Abstract:
A charged particle beam irradiation apparatus includes: a scanning electromagnet that scans a charged particle beam; and a degrader that is provided on a downstream side of the scanning electromagnet in a scanning direction of the charged particle beam and adjusts a range of the charged particle beam by reducing energy of the charged particle beam. The degrader is configured to be closer to an upstream side in the scanning direction of the charged particle beam, outward in the scanning direction.
Abstract:
A charged particle beam irradiation apparatus includes: a scanning electromagnet that scans a charged particle beam; and a degrader that is provided on a downstream side of the scanning electromagnet in a scanning direction of the charged particle beam and adjusts a range of the charged particle beam by reducing energy of the charged particle beam. The degrader is configured to be closer to an upstream side in the scanning direction of the charged particle beam, outward in the scanning direction.
Abstract:
One embodiment relates to an electron beam apparatus which includes a dual-lens electron gun for emitting an electron beam. The electron beam is a high beam-current electron beam in a first operating mode and a low beam-current electron beam in a second operating mode. The apparatus further includes a column aperture which is out of the path of the high beam-current electron beam in the first operating mode and is centered about an optical axis of the electron beam apparatus in the second operating mode. Another embodiment relates to an electron gun which includes a first gun lens, a beam limiting aperture, and a second gun lens. The first gun lens focuses the electrons before they pass through the beam-limiting aperture while the second gun lens focuses the electrons after they pass through the beam-limiting aperture. Other embodiments, aspects and features are also disclosed.
Abstract:
An electron beam sterilizing device, comprises: an electron-generating filament; a beam-shaper; an output window; a high-voltage supply, capable of creating a high-voltage potential between the electron-generating filament and the output window, for acceleration of electrons; a high-voltage supply for driving current through the electron-generating filament; a control unit for controlling the operation of the electron beam sterilizing device. The electron beam sterilizing device has at least three operational states which include: an OFF-state, where there is no drive current through the electron-generating filament; an ON-state, where the electron-generating filament is kept at a temperature above the emission temperature so as to generate electrons for sterilization; and a standby state, between the OFF-state and ON-state, where the electron-generating filament is kept at a predetermined temperature just below the emission temperature. The control unit controls the device to assume the standby state.
Abstract:
When an emission current is changed, a decrease in brightness of an electron beam is prevented. An electron gun includes a cathode that emits thermoelectrons, a Wehnelt electrode that focuses the thermoelectrons, a control electrode that extracts the thermoelectrons from a distal end of said cathode, an anode that accelerates the thermoelectrons and irradiates a powder with the thermoelectrons as an electron beam, and an optimum condition collection controller that changes at least one of a bias voltage to be applied to the Wehnelt electrode and a control electrode voltage to be applied to the control electrode, and decides a combination of the bias voltage and the control electrode voltage at which the brightness of the electron beam reaches a peak.
Abstract:
One embodiment relates to an electron beam apparatus which includes a dual-lens electron gun for emitting an electron beam. The electron beam is a high beam-current electron beam in a first operating mode and a low beam-current electron beam in a second operating mode. The apparatus further includes a column aperture which is out of the path of the high beam-current electron beam in the first operating mode and is centered about an optical axis of the electron beam apparatus in the second operating mode. Another embodiment relates to an electron gun which includes a first gun lens, a beam limiting aperture, and a second gun lens. The first gun lens focuses the electrons before they pass through the beam-limiting aperture while the second gun lens focuses the electrons after they pass through the beam-limiting aperture. Other embodiments, aspects and features are also disclosed.
Abstract:
The invention provides a flat band winding for an inductor core comprising at least one insulated conductive flat band having a first linear region, a second linear region, and a third linear region, wherein the third linear region is substantially orthogonally connected to said first linear region and to said second linear region such that said first linear region and said second linear region are displaced by a distance and run in parallel or anti-parallel, and wherein said first linear region and said second linear region are wound in opposite directions around the inductor core and around said third region.