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公开(公告)号：JP2002122631A
公开(公告)日：2002-04-26
申请号：JP2001146921
申请日：2001-05-16
Applicant: INFINEON TECHNOLOGIES AG
Inventor： HAAS HERMANN , LUPKE JENS
Abstract: PROBLEM TO BE SOLVED: To provide a component holder for facilitating the handling extremely troublesome mechanically and electrically when mounting a component to be tested onto a test device. SOLUTION: This component holder for testing the electronic component has a carrier 4; at least one component socket 5 having a group of component contacts 6 for retaining and contacting with the component, disposed on the carrier 4; and at least one group of adapter contacts connected to the component contacts 6, disposed in previously decided standard arrangement on the carrier 4. Thereby, a mounting change of the component is not required during the test.
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公开(公告)号：DE102006010944A1
公开(公告)日：2007-09-13
申请号：DE102006010944
申请日：2006-03-09
Applicant: INFINEON TECHNOLOGIES AG
Inventor： PROELL MANFRED , SCHROEDER STEPHAN , RUF WOLFGANG , HAAS HERMANN
Abstract: An integrated device comprises a functional circuit, a test circuit for testing the functional circuit and for providing an error data item and a register element for storing the error data item and for outputting the error data item at an error data output of the integrated device responsive to an output signal. The register element is connected to a data input of the integrated device in order to accept a data item, which is applied to the data input, responsive to the output signal.
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公开(公告)号：DE10130976C2
公开(公告)日：2003-06-12
申请号：DE10130976
申请日：2001-06-27
Applicant: INFINEON TECHNOLOGIES AG
Inventor： HAAS HERMANN
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公开(公告)号：DE10024875A1
公开(公告)日：2001-11-29
申请号：DE10024875
申请日：2000-05-16
Applicant: INFINEON TECHNOLOGIES AG
Inventor： HAAS HERMANN , LUEPKE JENS
Abstract: A component holder for testing electronic components having a carrier, at least one component socket arranged on the carrier and having a group of component contacts to accommodate and make contact with a component, and at least one group of adapter contacts, which are arranged in a predefined standard arrangement on the carrier and are connected to the component contacts.
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Patent Agency Ranking
公开(公告)号：DE102006051591B3
公开(公告)日：2008-04-30
申请号：DE102006051591
申请日：2006-11-02
Applicant: INFINEON TECHNOLOGIES AG
Inventor： KLIEWER JOERG , PROELL MANFRED , SCHROEDER STEFAN , EGGERS GEORG , RUF WOLFGANG , HAAS HERMANN
IPC: G11C29/48 , G11C7/10 , G11C11/4093
Abstract: The method involves determining that all data outputs (20) of memory chips (12) lie close to a logical zero, if a signal level at a selected data input (18) of a testing device (10) falls below a preset threshold level. The chips are connected with the selected data input of the testing device, and another determination is made that the data outputs of the chips lie close to a logical one, if the signal level at the input of the testing device exceeds the preset threshold level. An independent claim is also included for a testing device for testing a memory chip comprising data outputs and data inputs.
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公开(公告)号：DE102006020098A1
公开(公告)日：2007-10-31
申请号：DE102006020098
申请日：2006-04-29
Applicant: INFINEON TECHNOLOGIES AG
Inventor： PROELL MANFRED , SCHROEDER STEPHAN , RUF WOLFGANG , HAAS HERMANN
IPC: G11C11/406
Abstract: The circuit has a memory cell area (2) with dynamic memory cells (3) that are arranged in word lines (5) and bit lines (6), and a sampling unit (20) provided for making selection information available. A recreation circuit (10) recreates the memory cells based on the selection information, where the sampling unit has a condition memory to store the selection information. A word line decoder (7) selects one of the word lines depending on an address information, where the circuit has an address transmitter that provides the address information for addressing each of the word lines. An independent claim is also included for a method for recreating dynamic memory cells in a memory cell field.
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公开(公告)号：DE10130976A1
公开(公告)日：2003-01-23
申请号：DE10130976
申请日：2001-06-27
Applicant: INFINEON TECHNOLOGIES AG
Inventor： HAAS HERMANN
Abstract: A needle card for contacting integrated circuits has several needle settings which are each designed for contacting one integrated circuit on the substrate wafer. The region of the needle settings on the needle card mainly has the size of the whole region of the integrated circuits to be contacted on the wafer, and the needle settings are arranged distributed mainly over the whole needle card to contact all integrated circuits in succession by multiple lateral positioning processes of the needle card on the wafer, and in which with each positioning process of the needle card, each needle setting contacts on of the integrated circuits. An Independent claim is given for a method for arranging the needle settings on the needle card.
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公开(公告)号：DE102004031386A1
公开(公告)日：2006-02-02
申请号：DE102004031386
申请日：2004-06-29
Applicant: INFINEON TECHNOLOGIES AG
Inventor： HARTMANN UDO , HAAS HERMANN
Abstract: The unit has an automatic test equipment interface compatible to a contact-interface of a testing device, and a measuring resistor (43) between contact devices assigned to supply voltage outlets of the testing device. A comparator unit (42) compares a measuring voltage dropping out over the resistor with a reference voltage. A comparator outlet outputs an output signal when the reference voltage exceeds the measuring voltage. An independent claim is also included for a method for verification of programming of a current limiting of a power supply unit of a testing device for testing a semiconductor component.
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公开(公告)号：DE10024875B4
公开(公告)日：2004-07-01
申请号：DE10024875
申请日：2000-05-16
Applicant: INFINEON TECHNOLOGIES AG
Inventor： HAAS HERMANN , LUEPKE JENS
Abstract: A component holder for testing electronic components having a carrier, at least one component socket arranged on the carrier and having a group of component contacts to accommodate and make contact with a component, and at least one group of adapter contacts, which are arranged in a predefined standard arrangement on the carrier and are connected to the component contacts.
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