公开(公告)号：US20130335733A1

公开(公告)日：2013-12-19

申请号：US13953644

申请日：2013-07-29

Applicant: KLA-Tencor Corporation

Inventor： Richard E. Bills ,  Neil Judell ,  Timothy R. Tiemeyer ,  James P. McNiven

IPC: G01N21/956

CPC classification number: G01N21/9501 ,  G01N21/21 ,  G01N21/47 ,  G01N21/4738 ,  G01N21/474 ,  G01N21/55 ,  G01N21/88 ,  G01N21/8806 ,  G01N21/95 ,  G01N21/956 ,  G01N2021/4707 ,  G01N2021/4711 ,  G01N2021/4792 ,  G01N2021/556 ,  G01N2021/8809 ,  G01N2021/8848 ,  G01N2021/8864 ,  G01N2021/8877 ,  G01N2021/8896 ,  G01N2201/0612 ,  G01N2201/105 ,  G06T7/0004 ,  G06T2207/30148 ,  Y10T29/49826

Abstract: A method for inspecting a surface of a workpiece for asymmetric defects, by scanning an incident beam on the surface of the workpiece to impinge thereon to create reflected light extending along a light channel axis in a front quartersphere and scattered light, the incident beam and the light channel axis defining an incident plane, collecting the scattered light at a plurality of collectors disposed above the surface at defined locations such that scatter from asymmetric defects is collectable by at least one collector, detecting collector output and generating signals in response, and processing the signals associated with each collector individually to obtain information about asymmetric defects.

Abstract translation: 一种用于通过扫描工件表面上的入射光束以撞击在其上以产生沿着前四分之一圆周和散射光中的光通道轴延伸的反射光来检查工件的表面的非对称缺陷的方法，入射光束和 光通道轴限定入射平面，在设置在表面上的多个收集器处收集散射光，所述收集器在限定的位置处，使得来自不对称缺陷的散射可由至少一个收集器收集，检测收集器输出并响应于产生信号，并且处理 分别与每个收集器相关联的信号以获得关于非对称缺陷的信息。

公开(公告)号：US20130265566A1

公开(公告)日：2013-10-10

申请号：US13646513

申请日：2012-10-05

Applicant: KLEIN MEDICAL LIMITED

Inventor： Bryan James Smith ,  Donal Paul Krouse ,  Raymond Andrew Simpkin

IPC: G01N21/27 ,  G01N21/31 ,  G01N33/49

CPC classification number: G01N21/3577 ,  G01J3/10 ,  G01J3/28 ,  G01J3/42 ,  G01J2003/1286 ,  G01N21/359 ,  G01N21/84 ,  G01N2021/3595 ,  G01N2201/0612 ,  G01N2201/0691

Abstract: An analyser and related methods for characterising a sample. The analyser includes an integrated laser for emitting electromagnetic radiation in at least one beam at a sample. The electromagnetic radiation can include at least two different wavelengths. A sample detector detects affected electromagnetic radiation resulting from the emitted electromagnetic radiation affected by the sample and provides output representing the detected affected radiation. The analyser also includes a processor for characterising the sample from the detector output representing the detected affected electromagnetic radiation.

Abstract translation: 用于表征样品的分析仪和相关方法。 分析仪包括用于在样品的至少一个光束中发射电磁辐射的集成激光器。 电磁辐射可以包括至少两个不同的波长。 样品检测器检测受样品发射的电磁辐射产生的电磁辐射，并提供表示检测到的受影响辐射的输出。 分析仪还包括用于表征来自检测器输出的样品的处理器，其表示检测到的受影响的电磁辐射。

公开(公告)号：US08536516B2

公开(公告)日：2013-09-17

申请号：US13452128

申请日：2012-04-20

Applicant: Jess V. Ford ,  Thomas Blankinship ,  Bryan W. Kasperski ,  Margaret C. Waid ,  Sean M. Christian

Inventor： Jess V. Ford ,  Thomas Blankinship ,  Bryan W. Kasperski ,  Margaret C. Waid ,  Sean M. Christian

IPC: G01V5/04

CPC classification number: G01N21/255 ,  G01J3/02 ,  G01J3/0202 ,  G01J3/0208 ,  G01J3/0218 ,  G01J3/10 ,  G01J3/12 ,  G01J3/4338 ,  G01J2003/1226 ,  G01N2201/0612 ,  G01N2201/0625 ,  G01N2201/0627 ,  G01N2201/0691 ,  G01N2201/0826 ,  G02B6/4215 ,  G02B6/4249

Abstract: A multi-channel source assembly for downhole spectroscopy has individual sources that generate optical signals across a spectral range of wavelengths. A combining assembly optically combines the generated signals into a combined signal and a routing assembly that splits the combined signal into a reference channel and a measurement channel. Control circuitry electrically coupled to the sources modulates each of the sources at unique or independent frequencies during operation.

