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公开(公告)号:JP2004012551A
公开(公告)日:2004-01-15
申请号:JP2002162110
申请日:2002-06-03
Inventor: NISHIMURA YUKIO , NISHIMURA ISAO , ITO HIROSHI , TOMAS I WOROU , VARANASI PUSHKARA RAO
IPC: G03F7/039 , C08F220/10 , C08F232/00 , H01L21/027
Abstract: PROBLEM TO BE SOLVED: To provide a radiation-sensitive resin composition having high transparency to a radiation, excellent in basic properties as a resist, such as sensitivity, resolution, dry etching resistance and pattern shape and suitable for use as a chemically amplified resist. SOLUTION: The radiation-sensitive resin composition comprises (A) a resin which contains a repeating unit derived from α-perfluoroalkylacrylic esters typified by t-butyl α-trifluoromethylacrylate and a repeating unit derived from a norbornene compound typified by 5-ä2-hydroxy-2, 2-di(trifluoromethyl)ethyl}bicyclo[2.2.1]hept-2-ene or a compound of formula 7 as essential units and becomes alkali-soluble by the action of an acid and (B) a radiation-sensitive acid generator. COPYRIGHT: (C)2004,JPO
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公开(公告)号:JP2004029089A
公开(公告)日:2004-01-29
申请号:JP2002181130
申请日:2002-06-21
Applicant: Internatl Business Mach Corp
, Jsr Corp , Jsr株式会社 , インターナショナル・ビジネス・マシーンズ・コーポレーションInternational Business Maschines Corporation Inventor: NISHIMURA YUKIO , NISHIMURA ISAO , SAITO AKIO , KOBAYASHI HIDEKAZU , TOMAS I WOROU , ALLEN ROBERT D , VARANASI PUSHKARA RAO
IPC: G03F7/039 , H01L21/027
Abstract: PROBLEM TO BE SOLVED: To provide a radiation-sensitive resin composition having high transparency to a radiation and suitable for use as a chemically sensitized resist excellent in basic properties as a resist, such as sensitivity, resolution, dry etching resistance and pattern shape. SOLUTION: The radiation-sensitive resin composition comprises (A) an acid-dissociating group-containing resin containing a (meth)acrylic ester repeating unit typified by a unit derived from 2-ethyladamantan-2-yl ester or 1-methylcyclopentyl ester of (meth)acrylic acid and a repeating unit having a norbornane skeleton in the backbone typified by a unit derived from 1-methylcyclopentyl ester or (2-ethyladamantan-2-yl) ester of a bicyclo[2,2,1]hept-2-ene-5-carboxylic acid and not containing a repeating unit derived from maleic anhydride and (B) a radiation-sensitive acid generator. COPYRIGHT: (C)2004,JPO
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公开(公告)号:JP2003255539A
公开(公告)日:2003-09-10
申请号:JP2002056522
申请日:2002-03-01
Inventor: NISHIMURA YUKIO , ISHII HIROYUKI , KOBAYASHI HIDEKAZU , TOMAS I WOROU , ALLEN ROBERT D , VARANASI PUSHKARA RAO
IPC: G03F7/039 , C08F220/18 , C08F220/28 , H01L21/027
Abstract: PROBLEM TO BE SOLVED: To provide a radiation-sensitive resin composition having high transparency to a radiation and suitable for use as a chemically amplified resist excellent in basic performances as a resist, such as sensitivity, resolution, dry etching resistance and pattern shape. SOLUTION: The radiation-sensitive resin composition comprises (A) an alkali-insoluble or slightly alkali-soluble resin which has a repeating unit represented by formula (1-1) (where R 1 is H or methyl) and a (meth)acrylic repeating unit typified by 2-ethyl-2-adamantyl (meth)acrylate, 2-norbornyl-2-(meth) acryloyloxypropane or 1-methylcyclopentyl (meth)acrylate as essential units and becomes alkali-soluble under the action of an acid and (B) a radiation- sensitive acid generator. COPYRIGHT: (C)2003,JPO
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公开(公告)号:JP2003248313A
公开(公告)日:2003-09-05
申请号:JP2002046974
申请日:2002-02-22
Inventor: NISHIMURA YUKIO , ISHII HIROYUKI , KATAOKA ATSUKO , TOMAS I WOROU , ALLEN ROBERT D , VARANASI PUSHKARA RAO
IPC: G03F7/039 , C08F222/06 , C08F232/08 , H01L21/027
Abstract: PROBLEM TO BE SOLVED: To provide a new radiation-sensitive resin composition having high transparency to a radiation, excellent in basic physical properties as a resist, such as sensitivity, resolution, pattern shape and adhesion to a substrate, causing no development defect in microfabrication and capable of producing semiconductor devices in a high yield. SOLUTION: The radiation-sensitive resin composition comprises (A) an acid-dissociable group-containing resin having a repeating unit represented by formula (I) and a repeating unit represented by formula (II) and (B) a radiation-sensitive acid generator. In the formula (I), X is methylene or carbonyl; R 1 and R 2 are each H, a 1-4C alkyl, a monovalent O-containing polar group or a monovalent N-containing polar group; R 3 is H, a 1-6C alkyl, a 1-6C alkoxyl or a 2-7C alkoxycarbonyl; and n is an integer of 0-2. COPYRIGHT: (C)2003,JPO
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公开(公告)号:JP2000298350A
公开(公告)日:2000-10-24
申请号:JP2000065165
申请日:2000-03-09
Applicant: IBM
Inventor: VARANASI PUSHKARA RAO , ALLEN ROBERT D , TOMAS I WOROU , JULIAN OPITZ , DEPIETRO RICHARD A , MARGARET C LAWSON , ANN MARIE MYUUHAATAA , JOSEPH F MANISCALCO , MAHAMUUDO EMU HOJISUTE , JORDHAMO GEORGE M , ITO HIROSHI
IPC: C08F232/00 , C08K5/00 , C08L45/00 , G03F7/004 , G03F7/039 , G03F7/11 , G03F7/38 , G03F7/40 , H01L21/027
Abstract: PROBLEM TO BE SOLVED: To obtain a photoresist composition using an acid as a catalyst, capable of forming an image with radiation of 193 nm and capable of forming a photoresist structure having high resolution and high etching resistance by development. SOLUTION: The photoresist composition comprises a combination of a cyclic olefin polymer, a photosensitive acid-generating agent and a substantially transparent bulky hydrophobic additive. The cyclic olefin polymer contains a cyclic olefin unit having a polar functional group which promotes dissolution in an aqueous alkali solution and the cyclic olefin unit having an acid-labile group which inhibits the dissolution in the aqueous alkali solution. The hydrophobic additive is selected from the group comprising a saturated steroid compound, a non-steroid cycloaliphatic compound and a non-steroid polycycloaliphatic compound having an acid-labile bond.
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