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公开(公告)号:DE10297316T5
公开(公告)日:2004-12-09
申请号:DE10297316
申请日:2002-10-09
Applicant: TESSERA INC
Inventor: PFLUGHAUPT L ELLIOTT , GIBSON DAVID , KIM YOUNG , MITCHELL CRAIG S
IPC: H01L25/18 , H01L21/31 , H01L21/44 , H01L21/48 , H01L21/50 , H01L23/02 , H01L23/48 , H01L23/528 , H01L25/065 , H01L25/10 , H01L25/11 , H01L31/0336 , H01L23/50 , G11C5/06
Abstract: A stacked chip assembly includes individual units having chips mounted on dielectric layers and traces on the dielectric layers interconnecting the contacts of the chips with terminals disposed in peripheral regions of the dielectric layers. At least some of the traces are multi-branched traces which connect chip select contacts to chip select terminals. The units are stacked one above the other with corresponding terminals of the different units being connected to one another by solder balls or other conductive elements so as to form vertical buses. Prior to stacking, the multi-branched traces of the individual units are selectively interrupted, as by breaking the individual branches, so as to leave chip select contacts of chips in different units connected to different chip select terminals and thereby connect these chips to different vertical buses. The individual units desirably are thin and directly abut one another so as to provide a low-height assembly with good heat transfer from chips within the stack.
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公开(公告)号:AU2003279215A8
公开(公告)日:2004-05-04
申请号:AU2003279215
申请日:2003-10-10
Applicant: TESSERA INC
Inventor: DAMBERG PHILIP , GIBSON DAVID , WARNER MICHAEL , KIM YOUNG-GON , OSBORN PHILIP
Abstract: An ultra thin system-in-a-package (SIP) with independent test and repair capability comprises an interposer having arranged on a top surface and a bottom surface thereof a number of packaged semiconductor chips mounted via solder bumps in accordance with a Land Grid Array (LGA) format and wherein no underfill is used on the SIP.
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公开(公告)号:AU2002337834A1
公开(公告)日:2003-04-22
申请号:AU2002337834
申请日:2002-10-09
Applicant: TESSERA INC
Inventor: GIBSON DAVID , KIM YOUNG , PFLUGHAUPT L ELLIOTT , MITCHELL CRAIG S
IPC: H01L25/18 , H01L21/31 , H01L21/44 , H01L21/48 , H01L21/50 , H01L23/02 , H01L23/48 , H01L23/528 , H01L25/065 , H01L25/10 , H01L25/11 , H01L31/0336
Abstract: A stacked chip assembly includes individual units having chips mounted on dielectric layers and traces on the dielectric layers interconnecting the contacts of the chips with terminals disposed in peripheral regions of the dielectric layers. At least some of the traces are multi-branched traces which connect chip select contacts to chip select terminals. The units are stacked one above the other with corresponding terminals of the different units being connected to one another by solder balls or other conductive elements so as to form vertical buses. Prior to stacking, the multi-branched traces of the individual units are selectively interrupted, as by breaking the individual branches, so as to leave chip select contacts of chips in different units connected to different chip select terminals and thereby connect these chips to different vertical buses. The individual units desirably are thin and directly abut one another so as to provide a low-height assembly with good heat transfer from chips within the stack.
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公开(公告)号:AU2003279215A1
公开(公告)日:2004-05-04
申请号:AU2003279215
申请日:2003-10-10
Applicant: TESSERA INC
Inventor: WARNER MICHAEL , DAMBERG PHILIP , OSBORN PHILIP , KIM YOUNG-GON , GIBSON DAVID
Abstract: An ultra thin system-in-a-package (SIP) with independent test and repair capability comprises an interposer having arranged on a top surface and a bottom surface thereof a number of packaged semiconductor chips mounted via solder bumps in accordance with a Land Grid Array (LGA) format and wherein no underfill is used on the SIP.
