公开(公告)号：US20060289745A1

公开(公告)日：2006-12-28

申请号：US11441305

申请日：2006-05-24

Applicant: Raanan Miller ,  Erkinjon Nazarov ,  Paul Vouros ,  Daren Levin

Inventor： Raanan Miller ,  Erkinjon Nazarov ,  Paul Vouros ,  Daren Levin

IPC: H01J49/28

CPC classification number: G01N27/624 ,  H01J49/0031 ,  H01J49/004

Abstract: The invention relates generally to systems, methods and devices for analyzing samples and, more particularly, to systems using a mass analyzer in combination with a differential mobility spectrometer to enhance the analysis process of constituents of a sample.

公开(公告)号：USRE38861E1

公开(公告)日：2005-11-01

申请号：US09432984

申请日：1999-11-02

Applicant: Melvin Park ,  Claus Koster

Inventor： Melvin Park ,  Claus Koster

IPC: H01J49/40 ,  H01J49/48 ,  H01J49/28

CPC classification number: H01J49/061 ,  H01J49/40

Abstract: A method and apparatus to direct ions away from their otherwise intended or parallel course. Deflectors are used to establish electric fields in regions through which ions are to pass. With such electric fields, ions may be deflected to a desired trajectory. According to the present invention, a multideflector, in the form of a series of bipolar plates spaced evenly across the ion beam path, is used as an ion deflector.

Abstract translation: 一种将离子远离其他预期或平行过程的方法和装置。 偏转器用于在离子通过的区域建立电场。 通过这样的电场，离子可以被偏转到期望的轨迹。 根据本发明，以离子束路径均匀间隔开的一系列双极板的形式的多重反射器被用作离子偏转器。

公开(公告)号：US06939469B2

公开(公告)日：2005-09-06

申请号：US10321301

申请日：2002-12-16

Applicant: Tihiro Ohkawa ,  Robert L. Miller

Inventor： Tihiro Ohkawa ,  Robert L. Miller

IPC: H01J49/28 ,  H01J49/42 ,  B03C1/00 ,  B01D21/26

CPC classification number: H01J49/42 ,  H01J49/288

Abstract: A band gap mass filter for separating particles of mass (M1) from particles of mass (M2) in a multi-species plasma includes a chamber defining an axis. Coils around the chamber generate an axially aligned magnetic field defined (B=B0+B1 sin ωt), with an antenna generating the sinusoidal component (B1 sin ωt) to induce an azimuthal electric field (Eθ) in the chamber. The resultant crossed electric and magnetic fields place particles M2 on unconfined orbits for collection inside the chamber, and pass the particles M1 through said chamber for separation from the particles M2. Unconfined orbits for particles M2 are determined according to an α-β plot ( α = Ω 0 2 + Ω 1 2 / 2 4 ⁢ ω 2 , and ⁢   ⁢ β = Ω 0 ⁢ Ω 1 8 ⁢ ω 2 ) , where Ω0 is the cyclotron frequency for particles with mass/charge ratio M, and wherein Ω0=B0/M and Ω1=B1/M.

公开(公告)号：US20050178964A1

公开(公告)日：2005-08-18

申请号：US11038099

申请日：2005-01-21

Applicant: Roger Guevremont ,  Edward Masionis ,  David Barnett

Inventor： Roger Guevremont ,  Edward Masionis ,  David Barnett

IPC: B01D59/44 ,  G01N27/64 ,  H01J49/28 ,  H01J49/40 ,  H01J49/42

CPC classification number: G01N27/624

Abstract: A method of separating ions includes providing a FAIMS analyzer region for separating ions, and establishing a temperature gradient across the FAIMS analyzer region to controllably affect ion focusing in the FAIMS analyzer region.

