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公开(公告)号:WO2004075197A3
公开(公告)日:2005-03-03
申请号:PCT/EP2004050207
申请日:2004-01-14
Applicant: INFINEON TECHNOLOGIES AG , STAVROU EVANGELOS , PROELL MANFRED , SCHROEDER STEPHAN , KLIEWER JOERG
Inventor: STAVROU EVANGELOS , PROELL MANFRED , SCHROEDER STEPHAN , KLIEWER JOERG
CPC classification number: G11C11/15
Abstract: The invention relates to an MRAM memory cell in which the magnetic layers (ML1, ML2) separated by an intermediate layer (ZS) are made at least in part of a ferromagnetic material.
Abstract translation: 本发明涉及一种MRAM存储单元,其特征在于,通过一个中间层(ZS)分开磁性层(ML1,ML2)所述至少部分由铁磁材料构成。
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公开(公告)号:DE102004044150A1
公开(公告)日:2006-03-30
申请号:DE102004044150
申请日:2004-09-13
Applicant: INFINEON TECHNOLOGIES AG
Inventor: SCHROEDER STEPHAN , PROELL MANFRED , AUGE JUERGEN , FISCHER HELMUT
IPC: G11C29/06
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公开(公告)号:DE102004022425A1
公开(公告)日:2005-12-01
申请号:DE102004022425
申请日:2004-05-06
Applicant: INFINEON TECHNOLOGIES AG
Inventor: PROELL MANFRED , KLIEWER JOERG , SCHNEIDER RALF , SCHROEDER STEPHAN
IPC: G05F1/595 , G11C5/14 , G11C7/00 , G11C11/4074
Abstract: An integrated circuit includes an input terminal (IN) for application of a supply voltage (Vext) and an output terminal (A) for generation of an output voltage (Vout). A first branch including a first controllable resistance (T 1 ) and a second branch including a charge pump ( 10 ) and a second controllable resistance (T 2 ) are connected between the input terminal (IN) and the output terminal (A). A control circuit ( 20 ) alters the resistance values of the first and second controllable resistances (T 1 , T 2 ) in a manner dependent on a ratio of an actual value (Vout) of the output voltage to a desired value (VSout) of the output voltage and a ratio of an actual value (Vext) of the supply voltage to a desired value (VSext) of the supply voltage. As a result, the output voltage (Vout) can be stabilized to the desired value (VSout) virtually independently of fluctuations of the supply voltage.
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公开(公告)号:DE102004016145A1
公开(公告)日:2005-10-20
申请号:DE102004016145
申请日:2004-04-01
Applicant: INFINEON TECHNOLOGIES AG
Inventor: BENZINGER HERBERT , EGGERS GEORG ERHARD , CAMPENHAUSEN AUREL VON , SCHROEDER STEPHAN
Abstract: The chip (1) has a component whose connection contacts (5) are located on a main side of a body of the chip. The connection contacts are electrically connected with its surfaces at a back side or a top side of a redistribution layer using a press contact, where the layer is located on the main side. A conducting strip is provided between one end of the press contact and the contact surfaces.
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公开(公告)号:DE10358038A1
公开(公告)日:2005-07-21
申请号:DE10358038
申请日:2003-12-11
Applicant: INFINEON TECHNOLOGIES AG
Inventor: SCHNEIDER RALF , SCHROEDER STEPHAN , PROELL MANFRED , AUGE JUERGEN
IPC: G11C7/00 , G11C11/407 , G11C16/04 , G11C29/44
Abstract: An integrated circuit includes a programming circuit ( 10 ) for generating programming signals (PS 1 , . . . , PS 4 ) with a first input terminal (E 1 ) for applying a control voltage (ES), a second input terminal (E 2 ) for applying a reference voltage (Vref), a storage circuit ( 30 ) with programmable switches ( 35, . . . , 38 ) and output terminals (A 1 , . . . , A 4 ). The programming circuit in each case generates a programming signal (PS 1 , . . . , PS 4 ) when the control voltage (ES) exceeds a predefined threshold voltage formed from the reference voltage. The number of programming signals (PS 1 , . . . , PS 4 ) is dependent on the magnitude of the threshold voltage exceeded by the control voltage (ES). The programming signals are used for programming the programmable switches ( 35, . . . , 38 ). The programming state of the programmable switches can be read out via the output terminals (A 1 , . . . , A 4 ) of the integrated circuit. The integrated circuit enables the storage of external operating parameters of the integrated circuit.
