公开(公告)号：GB2595160A

公开(公告)日：2021-11-17

申请号：GB202111646

申请日：2020-02-24

Applicant: IBM

Inventor： RUILONG XIE ,  JULIEN FROUGIER ,  CHANRO PARK ,  EDWARD NOWAK ,  YI QI ,  KANGGUO CHENG ,  NICOLAS LOUBET

IPC: H01L21/02 ,  H01L29/786

Abstract: A technique for providing an novel field effect transistor (FET) architecture that includes a center fin region and one or more vertically stacked nanosheets. A non-planar channel region is formed having a first semiconductor layer (208), a second semiconductor layer (206), and a fin-shaped bridge layer between the first semiconductor layer (208) and the second semiconductor layer (206). Forming the non-planar channel region can include forming a nanosheet stack over a substrate (204), forming a trench (502) by removing a portion of the nanosheet stack, and forming a third semiconductor layer (602) in the trench (502). Outer surfaces of the first semiconductor layer (208), the second semiconductor layer (206), and the fin-shaped bridge region define an effective channel width of the non-planar channel region.

公开(公告)号：GB2595125A

公开(公告)日：2021-11-17

申请号：GB202111358

申请日：2020-02-24

Applicant: IBM

Inventor： RUILONG XIE ,  JULIEN FROUGIER ,  CHANRO PARK ,  EDWARD NOWAK ,  YI QI ,  KANGGUO CHENG ,  NICOLAS JEAN LOUBET

IPC: H01L29/41

Abstract: Embodiments of the present invention are directed to techniques for providing an novel field effect transistor (FET)architecture that includes a center fin region and one or more vertically stacked nanosheets.In a non-limiting embodiment of the invention, a nanosheet stack is formed over a substrate.The nanosheet stack can include one or more first semiconductor layers and one or more first sacrificial layers.A trench is formed by removing a portion of the one or more first semiconductor layers and the one or more first sacrificial layers.The trench exposes a surface of a bottommost sacrificial layer of the one or more first sacrificial layers.The trench can be filled with one or more second semiconductor layers and one or more second sacrificial layers such that each of the one or more second semiconductor layers is in contact with a sidewall of one of the one or more first semiconductor layers.

公开(公告)号：GB2595125B

公开(公告)日：2022-11-09

申请号：GB202111358

申请日：2020-02-24

Applicant: IBM

Inventor： RUILONG XIE ,  JULIEN FROUGIER ,  CHANRO PARK ,  EDWARD NOWAK ,  YI QI ,  KANGGUO CHENG ,  NICOLAS JEAN LOUBET

IPC: H01L29/41

Abstract: Embodiments of the present invention are directed to techniques for providing an novel field effect transistor (FET) architecture that includes a center fin region and one or more vertically stacked nanosheets. In a non-limiting embodiment of the invention, a nanosheet stack is formed over a substrate. The nanosheet stack can include one or more first semiconductor layers and one or more first sacrificial layers. A trench is formed by removing a portion of the one or more first semiconductor layers and the one or more first sacrificial layers. The trench exposes a surface of a bottommost sacrificial layer of the one or more first sacrificial layers. The trench can be filled with one or more second semiconductor layers and one or more second sacrificial layers such that each of the one or more second semiconductor layers is in contact with a sidewall of one of the one or more first semiconductor layers.