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公开(公告)号:CA1252918A
公开(公告)日:1989-04-18
申请号:CA499457
申请日:1986-01-13
Applicant: IBM
Inventor: GIMZEWSKI JAMES K , POHL WOLFGANG D
IPC: H01J37/28 , B81B3/00 , G01B7/34 , G01N23/00 , G01N27/00 , G01Q10/04 , G01Q30/04 , G01Q30/18 , G01Q30/20 , G01Q60/10 , G01Q60/16 , G01Q70/02 , G01Q70/06 , G01Q70/18 , H01J37/20 , H04R19/00 , G01B7/28
Abstract: Scanning Tunneling Microscope This scanning tunneling microscope consists of a semiconductor chip (7) into which slots are etched to form a central portion (1) linked by a first pair of stripes (2, 3) to an intermediate portion (4) which in turn is linked by a second pair of stripes (5, 6) to the main body of the chip (7). The pairs of stripes (2, 3; 5, 6) have mutually orthogonal directions to allow the center portion (1) to perform movements in x- and y-direc-tions under the control of electrostatic forces created between the stripes (2, 3; 5, 6) and their opposite walls. The center portion (1) has formed into it at least one tongue (17) carrying an integrated, protuding tunnel tip (18) which is capable of being moved in z-direction by means of electrostatic forces between said tongue (17) and the bottom of a cavity below the tongue (17).
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公开(公告)号:CA2170860A1
公开(公告)日:1995-04-13
申请号:CA2170860
申请日:1993-10-04
Applicant: IBM
Inventor: HECHT BERT , HEINZELMANN HARALD , NOVOTNY LUKAS , POHL WOLFGANG D
Abstract: The invention relates to a near-field optical microscope, in particular to a scanning near-field optical microscope (SNOM), comprising means for determining the intensity of light emerging from the near-field at a direction differing from the direction perpendicular to the surface of the sample to be examined, preferably emerging at an angle .theta. larger than the critical angle. Superposing light with different azimuth angles ? by using suitable positioned mirrors and beamsplitters enables imaging with higher contrast. The invention allows an accurate control of the distance between the probing tip of the SNOM and the sample by using the measured intensity in a feedback loop.
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公开(公告)号:BR8704432A
公开(公告)日:1988-05-24
申请号:BR8704432
申请日:1987-08-27
Applicant: IBM
Inventor: DUERIG URS THEODOR , GIMZEWSKI JAMES K , GRESCHNER JOHANN , POHL WOLFGANG D , WOLTER OLAF
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公开(公告)号:CA1305872C
公开(公告)日:1992-08-04
申请号:CA548420
申请日:1987-10-01
Applicant: IBM
Inventor: DUERIG URS T , GIMZEWSKI JAMES K , GRESCHNER JOHANN , POHL WOLFGANG D , WOLTER OLAF
IPC: G01B7/34 , G01B7/00 , G01B21/30 , G01D5/04 , G01L1/00 , G01L1/04 , G01N13/00 , G01N23/00 , G01N37/00 , G01Q20/04 , G01Q40/00 , G01Q60/38 , G01Q70/14 , H01J37/26 , H01J37/28
Abstract: The micromechanical sensor head is designed to measure forces down to 10-13 N. It comprises a common base from which a cantilever beam and a beam member extend in parallel. The cantilever beam carries a sharply pointed tip of a hard material, dielectric or not, for interaction with the surface of a sample to be investigated. Bulges forming a tunneling junction protrude from facing surfaces of said beams, the gap between said bulges being adjustable by means of electrostatic forces generated by a potential (Vd) applied to a pair of electrodes respectively coated onto parallel surfaces of said beams. The sensor head consists of one single piece of semiconductor material, such as silicon or gallium arsenide (or any other compounds thereof) which is fabricated to the dimensions required for the application by means of conventional semiconductor chip manufacturing techniques. SZ9-86-002
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公开(公告)号:CA1283733C
公开(公告)日:1991-04-30
申请号:CA534217
申请日:1987-04-08
Applicant: IBM
Inventor: POHL WOLFGANG D , DUERIG URS T , GIMZEWSKI JAMES K
IPC: G01B7/34 , G01B21/30 , G01Q20/04 , G01Q80/00 , G11B9/00 , G11B9/08 , G11B9/14 , G11B17/34 , G11B19/20 , G11B21/00 , G11B25/04
Abstract: Direct Access Storage Unit The storage unit comprises an array of tunnel tips (13) arranged at tunneling distance from a storage medium (2) which is capable of permitting digital information to be written or read through variations of the tunneling current. Each tunnel tip (13) is supported on its own cantilever beam (12) extending across a cavity (14) formed in a common substrate (15). Each cantilever beam (12) as well as the bottom of each cavity (14) are covered with an electrically conducting layer (16, 18) enabling the distance between each one of the tunnel tips (13) and the surface of the storage medium (2) to be electrostatically controlled. The storage medium (2) is attached to the free end of a piezoceramic bender, the end in operation performing a circular motion so that each tunnel tip (13) scans its associated area of the storage medium (2) along a circular track.
