公开(公告)号：AU2002357054A1

公开(公告)日：2003-06-10

申请号：AU2002357054

申请日：2002-11-27

Applicant: IBM

Inventor： KIM HYUNGJUN ,  MCFEELY FENTON ,  NARAYANAN VIJAY ,  RODBELL KENNETH ,  YURKAS JOHN ,  AMOS RICKY ,  BUCHANAN DOUGLAS ,  CABRAL CYRIL JR ,  CALLEGARI ALESSANDRO ,  GUHA SUPRATIK

IPC: H01L21/28 ,  H01L21/285 ,  H01L21/30 ,  H01L21/336 ,  H01L29/423 ,  H01L29/49 ,  H01L29/78 ,  H01L29/786 ,  H01L29/76

Abstract: A method for fabricating a CMOS gate electrode by using Re, Rh, Pt, Ir or Ru metal and a CMOS structure that contains such gate electrodes are described. The work functions of these metals make them compatible with current pFET requirements. For instance, the metal can withstand the high hydrogen pressures necessary to produce properly passivated interfaces without undergoing chemical changes. The thermal stability of the metal on dielectric layers such as SiO2, Al2O3 and other suitable dielectric materials makes it compatible with post-processing temperatures up to 1000° C. A low temperature/low pressure CVD technique with Re2(CO)10 as the source material is used when Re is to be deposited.