Non-lithographically patterned directed self assembly alignment promotion layers
    124.
    发明授权
    Non-lithographically patterned directed self assembly alignment promotion layers 有权
    非光刻图案化的定向自组装对准促进层

    公开(公告)号:US09418888B2

    公开(公告)日:2016-08-16

    申请号:US14778562

    申请日:2013-06-27

    Abstract: A method of an aspect includes forming a directed self assembly alignment promotion layer over a surface of a substrate having a first patterned region and a second patterned region. A first directed self assembly alignment promotion material is formed selectively over the first patterned region without using lithographic patterning. The method also includes forming an assembled layer over the directed self assembly alignment promotion layer by directed self assembly. A plurality of assembled structures are formed that each include predominantly a first type of polymer over the first directed self assembly alignment promotion material. The assembled structures are each adjacently surrounded by predominantly a second different type of polymer over the second patterned region. The first directed self assembly alignment promotion material has a greater chemical affinity for the first type of polymer than for the second different type of polymer.

    Abstract translation: 一个方面的方法包括在具有第一图案化区域和第二图案化区域的基底的表面上形成定向自组装对准促进层。 选择性地在第一图案化区域上形成第一定向自组装对准促进材料,而不使用平版印刷图案。 该方法还包括通过定向自组装在定向自组装对准促进层上形成组装层。 形成多个组装结构,每个组合结构主要包括第一类型的自组装排列促进材料上的第一类聚合物。 组装的结构在第二图案化区域上主要围绕第二种不同类型的聚合物。 第一定向自组装校准促进材料对于第一类聚合物具有比对于第二种不同类型的聚合物更大的化学亲和力。

    Neutral layer polymers, methods of manufacture thereof and articles comprising the same
    125.
    发明授权
    Neutral layer polymers, methods of manufacture thereof and articles comprising the same 有权
    中性层聚合物,其制造方法和包含其的制品

    公开(公告)号:US09382444B2

    公开(公告)日:2016-07-05

    申请号:US14297095

    申请日:2014-06-05

    Abstract: Disclosed herein is a block copolymer comprising a first segment and a second segment that are covalently bonded to each other and that are chemically different from each other; where the first segment has a first surface free energy and where the second segment has a second surface free energy; and an additive copolymer; where the additive copolymer comprises a surface free energy reducing moiety where the surface free energy reducing moiety has a lower surface free energy than that of the first segment and the second segment; the additive copolymer further comprising one or more moieties having an affinity to the block copolymer; where the surface free energy reducing moiety is chemically different from the first segment and from the second segment; where the additive copolymer is not water miscible; and where the additive copolymer is not covalently bonded with the block copolymer.

    Abstract translation: 本文公开了一种嵌段共聚物,其包含彼此共价键合并且在化学上彼此不同的第一链段和第二链段; 其中所述第一段具有第一表面自由能,并且其中所述第二段具有第二表面自由能; 和添加剂共聚物; 其中所述添加剂共聚物包含表面自由能减少部分,其中所述表面自由能减少部分具有比所述第一部分和所述第二部分更低的表面自由能; 所述添加剂共聚物还包含对所述嵌段共聚物具有亲和性的一个或多个部分; 其中表面自由能减少部分在化学上不同于第一段和第二段; 其中所述添加剂共聚物不是水混溶的; 并且其中所述添加剂共聚物不与嵌段共聚物共价键合。

    Patterning in the directed assembly of block copolymers using triblock or multiblock copolymers
    126.
    发明授权
    Patterning in the directed assembly of block copolymers using triblock or multiblock copolymers 有权
    使用三嵌段或多嵌段共聚物的嵌段共聚物的定向组装中的图案化

    公开(公告)号:US09372398B2

    公开(公告)日:2016-06-21

    申请号:US13543667

    申请日:2012-07-06

    Abstract: Provided herein are block copolymer thin film structures and methods of fabrication. The methods involve directing the assembly of ABA triblock copolymers such that desired features are formed by domains of the assembled ABA triblock copolymer. In some embodiments, an ABA triblock copolymer is directed to assemble by a chemical pattern. Chemical patterns with periods much different than the natural period of the ABA triblock copolymer may be used to direct assembly of the ABA triblock copolymer.

    Abstract translation: 本文提供了嵌段共聚物薄膜结构和制造方法。 所述方法包括引导ABA三嵌段共聚物的组合,使得所需特征由组装的ABA三嵌段共聚物的结构域形成。 在一些实施方案中,ABA三嵌段共聚物被引导通过化学图案组装。 可以使用与ABA三嵌段共聚物的自然周期大不相同的时期的化学图案来引导ABA三嵌段共聚物的组装。

    DEFECT REDUCTION METHODS AND COMPOSITION FOR VIA FORMATION IN DIRECTED SELF-ASSEMBLY PATTERNING
    129.
    发明申请
    DEFECT REDUCTION METHODS AND COMPOSITION FOR VIA FORMATION IN DIRECTED SELF-ASSEMBLY PATTERNING 审中-公开
    通过指导自组装方式形成的缺陷减少方法和组合

    公开(公告)号:US20160122580A1

    公开(公告)日:2016-05-05

    申请号:US14527962

    申请日:2014-10-30

    Abstract: The present invention relates to a two novel processes, “Dual Coating Process and Single Coating Process,” for forming an array of via's by employing a graphoepitaxy approach, where an array of pillars the surface of the pillars has been modified by the formation of a hydrophobic poly(vinyl aryl) brush at the surface of the pillars. The present invention also relates to a composition comprising a poly(vinyl aryl) hydrophopic polymer brush precursor terminated at one chain end with a reactive functional group, a diblock copolymer comprising an etch resistant hydrophobic block and a highly etchable hydrophilic block, a thermal acid generator and a solvent.

    Abstract translation: 本发明涉及两种新型工艺:“双重涂布工艺和单一涂覆工艺”,用于通过采用石墨刻蚀方法形成通孔阵列,其中支柱的表面阵列已经通过形成 疏水性聚(乙烯基芳基)刷在柱的表面。 本发明还涉及一种组合物,其包含在一个末端用反应性官能团封端的聚(乙烯基芳基)水薰衣草聚合物刷子前体,包含耐蚀刻疏水嵌段的二嵌段共聚物和高度可蚀刻的亲水性嵌段,热酸产生剂 和溶剂。

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