Abstract:
A radiation-sensitive resin composition includes (A) a polymer, (B) a photoacid generator, (C) an acid diffusion controller, and (D) a solvent, the polymer (A) including a repeating unit (a-1) shown by the following general formula (a-1), and the acid diffusion controller (C) including at least one base selected from (C-1) a base shown by the following general formula (C-1) and (C-2) a photodegradable base. wherein R 1 individually represent a hydrogen atom or the like, R represents a monovalent group shown by the above general formula (a'), R 19 represents a chain-like hydrocarbon group having 1 to 5 carbon atoms or the like, A represents a divalent chain-like hydrocarbon group having 1 to 30 carbon atoms or the like, m and n are integers from 0 to 3 (m+n=1 to 3), and R 2 and R 3 individually represent a monovalent chain-like hydrocarbon group having 1 to 20 carbon atoms or the like, provided that the two R 2 may bond to form a ring structure.
Abstract:
A radiation-sensitive resin composition includes (A) a polymer that includes an acid-labile group, (B) an acid generator that generates an acid upon exposure to radiation, and (C) a polymer that includes a fluorine atom and a functional group shown by the following general formula (x), the polymer (C) having a fluorine atom content higher than that of the polymer (A). €ƒ€ƒ€ƒ€ƒ€ƒ€ƒ€ƒ€ƒ-A-R 1 €ƒ€ƒ€ƒ€ƒ€ƒ(x) wherein R 1 represents an alkali-labile group, and A represents an oxygen atom (excluding an oxygen atom that is bonded directly to an aromatic ring, a carbonyl group, or a sulfoxyl group), an imino group, -CO-O-*, or -SO 2 -O-* (wherein "*" indicates a bonding hand bonded to R 1 ).
Abstract:
PROBLEM TO BE SOLVED: To provide a radiation-sensitive acid generator that can provide a photoresist composition excellent in an EL (Exposure Latitude), reducing LWR (Line Width Roughness) of a pattern obtained therefrom and improving lithographic characteristics.SOLUTION: A compound expressed by formula (1) is provided. In formula (1), Rpreferably represents a 1-20C chain hydrocarbon group. Also a photoresist composition is provided, comprising [A] the compound and [B] a polymer having a structural unit (I) including an acid dissociable group.
Abstract:
PROBLEM TO BE SOLVED: To provide a radiation sensitive resin composition capable of achieving large depth of focus, small LWR and MEEF, excellent characteristic for preventing the occurrence of pattern collapse, and excellent performance for preventing the occurrence of defect in development. SOLUTION: This radiation sensitive resin composition contains a resin (A), a radiation sensitive acid generator (B), an acid diffusion inhibitor (C), and a solvent (D). The resin (A) is a polymer having a repeating unit (a-1) having a cyclic carbonic ester structure on a side chain. The acid diffusion inhibitor (C) is a nitrogen-containing compound having a specific structure. COPYRIGHT: (C)2010,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a photoresist composition that is superior in lithographic characteristics such as CDU even in the formation of a fine pattern; and a resist pattern forming method.SOLUTION: A photoresist composition comprises [A] an acid-dissociable group-containing polymer including an adamantyl group and an adamantane ring having a structural unit including a γ-butyrolactone ring and [B] an acid generator, in which the content of the structural unit is more than 60 mol%.
Abstract:
PROBLEM TO BE SOLVED: To provide a radiation-sensitive resin composition useful as a chemically amplified resist satisfying excellent resolution, small LWR (Line Width Roughness), excellent pattern collapse resistance and excellent in non-defectiveness, and to provide a polymer usable as a resin component in the radiation-sensitive resin composition. SOLUTION: The radiation-sensitive resin composition includes a resin (A) and a radiation-sensitive acid generator (B). The resin (A) is a polymer including a specific repeating unit (a-1) derived from a (meth)acrylic ester substituted by an oxyalkylene group having norbornane lactone at a terminal, a specific repeating unit (a-2) derived from a (meth)acrylic ester having a sulfonamide group, and a repeating unit (a-3) having an acid dissociable group. COPYRIGHT: (C)2010,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a radiation-sensitive resin and a radiation-sensitive resin composition satisfying excellent resolution, small LWR (Line Width Roughness), good PEB (Post Exposure Bake) temperature dependency, excellent pattern collapse resistance and low defectiveness, that is, excellent in non-defectiveness. SOLUTION: The resin is a copolymer resin (A) of a (meth)acrylic ester of an alcohol having a heterocycle in which a norbornane ring and a lactone ring are condensed and a (meth)acrylic ester of an alcohol having a cyclopentane ring. The radiation-sensitive resin composition includes the resin and a radiation-sensitive acid generator (B). COPYRIGHT: (C)2010,JPO&INPIT