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公开(公告)号:AU4782293A
公开(公告)日:1994-02-14
申请号:AU4782293
申请日:1993-07-23
Applicant: TESSERA INC
Inventor: DISTEFANO THOMAS H , GRUBE GARY W , KHANDROS IGOR Y , MATHIEW GAETAN , SWEIS JASON , UNION LAURIE , GIBSON DAVID
IPC: H01L21/60 , H01L23/31 , H01L23/495 , H01L23/498 , H01L23/50 , H05K1/18 , H05K3/36 , H05K3/40
Abstract: A connection component for electrically connecting a semiconductor chip to a support substrate incorporates a preferably dielectric supporting structure defining gaps. Leads extend across these gaps so that the leads are supported on both sides of the gap. The leads therefore can be positioned approximately in registration to contacts on the chip by aligning the connection component with the chip. Each lead is arranged so that one end can be displaced relative to the supporting structure when a downward force is applied to the lead. This allows the leads to be connected to the contacts on the chip by engaging each lead with a tool and forcing the lead downwardly against the contact. Preferably, each lead incorporates a frangible section adjacent one side of the gap and the frangible section is broken when the lead is engaged with the contact. Final alignment of the leads with the contacts on the chip is provided by the bonding tool, which has features adapted to control the position of the lead.
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6.
公开(公告)号:WO2004034434A2
公开(公告)日:2004-04-22
申请号:PCT/US0332078
申请日:2003-10-10
Applicant: TESSERA INC
Inventor: KIM YOUNG-GON , GIBSON DAVID , WARNER MICHAEL , DAMBERG PHILIP , OSBORN PHILIP
CPC classification number: H05K1/141 , H01L25/105 , H01L2224/05568 , H01L2224/05573 , H01L2224/16225 , H01L2225/1005 , H01L2225/1023 , H01L2225/1058 , H01L2225/107 , H01L2924/01078 , H01L2924/01079 , H01L2924/01322 , H01L2924/01327 , H01L2924/15311 , H01L2924/1532 , H01L2924/15331 , H01L2924/3511 , H05K3/3436 , H05K2201/10719 , H05K2203/1572 , H01L2924/00 , H01L2224/05644 , H01L2924/00014 , H01L2224/05647
Abstract: An ultra thin system-in-a-package (SIP) with independent test and repair capability comprises an interposer (350) having arranged on a top surface (351) and a bottom surface (352) thereof a number of packaged semiconductor chips (315, 320, 325, 330) mounted via solder bumps (335) in accordance with a Land Grid Array (LGA) format and wherein no underfill is used on the SIP.
Abstract translation: 具有独立测试和修复功能的超薄系统级封装(SIP)包括布置在多个封装半导体芯片(315)的顶表面(351)和底表面(352)上的插入器(350) ,320,325,330),其经由焊盘(335)安装,所述焊料凸块(335)根据陆地网格阵列(LGA)格式,并且其中在所述SIP上不使用底部填充物。
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公开(公告)号:WO2006101861A3
公开(公告)日:2006-12-14
申请号:PCT/US2006009197
申请日:2006-03-14
Applicant: TESSERA INC , HABA BELGACEM , GIBSON DAVID
Inventor: HABA BELGACEM , GIBSON DAVID
IPC: H01L23/498 , G01R1/04 , G01R1/073 , H01L23/538
CPC classification number: G01R1/0483 , G01R1/0735 , G01R1/07378 , H01L23/13 , H01L23/3128 , H01L23/49811 , H01L23/49827 , H01L23/4985 , H01L2224/05001 , H01L2224/05023 , H01L2224/05147 , H01L2224/05548 , H01L2224/05568 , H01L2224/0557 , H01L2224/05571 , H01L2224/05573 , H01L2224/16225 , H01L2224/16237 , H01L2224/32225 , H01L2224/73204 , H01L2924/00013 , H01L2924/00014 , H01L2924/01078 , H01L2924/01079 , H01L2924/01322 , H01L2924/09701 , H01L2924/15153 , H01L2924/1517 , H01L2924/15311 , H01L2924/1532 , H01L2924/16195 , H01L2924/19041 , H01L2924/3011 , H05K3/3436 , H05K3/3447 , H05K2201/0367 , H05K2203/0455 , Y02P70/613 , H01L2924/00 , H01L2224/29099 , H01L2224/05599
Abstract: An assembly for testing microelectronic devices includes a microelectronic element 22 having faces and contacts, a flexible substrate 32 spaced from and overlying a first face 24 of the microelectronic element, and a plurality of conductive posts 46 extending from the flexible substrate 32 and projecting away from the first face 24 of the microelectronic element 22, at least some of the conductive posts 46 being electrically interconnected with the microelectronic element 22. The assembly also includes a plurality of support elements 30 disposed between the microelectronic element 22 and the flexible substrate 32 for supporting the flexible substrate over the microelectronic element. At least some of the conductive posts 46 are offset from the support elements 30.