Abstract translation: 用于井下光谱的多通道源组件具有在波长的光谱范围上产生光信号的各个源。 组合组合将所生成的信号光学地组合成组合信号和将组合信号分离成参考通道和测量通道的路由组件。 电耦合到源的控制电路在操作期间以独特或独立的频率调制每个源。

公开(公告)号：US08502148B2

公开(公告)日：2013-08-06

申请号：US13447584

申请日：2012-04-16

Applicant: Matthias Wagner ,  John Heanue

Inventor： Matthias Wagner ,  John Heanue

IPC: G01J5/00

CPC classification number: G01N15/1436 ,  B01L3/502761 ,  B01L2200/0652 ,  B01L2300/0627 ,  B01L2300/0864 ,  B07C5/34 ,  C12N5/0612 ,  G01N15/14 ,  G01N15/1427 ,  G01N15/1429 ,  G01N15/1434 ,  G01N15/1459 ,  G01N15/1463 ,  G01N15/147 ,  G01N15/1484 ,  G01N21/1702 ,  G01N21/3563 ,  G01N29/2418 ,  G01N2015/0065 ,  G01N2015/1006 ,  G01N2015/149 ,  G01N2015/1497 ,  G01N2201/0612

Abstract: This disclosure concerns a system with scattering analysis including a handling system that presents a single particle to at least one quantum cascade laser (QCL) source. The QCL laser source is configured to deliver light to the single particle in order to induce resonant mid-infrared absorption in the particle or an analyte within the particle. A mid-infrared detection facility detects the mid-infrared wavelength light scattered by the single particle, wherein a wavelength and angle analysis of the scattered mid-IR wavelength light is used to determine analyte-specific structural and concentration information.

Abstract translation: 本公开涉及具有散射分析的系统，包括将单个粒子呈现给至少一个量子级联激光器（QCL）源的处理系统。 QCL激光源被配置为将光传递到单个颗粒，以便在粒子或颗粒内的分析物中引发共振的中红外吸收。 中红外检测装置检测由单个颗粒散射的中红外波长光，其中使用散射的中红外波长光的波长和角度分析来确定分析物特异性结构和浓度信息。

公开(公告)号：US08497984B2

公开(公告)日：2013-07-30

申请号：US11311943

申请日：2005-12-17

Applicant: Richard Earl Bills ,  Neil Judell ,  Timothy R. Tiemeyer ,  James Peter McNiven

Inventor： Richard Earl Bills ,  Neil Judell ,  Timothy R. Tiemeyer ,  James Peter McNiven

IPC: G01N21/88

CPC classification number: G01N21/9501 ,  G01N21/21 ,  G01N21/47 ,  G01N21/4738 ,  G01N21/474 ,  G01N21/55 ,  G01N21/88 ,  G01N21/8806 ,  G01N21/95 ,  G01N21/956 ,  G01N2021/4707 ,  G01N2021/4711 ,  G01N2021/4792 ,  G01N2021/556 ,  G01N2021/8809 ,  G01N2021/8848 ,  G01N2021/8864 ,  G01N2021/8877 ,  G01N2021/8896 ,  G01N2201/0612 ,  G01N2201/105 ,  G06T7/0004 ,  G06T2207/30148 ,  Y10T29/49826

Abstract: A surface inspection system, as well as related components and methods, are provided. The surface inspection system includes a beam source subsystem, a beam scanning subsystem, a workpiece movement subsystem, an optical collection and detection subsystem, and a processing subsystem. Certain of these components, most notably the beam source subsystem, the beam scanning subsystem and the optical collection and detection subsystem are modular for ready field replacement and/or maintenance. The optical collection and detection system features wing collectors in the front quartersphere and back collectors in the back quartersphere for collected light scattered from the surface of the workpiece. This can greatly improve the measurement capabilities of the system. Also included is a method for detecting asymmetric defects using the wing collectors and back collectors.

