Abstract:
PROBLEM TO BE SOLVED: To provide a light-emitting semiconductor chip 1 which comprises an array 3 of semiconductor layers containing an activity layer 2 which forms electromagnetic radiation, and a passivation layer 12, disposed in the exit side of the array of the layers and which enables radiation emission to be adjusted and set to a target range during the manufacturing period to be more simple and lower cost than in the conventional technology. SOLUTION: The passivation layer has partially absorbing properties, and the transmittance to the radiation emitted from the array of the semiconductor layers during the operation of the semiconductor chip, can be adjusted during the manufacturing period of the passivation layer. COPYRIGHT: (C)2005,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To make directly formable an electric contact area on an n-conductive AlGaInP based or AlGaInAs based semiconductor layer. SOLUTION: A method includes: adjusting by epitaxial growth semiconductor layers having the n-conductive AlGaInP based or AlGaInAs based outer layers and an active zone that emits electromagnetic radiation; making an electric contact material having Au and at least one doping substance adhered to the outer layer; and tempering the outer layer. The doping substance used in the step of making the electric contact material adhered to the outer layer contains at least one element selected from the group consisting of Ge, Si, Sn, and Te. COPYRIGHT: (C)2004,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a light emitting diode chip having an epitaxial semiconductor layer row equipped with an activity layer which emits electromagnetic radiation, and an electric contact structure which contains a radiation transparent and electric current extension layer comprising ZnO, and an electric connection layer, in which the loss by absorption in an electric connection region is reduced. SOLUTION: The current extension layer has a window where the connection layer is deposited on a covering layer of the semiconductor layer row. The connection layer is connected electrically with the current extension layer. The joint part of the connection layer and the covering layer is not connected electrically or is in bad conductive connection status during operation of the light emitting diode chip. All currents or almost all currents flow in the semiconductor layer row through the current extension layer. COPYRIGHT: (C)2004,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a semiconductor chip structure allowing radiation emission to be adjusted and set in a target region during a manufacturing period. SOLUTION: The brightness of this radiation-emitting semiconductor chip is adjusted and set by putting one or more absorptive and/or partially-insulating brightness-adjusting/setting layers (12, 6, 9) on a radiation output-combining surface (10) of a wafer during a manufacturing period of the semiconductor chip after measurement of radiation-emission characteristics of a radiation-emitting semiconductor layer column (3) of the wafer. COPYRIGHT: (C)2011,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide an enhanced electric contact in a high reflection factor, excellent ohmic contact to a semiconductor, each other's excellent adhesion between layers which form excellent adhesion and contact on the semiconductor, good thermal stability, high stability to the environmental-impact factor, and soldering possibility and structuring possibility. SOLUTION: This electric contact of the photoelectron semiconductor chip 1 comprises a mirror layer 2 made of metal or metal alloy, a protective layer 3 for reducing the corrosion of the mirror layer 2, a barrier layer 4, an adhesion intermediate layer 5, and a solder layer 8. COPYRIGHT: (C)2004,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a semiconductor chip structure which enables radiation emission to be adjusted and set to a target range during the manufacturing period of the semiconductor chip. SOLUTION: The brightness of a radiation emission semiconductor chip is adjusted and set in the manufacturing period of the semiconductor chip after measuring the radiation emission property of a wafer's radiation emission semiconductor layer row (3), by providing to the wafer's radiation outputting bonded surface (10) one or a plurality of absorbing and/or partially insulating brightness adjusting and setting layers (12, 6, and 9). COPYRIGHT: (C)2005,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To protect a contact layer including ZnO of a photo-electric element from external influences such as humidity. SOLUTION: The photo-electric element 10 comprises stacked epitaxial semiconductor layers having an active zone 3 that radiates electromagnetic beams and at least one electrical contact region 7. The electrical contact region has at least one beam-transmitting electrical contact that includes ZnO and is conductively connected to an external semiconductor layer. The contact layer is provided by using a watertight material 8 so as to be sufficiently protected from humidity. COPYRIGHT: (C)2004,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide an element of a beam radiating semiconductor element having a low contact resistance and is provided with a proper reflection characteristics for a beam formed in a component. SOLUTION: In order to form an electrical contact, it is so constituted that a structured contact layer is adhered on the surface of a semiconductor, a plurality of intervening spaces placed dispersedly over the contact layer are provided to form a free surface which is not covered by the contact layer on their surfaces, and the free surfaces are covered by a mirror part. COPYRIGHT: (C)2004,JPO
Abstract:
The invention relates to two methods for producing a thin-film semiconductor chip based on a III/V-III/V connection semiconductor material, said thin-film semiconductor chip being suitable for generating electromagnetic radiation. According to the first method, an series of active layers (1), capable of generating electromagnetic radiation, is applied to a growth substrate (2), the front face (12) of said series facing the growth substrate (2) and the rear face (11) facing away from the growth substrate (2). At least one dielectric layer (3) is applied to the rear face (11) of the series of active layers (1) as part of a reflective series of layers (51) and energy is applied with the aid of a laser in restricted volumetric areas (8) of the dielectric layer (3) to create at least one opening (4) facing towards the rear face (11) of the active series of layers (1). At least one metallic layer (5) is then applied as an additional part of the reflective series of layers (51) so that the opening (4) is filled with metallic material and at least one rear electrically conductive contact point (6) is configured that faces towards the rear face (11) of the active series of layers (1). A support (8) is then applied to the reflective series of layers (51) and the growth substrate (2) is removed. According to the second method, a reflective series of layers (51) is applied to the active series of layers (1) and energy is then applied with the aid of a laser in a restricted volumetric area (6) of the reflective series of layers (51) to create at least one rear electrically conductive contact point (6) facing towards the rear face (11) of the active series of layers (1).
Abstract:
The invention relates to a radiation emitting semi-conductor element with a semi-conductor body, comprising a first main surface (5), a second main surface (9) and a semi-conductor layer sequence (4) with an active zone (7) generating electromagnetic radiation. The semi-conductor layer sequence (4) is arranged between the first and the second main surface (5,9), a first current expansion layer (3) is arranged on the first main surface (5) and is joined in an electrically conducting manner to the semi-conductor layer sequence (4) and a second current expansion layer (10) is arranged on the second main surface (9) and is joined in an electrically conducting manner to the semi-conductor layer sequence (4).