lithographic projection apparatus (1) comprising: a support structure for supporting patterning means, the patterning means serving to pattern the projection beam according to a desired patter. The apparatus has a substrate table (WT) for holding a substrate, a projection system (PL) for projecting the patterned beam onto a target portion of the substrate. The apparatus also has a purge gas supply system (100) for providing a purge gas near a surface of a component of the lithographic projection apparatus. The purge gas supply system comprises a purge gas mixture generator (120). The purge gas mixture generator (120) is arranged for generating a purge gas mixture which comprises at least one purging gas and a moisture. The purge gas mixture generator (120) has a moisturiser device arranged for adding the moisture to the purge gas and a purge gas mixture outlet (130-133) connected to the purge gas mixture generator for supplying the purge gas mixture near the surface.
Abstract:
In a purge gas system for a lithographic apparatus, a rate of flow of purge gas to the system is reduced substantially once a contamination level has fallen below a threshold level. The control may be on the basis of a detected level of contamination or on the basis of a timetable.