Abstract translation: 提供了表面检查系统，以及相关的部件和方法。 表面检查系统包括光束源子系统，光束扫描子系统，工件运动子系统，光学收集和检测子系统以及处理子系统。 这些部件中的一些，最明显的是光束源子系统，光束扫描子系统和光学收集和检测子系统是模块化的，用于现场更换和/或维护。 光学收集和检测系统在后四分之一的四分之一区域中具有翼收集器和后收集器，用于从工件表面散射的收集的光。 这可以大大提高系统的测量能力。 还包括使用翼收集器和后收集器检测不对称缺陷的方法。

公开(公告)号：US20130135619A1

公开(公告)日：2013-05-30

申请号：US13687456

申请日：2012-11-28

Applicant: YOKOGAWA ELECTRIC CORPORATION

Inventor： Takaaki Hirata ,  Yasuhiko Mitsumoto ,  Masaya Ooyama ,  Nobuhiko Kanbara ,  Naoyuki Fujimura ,  Minoru Maeda ,  Tadashi Sugiyama ,  Alan Cowie ,  Jie Zhu

IPC: G01N21/39

CPC classification number: G01N21/39 ,  G01N21/3103 ,  G01N21/3504 ,  G01N21/359 ,  G01N33/0027 ,  G01N2021/399 ,  G01N2201/0612

Abstract: A laser gas analyzer includes a wavelength-variable laser having a wide wavelength-variable width, a light-split module configured to split an output light of the wavelength-variable laser into a measurement light and a reference light, a first gas cell into which gases to be measured are introduced, and the measurement light is made to be incident, and a data processor configured to obtain an absorption spectrum of each of the gases to be measured based on a reference signal related to the reference light and an absorption signal related to an output light of the first gas cell, and to obtain concentrations of the respective gases to be measured.

公开(公告)号：US08330947B2

公开(公告)日：2012-12-11

申请号：US12570465

申请日：2009-09-30

Applicant: Richard Earl Bills ,  Neil Judell ,  Klaus Reinhard Freischlad ,  James Peter McNiven

Inventor： Richard Earl Bills ,  Neil Judell ,  Klaus Reinhard Freischlad ,  James Peter McNiven

IPC: G01N21/88

CPC classification number: G01N21/9501 ,  G01N21/21 ,  G01N21/47 ,  G01N21/4738 ,  G01N21/474 ,  G01N21/55 ,  G01N21/88 ,  G01N21/8806 ,  G01N21/95 ,  G01N21/956 ,  G01N2021/4707 ,  G01N2021/4711 ,  G01N2021/4792 ,  G01N2021/556 ,  G01N2021/8809 ,  G01N2021/8848 ,  G01N2021/8864 ,  G01N2021/8877 ,  G01N2021/8896 ,  G01N2201/0612 ,  G01N2201/105 ,  G06T7/0004 ,  G06T2207/30148 ,  Y10T29/49826

Abstract: A surface inspection system includes a beam source subsystem, a beam scanning subsystem, a workpiece movement subsystem, an optical collection and detection subsystem, and a processing subsystem. The optical collection and detection system features back collectors disposed in the back quartersphere, outside the incident plane, for collecting light scattered from the surface of the workpiece. The back collectors are disposed at a relative minimum in the portion of scattered light attributable to haze relative to the portion of scattered light attributable to defect scatter portion, or, alternatively, at a relative minimum in the Rayleigh scatter.

Abstract translation: 表面检查系统包括光束源子系统，光束扫描子系统，工件运动子系统，光学收集和检测子系统以及处理子系统。 光学收集和检测系统的特征在于后置收集器，其设置在入射平面外侧的后四分之一圈中，用于收集从工件表面散射的光。 后收集器相对于归因于缺陷散射部分的散射光部分的雾度部分的散射光部分相对最小设置，或者在瑞利散射中相对最小。

公开(公告)号：US20120298868A1

公开(公告)日：2012-11-29

申请号：US13482655

申请日：2012-05-29

Applicant: Steven Michael Massick ,  Kristen A. Peterson ,  Anthony Gomez

Inventor： Steven Michael Massick ,  Kristen A. Peterson ,  Anthony Gomez

IPC: G01J3/427

CPC classification number: G01N21/3504 ,  G01N21/39 ,  G01N33/497 ,  G01N2021/399 ,  G01N2201/0612

Abstract: An apparatus and method (and related kit) for determination of the isotopic ratio of 13C to 12C in a gas sample containing carbon dioxide comprising introducing gas into a gas sample chamber, directing light into the sample chamber from a laser light source, the laser light source being capable of accessing one or more of the wavelength pairs 2054.37 and 2052.42; 2054.96 and 2051.67; or 2760.53 and 2760.08 nanometers, and with a detector detecting the laser light energy after passage through the sample chamber.

