ELECTROLYTIC METHOD FOR ETCHBACK OF SEALED COPPER-INVAR-COPPER STRUCTURE

    公开(公告)号:JPH04309289A

    公开(公告)日:1992-10-30

    申请号:JP33464791

    申请日:1991-12-18

    Applicant: IBM

    Abstract: PURPOSE: To provide a method for manufacturing a microelectronic package, having at least one layer formed of copper-Invar-copper core sealed between a pair of dielectric films. CONSTITUTION: A method includes a step of exposing the copper-Invar-copper surface of a copper-Invar-copper core, for instance, a step of exposing the inner copper-Invar-copper by exposing the circumference of the copper-Invar-copper core or by making a hole that penetrates a layer. Then, the copper-Invar-copper is formed, namely, back-etched. Such step is an electrolytic process, wherein a package is impregnated with an electrolytic solution which is substantially neutral in pH, including a counter electrode. The electrolytic solution wets the exposed surface of the copper-Invar-copper core. The exposed surface of the copper-Invar-copper core is made anode with respect to the counter electrode, and a voltage is applied in between. As a result, the copper-Invar-copper surface is electrochemically etched and formed.

Patent Agency Ranking