-
公开(公告)号:GB2577234A
公开(公告)日:2020-03-18
申请号:GB202000045
申请日:2018-06-07
Applicant: IBM
Inventor: CHRISTOS VEZYRTZIS , PAWEL OWCZARCZYK
IPC: H03K5/15 , G01R31/317 , H03K3/037 , H03K5/19
Abstract: A system includes a set of delay circuits logically coupled in a chain configuration, a plurality of flip-flop circuits logically coupled to the delay output of the each of the delay circuits respectively, forming tiers of flip-flop circuits, a clock circuit logically coupled to each of the tiers of flip-flop circuits respectively, and where the plurality of flip-flop circuits is logically configured, in response to a delay input of a first delay circuit in the set of delay circuits receiving an output from a programmable delay circuit and in response to receiving skewed clock signals from the clock circuits, to indicate how far within the plurality of flip-flop circuits an edge signal transmitted from the delay output of the each of the delay circuits propagated, respectively.
-
公开(公告)号:GB2632957A
公开(公告)日:2025-02-26
申请号:GB202416053
申请日:2023-01-17
Applicant: IBM
Inventor: ADAM COLLURA , MICHAEL ROMAIN , WILLIAM HUOTT , PAWEL OWCZARCZYK , CHRISTIAN JACOBI , ANTHONY SAPORITO , CHUNG-LUNG SHUM , ALPER BUYUKTOSUNOGLU , TOBIAS WEBEL , MICHAEL CADIGAN JR , PAUL LOGSDON , SEAN CAREY , KARL ANDERSON , MARK CICHANOWSKI , STEFAN PAYER
Abstract: The method and systems described herein provide for identifying and mitigating undesirable power or voltage fluctuations in regions of a semiconductor device. The method includes detecting a region, such as an individual processor, of a processor chip exhibiting a reduced power draw and a resulting localized voltage spike (e.g., a spike that exceeds Vmax) that would accelerate overall device end-of-life. The described systems respond by activating circuits or current generators located in the given region to draw additional power via a protective current. The protective current lowers the local voltage spikes back to within some pre-specified range. The resulting reduction in the time above Vmax in testing reduces the number of devices that will need to be discarded due to Vmax violations as well as increases the expected reliability and lifespan of the device in operation.
-
公开(公告)号:GB2577234B
公开(公告)日:2020-08-05
申请号:GB202000045
申请日:2018-06-07
Applicant: IBM
Inventor: CHRISTOS VEZYRTZIS , PAWEL OWCZARCZYK
IPC: H03K5/15 , G01R31/317 , H03K3/037 , H03K5/19
-
-