Abstract translation: 分离离子的方法包括提供用于分离离子的FAIMS分析器区域，并且在FAIMS分析仪区域上建立温度梯度以可控地影响FAIMS分析仪区域中的离子聚焦。

公开(公告)号：US20050161598A1

公开(公告)日：2005-07-28

申请号：US11040303

申请日：2005-01-21

Applicant: Roger Guevremont ,  Ragnar Dworschak

Inventor： Roger Guevremont ,  Ragnar Dworschak

IPC: B01D59/44 ,  G01N27/64 ,  H01J49/28 ,  H01J49/40 ,  H01J49/42

CPC classification number: G01N27/624 ,  H01J49/0413 ,  H01J49/0418

Abstract: A method of separating ions includes providing a FAIMS analyzer region including an ion inlet orifice for providing ions thereto, and providing a sample holder along a side of the ion inlet orifice that is opposite the FAIMS analyzer. A sample material is applied to the sample holder such that sample material is disposed about first and second points along the sample holder, a distance between the first and second points being greater than a maximum dimension of the ion inlet orifice. The first point is aligned with the ion inlet orifice, and the sample material disposed about the first point is irradiated with laser light of a predetermined wavelength. Next, the sample holder is moved relative to the ion inlet so as to align the second point with the ion inlet orifice, and the sample material disposed about the second point is irradiated with laser light of a predetermined wavelength.

Abstract translation: 分离离子的方法包括提供包括用于提供离子的离子入口孔的FAIMS分析器区域，并且沿着与FAIMS分析仪相对的离子入口孔的一侧提供样品保持器。 将样品材料施加到样品保持器，使得样品材料围绕样品保持器围绕第一和第二点设置，第一和第二点之间的距离大于离子入口孔的最大尺寸。 第一点与离子入口孔对准，并且围绕第一点设置的样品材料用预定波长的激光照射。 接下来，样品保持器相对于离子入口移动，以使第二点与离子入口孔对齐，并且围绕第二点设置的样品材料用预定波长的激光照射。

公开(公告)号：US20050161596A1

公开(公告)日：2005-07-28

申请号：US10503713

申请日：2003-02-07

Applicant: Roger Guevremont ,  Randy Purves ,  David Barnett ,  Barbara Ells

Inventor： Roger Guevremont ,  Randy Purves ,  David Barnett ,  Barbara Ells

IPC: G01N27/64 ,  H01J49/04 ,  H01J49/28

CPC classification number: G01N27/624 ,  H01J49/04

Abstract: Disclosed is a method and apparatus for improving at least one of a peak separation and a signal intensity relating to an ion of interest being transmitted through an analyzer region of a FAIMS apparatus. A method according to the instant invention includes a step of introducing ions including an ion of interest into an analyzer region of a FAIMS. A flow of a doped carrier gas other than air is also provided through the analyzer region. The doped carrier gas includes a carrier gas and a trace amount of a predetermined dopant gas, the predetermined dopant gas selected for improving at least one of a peak separation and a signal intensity relating to the ion of interest relative to the peak separation and the signal intensity relating to the ion of interest in the presence of the carrier gas only. The ion of interest is selectively transmitted through the analyzer region in the presence of the doped carrier gas, and detected at a detector.

Abstract translation: 公开了一种用于改善通过FAIMS装置的分析器区域传输的与感兴趣的离子相关的峰值分离和信号强度中的至少一个的方法和装置。 根据本发明的方法包括将包含感兴趣的离子的离子引入到FAIMS的分析器区域中的步骤。 除了空气之外的掺杂载气的流动也通过分析器区域提供。 掺杂的载气包括载气和痕量的预定掺杂气体，所选择的预定掺杂剂气体相对于峰值分离和信号来改善峰值分离和与感兴趣的离子相关的信号强度中的至少一个 仅在载气存在下与感兴趣的离子有关的强度。 感兴趣的离子在掺杂的载气的存在下选择性地透过分析器区域，并在检测器处检测。

