Microcalorimetry for X-ray spectroscopy
    1.
    发明公开
    Microcalorimetry for X-ray spectroscopy 有权
    用于X射线光谱学的微量热法

    公开(公告)号:EP2284524A2

    公开(公告)日:2011-02-16

    申请号:EP10171817.9

    申请日:2010-08-04

    Applicant: FEI Company

    CPC classification number: G01N23/20033 H01J37/244 H01J37/256 H01J2237/2442

    Abstract: An improved microcalorimeter-type energy dispersive x-ray spectrometer provides sufficient energy resolution and throughput for practical high spatial resolution x-ray mapping of a sample at low electron beam energies. When used with a dual beam system that provides the capability to etch a layer from the sample, the system can be used for three-dimensional x-ray mapping. A preferred system uses an x-ray optic having a wide-angle opening to increase the fraction of x-rays leaving the sample that impinge on the detector and multiple detectors to avoid pulse pile up.

    Abstract translation: 改进的微量热仪型能量色散x射线谱仪为低电子束能量下样品的实际高空间分辨率x射线映射提供足够的能量分辨率和通量。 当与双光束系统一起使用时,该系统可提供从样品中蚀刻一层的能力,该系统可用于三维X射线测绘。 一个优选的系统使用具有广角开口的X射线光学器件来增加离开样品的X射线的射入检测器和多个检测器的部分,以避免脉冲堆积。

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