Abstract translation: 一种用于在含有二氧化碳的气体样品中测定13C至12C的同位素比率的装置和方法（及相关试剂盒），包括将气体引入气体样品室，将光从激光源引入样品室，激光 源能够访问一个或多个波长对2054.37和2052.42; 2054.96和2051.67; 或2760.53和2760.08纳米，并且检测器检测通过样品室后的激光能量。

公开(公告)号：US20120199741A1

公开(公告)日：2012-08-09

申请号：US13447484

申请日：2012-04-16

Applicant: Matthias Wagner ,  John Heanue

Inventor： Matthias Wagner ,  John Heanue

IPC: G01J5/58

CPC classification number: G01N15/1436 ,  B01L3/502761 ,  B01L2200/0636 ,  B01L2200/0652 ,  B01L2300/0627 ,  B01L2300/0864 ,  B07C5/34 ,  C12N5/0612 ,  G01N15/14 ,  G01N15/1427 ,  G01N15/1429 ,  G01N15/1434 ,  G01N15/1459 ,  G01N15/1463 ,  G01N15/147 ,  G01N15/1484 ,  G01N21/1702 ,  G01N21/3563 ,  G01N29/2418 ,  G01N2015/0065 ,  G01N2015/1006 ,  G01N2015/149 ,  G01N2015/1493 ,  G01N2015/1497 ,  G01N2201/0612

Abstract: This disclosure concerns a minimally invasive cytometry system including a handling system that presents single cells to at least one QCL laser source. The QCL laser source is configured to deliver light to a cell within the cells in order to induce vibrational bond absorption in one or more analytes within the cell. The cytometry system also includes a detection facility that detects the transmitted mid-infrared wavelength light, wherein the transmitted mid-infrared wavelength light is used to identify the differentiation status of the cell as either pluripotent or functionally differentiated.

Abstract translation: 本公开涉及一种微创细胞计数系统，其包括向至少一个QCL激光源提供单个细胞的处理系统。 QCL激光源被配置为将光传送到细胞内的细胞，以便在细胞内的一种或多种分析物中诱导振动键吸收。 细胞计数系统还包括检测传输的中红外波长光的检测设备，其中透射的中红外波长光用于识别细胞的分化状态为多能性或功能差异化。

公开(公告)号：US20120184827A1

公开(公告)日：2012-07-19

申请号：US13378916

申请日：2010-06-16

Applicant: Shoulamit Cohen Shwartz ,  Meir Orenstein

Inventor： Shoulamit Cohen Shwartz ,  Meir Orenstein

IPC: G01J3/42 ,  A61B5/07 ,  A61B10/02 ,  A61B5/00 ,  A61B1/06 ,  A61B5/02

CPC classification number: A61B5/415 ,  A61B5/0075 ,  A61B5/0084 ,  A61B5/0086 ,  A61B5/02007 ,  A61B5/14532 ,  A61B5/1455 ,  A61B5/418 ,  A61B5/4331 ,  A61B5/444 ,  A61B5/445 ,  A61B5/681 ,  A61B5/6849 ,  A61B5/6861 ,  A61B10/0283 ,  A61B2562/028 ,  G01N21/35 ,  G01N2201/0221 ,  G01N2201/0612

Abstract: A miniature medical spectrometer is provided, the spectrometer comprises: a room temperature, electrically excited, solid state two photon laser generating high intensity broad wavelength; a light projection optics, projecting said generated light on biological subject; a light collection optics, collecting reflected light from said biological subject; a wavelength selector spectrally analyzing said collected light; a detector, detecting said analyzed light; and a controller analyzing the reflected spectra and calculating result indicative of the medical state of the biological subject based on said spectrum.

Abstract translation: 提供微型医用光谱仪，光谱仪包括：室温，电激励，固态双光子激光产生高强度宽波长; 将所述生成的光投射到生物学对象上的光投影光学器件; 光收集光学器件，收集来自所述生物学对象的反射光; 对所收集的光进行光谱分析的波长选择器; 检测器，检测所述分析的光; 以及基于所述光谱分析反射光谱并计算指示生物体的医学状态的结果的控制器。