公开(公告)号：US20050087684A1

公开(公告)日：2005-04-28

申请号：US10692301

申请日：2003-10-23

Applicant: Vincent Farnsworth

Inventor： Vincent Farnsworth

IPC: B01D59/44 ,  G01N30/00 ,  G01N30/72 ,  H01J49/28 ,  H01J49/40

CPC classification number: H01J49/22 ,  G01N30/72 ,  H01J49/40

Abstract: A time-of-flight mass analyzer having improved mass resolution without mandating a corresponding increase in instrument size is disclosed. The analyzer includes an ionizer that generates the ions that are to be analyzed. These ions are introduced to an ion flight path, at least a portion of which is aligned with a linear axis. The portion of the ion path that is aligned with the linear axis includes a region having a substantially static electric field with non-linear equipotential field lines that circumvent the linear axis. Ions either enter the substantially static electric field with a velocity component that is directed along the linear axis or have such a velocity component imparted to them once they have been trapped in the substantially static electric field. As a result of the combined effects of the linear velocity component and the non-linear field, the ions make multiple circumnavigating trips about the linear axis as they concurrently travel in the direction of the linear axis. Consequently, the ions travel along a significantly longer flight path when compared to a flight path in which the ions solely travel linearly along the axis. In one embodiment, the concurrent motions of the ions in the direction of the linear axis and along the equipotential field lines about the linear axis define a substantially helical ion trajectory. This provides a larger distance along which ions having close, but different, m/z may be separated in time thereby providing an instrument having higher resolution.

Abstract translation: 公开了一种具有改进的质量分辨率而不强制相应的仪器尺寸增加的飞行时间质量分析仪。 分析仪包括产生要分析的离子的离子发生器。 这些离子被引入离子飞行路径，其至少一部分与线性轴对齐。 与线性轴线对准的离子路径的部分包括具有基本上静止的电场的区域，其具有围绕线性轴线的非线性等电场线。 离子或者以沿着线性轴线指向的速度分量进入基本上静态的电场，或者一旦它们被捕获在基本静电场中，就具有赋予它们的速度分量。 作为线速度分量和非线性场的组合效应的结果，离子在线性轴线的同时行进时，绕线性轴线进行多个循环跳闸。 因此，与离子仅沿着轴线行进的飞行路径相比，离子沿着显着更长的飞行路径行进。 在一个实施例中，离子在线性轴线的方向上并沿着等轴电场线绕线性轴线的同时运动限定了基本上螺旋形的离子轨迹。 这提供了更大的距离，沿着该距离可以将具有接近但不同的m / z的离子在时间上分离，从而提供具有更高分辨率的仪器。

公开(公告)号：US5969351A

公开(公告)日：1999-10-19

申请号：US796548

申请日：1997-02-06

Applicant: Takayuki Nabeshima ,  Minoru Sakairi ,  Yasuaki Takada ,  Yukiko Hirabayashi ,  Hideaki Koizumi

Inventor： Takayuki Nabeshima ,  Minoru Sakairi ,  Yasuaki Takada ,  Yukiko Hirabayashi ,  Hideaki Koizumi

IPC: H01J49/04 ,  H01J49/28

CPC classification number: H01J49/168 ,  H01J49/0404 ,  H01J49/049 ,  G01N30/726

Abstract: A semi-micro liquid chromatograph/mass spectrometer apparatus has an ion source. The space from the end portion of a flow passage of a liquid chromatograph shell to a vaporization portion is closed so as to prevent the inflow of a gas from outside the ion source into the space. Further, the nebulization and vaporization portions are joined together and heated by a common heater. Dilution of a sample to be analyzed is prevented, and high sensitivity detection becomes possible in a low velocity liquid chromatograph/mass spectrometer.

Abstract translation: 半微量液相色谱仪/质谱仪装置具有离子源。 从液相色谱仪壳体的流路端部到气化部分的空间被封闭，以防止从离子源外部的气体流入空间。 此外，将雾化和蒸发部分接合在一起并通过公共加热器加热。 防止要分析的样品的稀释，并且可以在低速液相色谱仪/质谱仪中进行高灵敏度检测。

公开(公告)号：US5747815A

公开(公告)日：1998-05-05

申请号：US685649

申请日：1996-07-24

Applicant: Robert M. Young ,  Carl B. Freidhoff ,  Timothy T. Braggins ,  Thomas V. Congedo

Inventor： Robert M. Young ,  Carl B. Freidhoff ,  Timothy T. Braggins ,  Thomas V. Congedo