Abstract translation: 用于测试微电子器件的组件包括具有面和触点的微电子元件22,与微电子元件的第一面24间隔开并且覆盖微电子元件的第一面24的柔性衬底32以及从柔性衬底32延伸并远离 微电子元件22的第一表面24,至少一些导电柱46与微电子元件22电互连。组件还包括多个支撑元件30,其设置在微电子元件22和柔性基板32之间,用于支撑 微电子元件上的柔性基板。 至少一些导电柱46与支撑元件30偏移。
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公开(公告)号:WO2006009772A3
公开(公告)日:2007-01-18
申请号:PCT/US2005021293
申请日:2005-06-16
Applicant: TESSERA INC , GIBSON DAVID , STAVROS ANDY , WARNER MICHAEL
Inventor: GIBSON DAVID , STAVROS ANDY , WARNER MICHAEL
CPC classification number: H01L23/66 , H01L23/50 , H01L23/642 , H01L25/105 , H01L2225/1023 , H01L2225/1058 , H01L2924/0002 , H01L2924/15311 , H01L2924/15331 , H01L2924/3011 , H01L2924/00
Abstract: A decoupling device (10) includes a plurality of capacitors having different capacitances (14, 16, 18) physically mounted in a package (12, 212), and terminals including at least one first terminal (24, 224) and at least one second terminal (26, 226) adapted for mounting the package to a circuit panel. The plural capacitors are connected in parallel between the first and second terminals so as to form plural circuits with different self-resonant frequencies. The device can be mounted as a unit on a circuit board with the first terminals connected to a power conductor and the second terminals connected to a ground conductor, and provides low impedance shunting of noise over a wide frequency spectrum.
Abstract translation: 解耦装置(10)包括物理地安装在封装(12,212)中的具有不同电容(14,16,18)的多个电容器,以及包括至少一个第一端子(24,224)和至少一个第二端子 端子(26,226),适于将封装安装到电路板。 多个电容器并联连接在第一和第二端子之间,以形成具有不同自谐振频率的多个电路。 该装置可以作为单元安装在电路板上,其中第一端子连接到电源导体,并且第二端子连接到接地导体,并且在宽频谱上提供低阻抗的噪声分流。
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9.
公开(公告)号:WO2004034434A9
公开(公告)日:2005-05-26
申请号:PCT/US0332078
申请日:2003-10-10
Applicant: TESSERA INC
Inventor: KIM YOUNG-GON , GIBSON DAVID , WARNER MICHAEL , DAMBERG PHILIP , OSBORN PHILIP
CPC classification number: H05K1/141 , H01L25/105 , H01L2224/05568 , H01L2224/05573 , H01L2224/16225 , H01L2225/1005 , H01L2225/1023 , H01L2225/1058 , H01L2225/107 , H01L2924/01078 , H01L2924/01079 , H01L2924/01322 , H01L2924/01327 , H01L2924/15311 , H01L2924/1532 , H01L2924/15331 , H01L2924/3511 , H05K3/3436 , H05K2201/10719 , H05K2203/1572 , H01L2924/00 , H01L2224/05644 , H01L2924/00014 , H01L2224/05647
Abstract: An ultra thin system-in-a-package (SIP) with independent test and repair capability comprises an interposer (350) having arranged on a top surface (351) and a bottom surface (352) thereof a number of packaged semiconductor chips (315, 320, 325, 330) mounted via solder bumps (335) in accordance with a Land Grid Array (LGA) format and wherein no underfill is used on the SIP.
Abstract translation: 具有独立测试和修复功能的超薄系统级封装(SIP)包括布置在多个封装半导体芯片(315)的顶表面(351)和底表面(352)上的插入器(350) ,320,325,330),其经由焊盘(335)安装,所述焊料凸块(335)根据陆地网格阵列(LGA)格式,并且其中在所述SIP上不使用底部填充物。
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