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公开(公告)号:DE10323501B4
公开(公告)日:2005-03-10
申请号:DE10323501
申请日:2003-05-23
Applicant: INFINEON TECHNOLOGIES AG
Inventor: BENZINGER HERBERT , PROELL MANFRED , SCHROEDER STEPHAN , ZANDEN KOEN VAN DER
IPC: G11C5/14 , G11C7/04 , G11C7/06 , G11C7/12 , G11C11/34 , G11C11/4074 , G11C11/409 , G11C11/4091
Abstract: A circuit arrangement for setting a voltage supply for a read/write amplifier of an integrated memory has a first voltage generator circuit for generating a supply voltage for application to the read/write amplifier during an assessment and amplification operation and a second voltage generator circuit for generating a precharge voltage for precharging bit lines of the memory which are connected to the read/write amplifier. A temperature detector circuit, which is connected to the first voltage generator circuit, is used to detect a temperature of the memory and interacts with the first voltage generator circuit to set the supply voltage applied to the read/write amplifier in a manner depending on a temperature of the memory.
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公开(公告)号:DE10311373B4
公开(公告)日:2005-02-24
申请号:DE10311373
申请日:2003-03-14
Applicant: INFINEON TECHNOLOGIES AG
Inventor: SCHROEDER STEPHAN , KLIEWER JOERG , CAMPENHAUSEN AUREL VON , PROELL MANFRED
Abstract: An integrated memory has individually addressable normal and redundant units of memory cells. A memory unit is used to store, in a normal mode, an address for one of the normal units which needs to be replaced by one of the redundant units. A comparison unit compares an address which is present on an address bus with an address stored in the memory unit and activates one of the redundant units in the event of a match being identified. The memory also has a test circuit which can be activated by a test mode signal, can reset the memory unit to an initial state, and can store an address for one of the redundant units in the memory unit for subsequently writing an identification code to this redundant unit.
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公开(公告)号:DE10323501A1
公开(公告)日:2004-12-30
申请号:DE10323501
申请日:2003-05-23
Applicant: INFINEON TECHNOLOGIES AG
Inventor: BENZINGER HERBERT , PROELL MANFRED , SCHROEDER STEPHAN , ZANDEN KOEN VAN DER
IPC: G11C5/14 , G11C7/04 , G11C7/06 , G11C7/12 , G11C11/34 , G11C11/4074 , G11C11/409 , G11C11/4091
Abstract: A circuit arrangement for setting a voltage supply for a read/write amplifier of an integrated memory has a first voltage generator circuit for generating a supply voltage for application to the read/write amplifier during an assessment and amplification operation and a second voltage generator circuit for generating a precharge voltage for precharging bit lines of the memory which are connected to the read/write amplifier. A temperature detector circuit, which is connected to the first voltage generator circuit, is used to detect a temperature of the memory and interacts with the first voltage generator circuit to set the supply voltage applied to the read/write amplifier in a manner depending on a temperature of the memory.
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公开(公告)号:DE10301856A1
公开(公告)日:2004-08-05
申请号:DE10301856
申请日:2003-01-17
Applicant: INFINEON TECHNOLOGIES AG
Inventor: CAMPENHAUSEN AUREL VON , PROELL MANFRED , BENZINGER HERBERT , SCHROEDER STEPHAN
IPC: G11C11/4097 , G11C11/404 , G11C7/18 , G11C5/02
Abstract: An integrated memory can include a memory cell array, which has word lines for the selection of memory cells, bit lines for reading out or writing data signals of the memory cells, and a sense amplifier connected to bit lines of a bit line pair at one end of the bit line pair. In an activated state during a memory access, at least one activatable isolation circuit which is switched into one of the bit line pairs can isolate a part of the bit line pair, which is more remote from the sense amplifier from the sense amplifier. As a result, the effective capacitance of the bit lines can be significantly reduced during the memory access.
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公开(公告)号:DE10259055A1
公开(公告)日:2004-07-15
申请号:DE10259055
申请日:2002-12-17
Applicant: INFINEON TECHNOLOGIES AG
Inventor: SCHNEIDER RALF , SCHROEDER STEPHAN , PROELL MANFRED , VOLLRATH JOERG
IPC: G05F1/46 , G11C11/4074 , H02M3/07
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