IPC: H01J49/28 ,  B01D59/44 ,  H01J49/00

CPC classification number: H01J49/147 ,  H01J49/0018 ,  H01J49/288

Abstract: A gas ionizer is provided for use in a solid state mass spectrograph for analyzing a sample of gas. The gas ionizer is located in a cavity provided in a semiconductor substrate which includes an inlet for introducing the gas to be analyzed. The gas ionizer ionizes the sample of gas drawn into the cavity through the inlet to generate an ionized sample gas. The gas ionizer generates energetic particles or photons which bombard the gas to be sampled to produce ionized gas. The energetic particles or photons can be generated by reverse-bias p-n junctions, radioactive isotopes, electron discharges, point emitters, and thermionic electron emitters. A layer of cesium chloride or cesium iodide having a low work function is formed on top of the reverse-bias p-n junction gas ionizer to increase current emitted per junction area and so that the gas ionizer can be exposed to atmospheric oxygen during storage and can operate in reduced atmosphere with no additional treatments. The cesium chloride layer and the cesium iodide layer do not readily electromigrate. A fabrication process of the mass spectrograph includes using plural masks to ensure proper exposure of resist on both flat and wall surfaces of the semiconductor surface having severe topography.

Abstract translation: 提供一种用于分析气体样品的固态质谱仪中使用的气体离子发生器。 气体离子发生器位于设置在半导体衬底中的空腔中，该半导体衬底包括用于引入待分析气体的入口。 气体离子发生器将通过入口吸入空腔的气体样品离子化，产生离子化样品气体。 气体离子发生器产生能量粒子或光子，其轰击待采样的气体以产生电离气体。 高能粒子或光子可以通过反向偏置p-n结，放射性同位素，电子放电，点发射体和热离子电子发射体产生。 在反向偏压pn结气体离子发生器的顶部形成一层具有低功函数的氯化铯或碘化铯，以增加每个接合面积的电流，从而使气体离子发生器在储存过程中暴露于大气中的氧气， 在减少的气氛，没有额外的治疗。 氯化铯层和碘化铯层不容易电解。 质谱仪的制造方法包括使用多个掩模以确保抗蚀剂在具有严重形貌的半导体表面的平坦表面和壁表面上的适当曝光。

公开(公告)号：US5616920A

公开(公告)日：1997-04-01

申请号：US538865

申请日：1995-10-04

Applicant: Erich Plies

Inventor： Erich Plies

IPC: H01J49/08 ,  H01J35/02 ,  H01J37/05 ,  H01J37/147 ,  H01J49/28 ,  H01J49/48

CPC classification number: H01J37/1477 ,  H01J35/02 ,  H01J37/05 ,  H01J49/288 ,  H01J49/48

Abstract: Purely electrical or magnetic deflection systems are usually utilized in the probe-shaping part of modern electron beam tomographs in order to remove the gas ions generated in the evacuated drift tube by electron impact from the beam. The known deflection systems, however, cause an offset of the electron beam, so that this enters extra-axially into the lens element following the deflection system. In the apparatus for removing ions from an electron beam disclosed herein, a deflection unit (Wien filter) generates an E.times.B field oriented perpendicular to the beam axis that exerts strong shearing forces only on the positively charged gas ions, but does not influence the electrons. The deflection unit is essentially composed of two tube electrodes lying at a constant potential, of an electrostatic octopole deflector, and two saddle coil pairs annularly surrounding the octopole deflector. The apparatus is useful for fast electron beam tomographs, including x-ray scanners.

Abstract translation: 通常在现代电子束断层摄影机的探针成形部分中采用纯电气或磁偏转系统，以便通过电子束从电子束中去除真空漂移管中产生的气体离子。 然而，已知的偏转系统引起电子束的偏移，使得其在偏转系统之后进入到轴向进入透镜元件。 在用于从本文公开的电子束去除离子的装置中，偏转单元（维恩滤波器）产生垂直于光束轴线定向的ExB场，其仅在带正电荷的气体离子上施加强剪切力，但不影响电子。 偏转单元基本上由位于恒定电位的静电八极偏转器的两个管电极和环形围绕八极偏转器的两个鞍形线圈组成。 该装置适用于快速电子束断层扫描仪，包括x射线扫描仪。