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公开(公告)号:CA1308574C
公开(公告)日:1992-10-13
申请号:CA565614
申请日:1988-04-29
Applicant: IBM
Inventor: BINNIG GERD K , DUERIG URS T , POHL WOLFGANG D , ROHRER HEINRICH , GIMZEWSKI JAMES K
IPC: G01B7/34 , G01B11/30 , G01B21/30 , G01D5/26 , G01L1/08 , G01N23/00 , G01N37/00 , G01Q20/02 , G01Q60/38 , G01R33/038 , G11B9/00 , G11B9/14 , G11B11/00 , G11B11/10 , G11B17/32 , G01L1/14
Abstract: SZ 9-86-004 The atomic force sensor head comprises a cantilever beam (50) forming an integral part of a body (53) from which it extends such that it has a free end to carry a member (55) for interaction with a surface to be investigated. As said member (55) is brought close to said surface, atomic forces will cause a deflection of said cantilever (50). This deflection is translated into a variation of an electrical value, such as a capacitance. A capacitor (57) is formed by a pairof electrodes (51, 52) coated onto the cantilever beam (50) and said body (53), respectively. The deflection of said cantilever beam (50) causes a variation of the distance (s) between said electrodes (51, 52) and, hence, of the capacitance. An improvement of the sensitivity and stability of this arrangement is made possible by filling the gap between the said electrodes (51, 52) with materials (54, 56) having different dielectric constants and different thicknesses. With arelation of 1:10 of the dielectric constants and a thickness relation of 1:5, animprovement factor of about 40 can be obtained.
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7.
公开(公告)号:CA1290054C
公开(公告)日:1991-10-01
申请号:CA519019
申请日:1986-09-24
Applicant: IBM
Inventor: POHL WOLFGANG D , GIMZEWSKI JAMES K , MURALT PAUL R
Abstract: SZ 9-85-01C Method and Apparatus for Controlling the Flying Height of the Head in a Magnetic Storage Unit The method involves the steps of lowering the magnetic head (8) to within aerodynamic distance from the surface (16) of a moving recording medium, enforced further lowering of the head (8) until a tunnel current occurs across the gap between head (8) and surface (16), and maintaining said tunnel current constant by using the deviations of the current from a predetermined value (which corresponds to a certain flying height). The apparatus comprises a tunnel electrode (9) forming an integral part of the head assembly which is attached to a distance control mechanism (5) permitting the positioning of the head assembly with a one-nanometer accuracy. The tunnel electrode (9) has a very slightly beveled shoulder (45, 47) ensuring early detection of asperities approaching the head while sitting on the surface (16) of the moving recording medium (3). Gradation of the potential between tunnel electrode (9) and surface (16) of the recording medium (3) is used to enhance the response to asperities.
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公开(公告)号:CA1249467A
公开(公告)日:1989-01-31
申请号:CA442487
申请日:1983-12-02
Applicant: IBM
Inventor: BEDNORZ JOHANNES G , DENK WINFRIED , LANZ MARTIN , POHL WOLFGANG D
IPC: G02B6/00 , G01Q80/00 , G01Q90/00 , G02B6/02 , G02B27/00 , G11B7/08 , G11B7/135 , G11B7/22 , H01S5/10 , G11B7/12 , H01S3/06
Abstract: LIGHT WAVEGUIDE WITH A SUBMICRON APERTURE, METHOD FOR MANUFACTURING THE WAVEGUIDE AND APPLICATION OF THE WAVEGUIDE IN AN OPTICAL MEMORY The light waveguide consists of an optically transparent body at one end cut to a sharp tip and polished optically flat at the other. A metallization on its surface is thick enough to be opaque. By pressing the waveguide against a rigid plate, the metallization is plastically deformed so as to expose a tiny aperture at the tip of the body through which light can pass. By carefully controlling the deformation of the metallization, the diameter of the aperture can be kept between 10 and 500 nm. The application of the aperture when incorporated in the semiconductor laser of the read/write head of an optical storage device is described.
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9.
公开(公告)号:CA1332761C
公开(公告)日:1994-10-25
申请号:CA613500
申请日:1989-09-27
Applicant: IBM
Inventor: POHL WOLFGANG D , SCHNEIKER CONRAD W
IPC: G01Q10/00 , G01Q70/06 , G02B21/00 , G11B5/00 , G11B5/012 , G11B9/00 , G11B9/08 , G11B9/14 , G11B21/21 , H01L27/20
Abstract: This distance-controlled tunneling transducer (1) comprises a plurality of sharply pointed tips (2) arranged in an array at tunneling distance from the electrically conductive surface (6) of a storage medium (7). Each tip (2) is attached to a cantilever beam (3) permitting the distance between each tip (2) and the surface (6) to be individually pre-adjusted by electrostatic means (8, 9). Arranged in juxtaposition with each cantilever beam (3) is a simple active control circuit (12, 13, 16) for adjusting the tip/surface distance during operation of the storage unit thus preventing crashes of the associated tip (2) into possible asperities on the surface (6) of the recording medium (7). Each control circuit (12, 13, 16) is designed such that its operating voltage, at thesame time, serves to pre-adjust its associated cantilever beam (3) and to maintain the gap width essentially constant.
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公开(公告)号:CA1330452C
公开(公告)日:1994-06-28
申请号:CA565615
申请日:1988-04-29
Applicant: IBM
Inventor: POHL WOLFGANG D
IPC: G01B7/34 , G01B21/30 , G01L1/08 , G01L1/16 , G01N23/00 , G01N37/00 , G01Q10/06 , G01Q20/04 , G01Q60/32 , G01Q60/38 , H01J37/26
Abstract: This atomic force microscope comprises a pointed tip (1) mounted on top of an oscillating crystal (2) which is translatable In xyz-directions by a conventional xyz-drive (4). A potential applied to a pair of electrodes (5, 6) coated on opposite faces of said crystal (2) causes the latter to oscillate with its resonance frequency. As the tip (1) is approached to a surface to be investigated, the frequency of oscillation of the crystal deviates from its original frequency. This deviation can be used in a feedback loop to control thedistance in z-direction of the tip (1) from the surface being investigated and to plot an image of the contour of each scan performed by the tip (1) across the surface.
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