Abstract:
An apparatus for analyzing, identifying or imaging an target including an integrated dual laser module coupled to a pair of photoconductive switches to produce cw signals in the range of frequencies from 100 GHz to over 2 THz focused on and transmitted through or reflected from the target; and a detector for acquiring spectral information from signals received from the target and using a multi-spectral homodyne process to generate an electrical signal representative of some characteristics of the target with resolution less than 250 MHz. The photoconductive switches are activated by laser beams from the dual laser module. The lasers in the module are tuned to different frequencies and a phase shifter in the path of one beam allows the beams to have an adjustable phase difference.
Abstract:
A high-speed absorption spectrographic system employs a slit-less spectroscope to obtain high-resolution, high-speed spectrographic data of combustion gases in an internal combustion engine allowing precise measurement of gas parameters including temperature and species concentration.
Abstract:
A spectroscopy system is provided which is optimized for operation in the VUV region and capable of performing well in the DUV-NIR region. Additionally, the system incorporates an optical module which presents selectable sources and detectors optimized for use in the VUV and DUV-NIR. As well, the optical module provides common delivery and collection optics to enable measurements in both spectral regions to be collected using similar spot properties. The module also provides a means of quickly referencing measured data so as to ensure that highly repeatable results are achieved. The module further provides a controlled environment between the VUV source, sample chamber and VUV detector which acts to limit in a repeatable manner the absorption of VUV photons. The use of broad band data sets which encompass VUV wavelengths, in addition to the DUV-NIR wavelengths enables a greater variety of materials to be meaningfully characterized. Array based detection instrumentation may be exploited to permit the simultaneous collection of larger wavelength regions.
Abstract:
A high-speed absorption spectrographic system employs a slit-less spectroscope to obtain high-resolution, high-speed spectrographic data of combustion gases in an internal combustion engine allowing precise measurement of gas parameters including temperature and species concentration.
Abstract:
A spectrometry device comprising at least one wavefront-dividing interferometer comprising at least two unbalanced arms and at least one air wedge, a device for imaging interference fringes, an imaging sensor of the fringes and a processor that processes a signal derived from the sensor.
Abstract:
A spectroscopy system is provided which is optimized for operation in the VUV region and capable of performing well in the DUV-NIR region. Additionally, the system incorporates an optical module which presents selectable sources and detectors optimized for use in the VUV and DUV-NIR. As well, the optical module provides common delivery and collection optics to enable measurements in both spectral regions to be collected using similar spot properties. The module also provides a means of quickly referencing measured data so as to ensure that highly repeatable results are achieved. The module further provides a controlled environment between the VUV source, sample chamber and VUV detector which acts to limit in a repeatable manner the absorption of VUV photons. The use of broad band data sets which encompass VUV wavelengths, in addition to the DUV-NIR wavelengths enables a greater variety of materials to be meaningfully characterized. Array based detection instrumentation may be exploited to permit the simultaneous collection of larger wavelength regions.
Abstract:
A Fourier-transform spectrometer contains a birefringent optical component, removing the need for a Michelson interferometer used in conventional instruments. A suitable birefringent element such as a Wollaston prism, is used to introduce a path difference between two light polarisations. Use of an extended light source so that all areas of the birefringent component are illuminated simultaneously ensures that different positions on the birefringent component correspond to different path differences between the two polarisations. A Fourier-transform of the resulting interferogram at the detector results in the spectral distribution of the input light being obtained. The use of an extended light source permits a Fourier-transform spectrometer with no moving parts to be achieved.
Abstract:
We disclose an on-chip photonic spectroscopy system capable of dramatically improving the signal-to-noise ratio (SNR), dynamic range, and reconstruction quality of Fourier transform spectrometers. Secondly, we disclose a system of components that makes up a complete on-chip RF spectrum analyzer with low-cost and high-performance.
Abstract:
Novel monolithic reflective spatial heterodyne spectrometers (SHS) interferometer systems are presented. Monolithic systems in accordance with the invention have a single supporting structure wherein input optics, output optics, a flat mirror, a roof mirror, and a symmetric grating are affixed. Embodiments of the invention contain only fixed parts, and the optics do not move in relation to the supporting structure. Embodiments of the present invention enables smaller, lighter, and more robust reflective SHS systems as compared to conventional interferometry. Additionally, embodiments of the present invention require less time and skill for construction and maintenance, and is a better economic option. Additional embodiments can include multiple interferometer systems in a single supporting structure.
Abstract:
A frequency-measurement method uses a dual frequency-comb spectrometer as an optical wavemeter to measure the frequency of a reference laser that is used to frequency-stabilize the spectrometer. The method includes measuring a walking rate of center bursts in a sequence of interferograms recorded by the spectrometer, determining a number of teeth in each of a plurality of Nyquist windows formed by the dual frequency-comb spectrometer, and determining a Nyquist number of the one Nyquist window covering the laser frequency. The reference laser frequency can then be determined from the number of teeth in each Nyquist window, the Nyquist number, and the comb spacing of either one of the two frequency combs of the dual frequency-comb spectrometer. The reference laser frequency does not need to be measured with a separate wavemeter, or calibrated with respect to a known atomic or molecular transition.